Surface analysis X-ray photoelectron spectroscopy

N.H. Turner, J.A. Schreifels, Surface analysis X-ray photoelectron spectroscopy and Auger electron spectroscopy, Anal. Chem. 72 (2000) 99. 

The AlTUD-1 and the modified sample obtained after the immobilization process were characterized by surface analysis (X-ray photoelectron spectroscopy and powder X-ray diffraction), chemical analysis and adsorption of nitrogen at low temperature. 

Inductively Coupled Plasma. Mass Spectrometry Archaeological Applications. Microscopy Techniques Scanning Electron Microscopy. Surface Analysis X-Ray Photoelectron Spectroscopy Particle-Induced X-Ray Emission Auger Electron Spectroscopy. X-Ray Absorption and Diffraction X-Ray Diffraction - Powder. X-Ray Fluorescence and Emission X-Ray Fluorescence Theory. 

Keywords Surface analysis X-ray photoelectron spectroscopy Time-of-flight secondary ion mass spectroscopy Attenuated total reflection infrared spectroscopy Zinc dialkyidithiophosphate Combinatorial methods In situ methods Tribochemistry... 

Table 8 shows results obtained from the application of various bulk and surface analysis methods to lithium metal at rest or after cyclization experiments, as well as at inert and carbon electrodes after cathodic polarization. The analytical methods include elemental analysis, X-ray photoelectron spectroscopy (XPS or ESCA), energy-dispersive analysis of X-rays (X-ray mi-... 

Surface spectroscopic techniques must be separated carefully into those which require dehydration for sample presentation and those which do not. Among the former are electron microscopy and microprobe analysis, X-ray photoelectron spectroscopy, and infrared spectroscopy. These methods have been applied fruitfully to show the existence of either inner-sphere surface complexes or surface precipitates on minerals found in soils and sediments (13b,30,31-37), but the applicability of the results to natural systems is not without some ambiguity because of the dessication pretreatment involved. If independent experimental evidence for inner-sphere complexation or surface precipitation exists, these methods provide a powerful means of corroboration. 

Successfully developing a surface engineering strategy based on surfactant behavior at interfaces requires surface characterization techniques that can validate and quantify surface chemistry changes. This review describes the role of two surface chemistry analysis techniques that have proven highly successful in surfactant analysis x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectrometry (SSIMS). In Section II, the methods by which these techniques analyze surface chemistry are described. In Section III, recent examples of their application in surfactant-based surface engineering are described. 

Analysis of the composition of the surface with X-ray photoelectron spectroscopy,... 

It is clear from an investigation of the locus of failure and analysis of the fracture surfaces by X-ray photoelectron spectroscopy that the microfibrous surfaces lead to considerable plastic deformation of the polymer. They appear to increase the adhesion by enhanced energy dissipation during fracture (see Rheological theory. Peel tests). 

Keywords electron spectroscopy for chemical analysis (ESCA), functionality, lap shear strength, plasma treatment, secondary ion mass spectrometry (SIMS), surface modification, surface energy. X-ray photoelectron spectroscopy (XPS). 

Our group [6] first reported that the addition of H2O2 to the polishing slurry can improve the post-CMP surface finish. X-ray photoelectron spectroscopy analysis... 

From a X-ray photoelectron spectroscopy study, the surface composition 3.2% Fe, 33.2% K, 8.4% Al, 3.9% Ca and 51.3% O (atomic %) was found [82] for the unreduced catalyst. The surface is enriched in K and Al compared to the bulk [52]. The prereduced catalyst shows more Fe in the surface by X-ray photoelectron spectroscopy than the unreduced catalyst [52]. Energy dispersive X-ray analysis of prereduced catalyst shows that the surface consists mainly of iron oxide [83] Al, Ca and Si are inhomogeneously distributed in the surface [83]. 

Electron Microprobe Analysis of Minerals Microscopy Scanning Electron Microscopy Surface Chemistry Positron Microscopy Transmission Electron Microscopy X-Ray Analysis X-Ray Photoelectron Spectroscopy... 

ISO 10810 2010 Surface chemical analysis - X-ray photoelectron spectroscopy -Guidelines for analysis... 

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