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Sputtering target purity

BN films were deposited on silicon (100) wafer with resistivity (5-8Q cm) by a magnetron sputtering system. Sputtering target used here was a hot-pressed h-BN with 4N purity. The substrate was applied with a negative bias at 180V and 300V, respectively. Deposition was carried out with a base pressure of 2x 1 O Pa and mixed... [Pg.447]

Improved design of sputtering equipment somewhat allows the substitution of CVD tungsten. Sputter targets used for thin layers in microelectronics manufacture are made of high or ultrahigh purity W, W-10%Ti, and WSi (see Section 5.7.7). [Pg.245]

Powders having sufficient purity can be processed to sputter targets directly. Tungsten sputter taigets have usually been manufactured by hot pressing. However, it was not possible to maintain the high-purity level of the powder. A much better way to achieve... [Pg.249]

Disks as sputtering cathodes (high purity W, W-Ti, W-Si , MoW). Sputter targets are used to produce thin layers in integrated circuits (VLSI) by PVD. Recently, W-Mo sputter targets were used for the manufacture of flat panel displays [7.19]. [Pg.294]

The results of a GDMS analysis of high-purity TiW are summarized in Table 4. High-purity TiW is very commonly used as the metallization to provide the conducting links in the construction of semiconductor devices. The metallization is commonly deposited by sputtering from a high-purity alloy target onto the sub-... [Pg.618]

The other method consists of the sputtering of a high-purity gold target with argon ions, followed by the subsequent deposition of the sputtered gold atoms on the surface of the moving powder support.127 The... [Pg.98]

Mobile ion contamination Whereas tungsten gates fabricated using sputter deposition need ultra pure targets [Yamamoto et al.199], CVD-W (using 99.5% purity WF6) showed very low (0.01 ppm) mobile ion contamination [Kobayashi et al.200]. [Pg.154]

The AlO,- insulator layer was deposited on the ITO by rf magnetron sputtering (13.56 MHz) from a planar AI2O3 ceramic target of 99.99% purity in pure Ar (99.998%). The sputter gas pressure was 8 x 10 mbar. This yielded AlO deposition rates between 4.0 nm/min and 6.0 nm/min. The base pressure prior... [Pg.140]


See other pages where Sputtering target purity is mentioned: [Pg.340]    [Pg.348]    [Pg.1063]    [Pg.222]    [Pg.247]    [Pg.247]    [Pg.250]    [Pg.22]    [Pg.1079]    [Pg.327]    [Pg.1079]    [Pg.322]    [Pg.248]    [Pg.266]    [Pg.266]    [Pg.269]    [Pg.347]    [Pg.347]    [Pg.315]    [Pg.315]    [Pg.529]    [Pg.226]    [Pg.588]    [Pg.264]    [Pg.270]    [Pg.200]    [Pg.99]    [Pg.497]    [Pg.274]    [Pg.99]    [Pg.229]    [Pg.6036]    [Pg.192]    [Pg.154]    [Pg.157]    [Pg.217]    [Pg.175]    [Pg.102]    [Pg.71]    [Pg.72]    [Pg.73]    [Pg.237]    [Pg.6035]   
See also in sourсe #XX -- [ Pg.269 ]




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