Spectrometry static SIMS

Static Secondary Ion Mass Spectrometry (Static SIMS)... 

Field desorption (FD) and fast atom bombardment (FAB) mass spectrometry provides mass spectral information about compotmds that are not very volatile but these two techniques are not used often in polymer science since they have several disadvantages. Electrospray ionization (ESI) mass spectrometry can also be used to obtain the above information about polymers, but ESI spectra are generally complicated due to differences in charge state distributions. Static secondary ion mass spectrometry (static SIMS) is a surface-sensitive MS technique, which is suitable for studying the interfaces of polymers with respect to chemical structure and molecular weight as well as end groups and surface contaminants. Laser desorption... 

Environment. Detection of environmental degradation products of nerve agents directly from the surface of plant leaves using static secondary ion mass spectrometry (sims) has been demonstrated (97). Pinacolylmethylphosphonic acid (PMPA), isopropylmethylphosphonic acid (IMPA), and ethylmethylphosphonic acid (EMPA) were spiked from aqueous samples onto philodendron leaves prior to analysis by static sims. The minimum detection limits on philodendron leaves were estimated to be between 40 and 0.4 ng/mm for PMPA and IMPA and between 40 and 4 ng/mm for EMPA. Sims analyses of IMPA adsorbed on 10 different crop leaves were also performed in order to investigate general apphcabiflty of static sims for... 

Dynamic SIMS is used to measure elemental impurities in a wide variety of materials, but is almost new used to provide chemical bonding and molecular information because of the destructive nature of the technique. Molecular identihcation or measurement of the chemical bonds present in the sample is better performed using analytical techniques, such as X-Ray Photoelectron Spectrometry (XPS), Infrared (IR) Spectroscopy, or Static SIMS. 

Static SIMS has been demonstrated to be a valuable tool in the chemical characterization of surfaces. It is unique in its ability to provide chemical information with high surface sensitivity. The technique is capable of providing mass spectral data (both positive and negative spectrometry), as well as chemical mapping, thereby giving a complete microchemical analysis. The type of information provided by... 

Secondary Ion Mass Spectrometry Dynamic Secondary Ion Mass Spectrometry Static Secondary Ion Mass Spectrometry SIMS using a Quadruple Mass Spectrometer SIMS usii a Magnetic Sector Mass Spectrometer See Magnetic SIMS... 

R. Van Ham, L. Van Vaeck, A. Adriaens, F. Adams, B. Hodges and G. Groenewold, Inorganic speciation in static SIMS a comparative study between monatomic and polyatomic primary ions, Journal of Analytical Atomic Spectrometry, 17, 753 758 (2002). 

In secondary ion mass spectrometry (SIMS) the sample surface is sputtered by an ion beam and the emitted secondary ions are analyzed by a mass spectrometer (review Ref. [360]). Due to the sputtering process, SIMS is a destructive method. Depending on the sputtering rate we discriminate static and dynamic SIMS. In static SIMS the primary ion dosis is kept below 1012 ions/cm2 to ensure that, on average, every ion hits a fresh surface that has not yet been damaged by the impact of another ion. In dynamic SIMS, multiple layers of molecules are removed at typical sputter rates 0.5 to 5 nm/s. This implies a fast removal of the topmost layers of material but allows quantitative analysis of the elemental composition. 

It is a remarkable feature of secondary ion mass spectrometry (SIMS) that considerable chemical information is accessible through the procedurally simple physical technique of sputtering. SIMS--espec ia 11 y under low primary ion flux conditions ("static SIMS," a 1 s o known as "molecular SIMS" when applied to compounds)—provides information on molecular weight and molecular structure and allows isotopic analysis. The surface sensitivity of SIMS permits its use in imaging, in monitoring of surface... 

Selected topics in Fourier-Transform Ion Cyclotron Resonance Mass Spectrometry instrumentation are discussed in depth, and numerous analytical application examples are given. In particular, optimization ofthe single-cell FTMS design and some of its analytical applications, like pulsed-valve Cl and CID, static SIMS, and ion clustering reactions are described. Magnet requirements and the software used in advanced FTICR mass spectrometers are considered. Implementation and advantages of an external differentially-pumped ion source for LD, GC/MS, liquid SIMS, FAB and LC/MS are discussed in detail, and an attempt is made to anticipate future developments in FTMS instrumentation. 

Secondary ion mass spectrometry (SIMS) is to measure the secondary ions, ionized clusters, atoms and atomic clusters, which are emitted from the surface of particles, when it is bombarded with a primary beam of ions, such as He", Ne", or Ar", with energies in the range of hundreds of eV to keV scale. The emitted ions and ionized clusters are analyzed directly by using a mass spectrometer. Therefore, chemical composition of the surface can be analyzed with the obtained accordingly. SIMS has two modes of analysis (i) static and (ii) dynamic. Static SIMS uses an ion beam with low current density, so as to confine the analysis to the outermost layers. Dynamic SIMS uses beams of high current density, so that successive atomic layers can be eroded at a relatively high rate. Comparatively, the analytical conditions of dynamic SIMS are less suitable for surface analysis. 

Secondary-ion mass spectrometry (SIMS) is used largely as a surface characterization technique [18]. It is practiced in two formats, dynamic SIMS and static SIMS. In both formats, a beam of keV-energy ions, usually of Ar ions, bombards the surface of the sample directly. The momentum transfer from the beam to the... 

The ultrahigh vacuum technique of secondary ion mass spectrometry (SIMS) is the most sensitive of all the commonly employed sruface analytical techniques. There are a number of variants of the technique for example, static SIMS is used to examine submonolayer elemental analysis, dynamic SIMS is used to obtain compositional information as a function of depth below the sruface, and imagining SIMS is used for spatially resolved elemental analysis. Specimens commonly examined by SIMS are 2.5 cm in diameter and 1 cm thick. When ceramic materials are examined, sample charging is prevented by flooding the surface of the sample with an electron beam. Dynamic SIMS is of great interest and has been used to study changes in elemental composition from weathered or corroded surfaces of samples into the bulk matrix. 

Static secondary ion mass spectrometry (SIMS) of polymers Static SIMS is a technique that obtains a mass spectrum of the upper 2nm of a surface. Knowledge about surfaces is very important in studies of adhesion, corrosion, catalytic activity, biological compatibility, etc. By limiting the total primary ion dose from a primary ion beam to less than 10 ions per cm, each primary ion interacts with a sample that has not been damaged by previous primary ion impacts. In this way less than 1% of the total surface will be damaged by primary ion impacts. 

Benninghoven, A. (1994) Chemical analysis of inorganic and organic surfaces and thin films by static time of flightsecondary ion mass spectrometry (ToF-SIMS). 

Adriaens, A., Van Vaeck, L., Adams, E (1999) Static secondary ion mass spectrometry (S-SIMS) Part 2 material science applications. Mass Spectrometry Reviews, 18, 48-81. 

Samuel, N.T.,Wagner, M.S., Dornfeld, K.D., Castner, D.G. (2001) Analysis of poly(amino acids) by static time-of-flight secondary ion mass spectrometry (TOF-SIMS). Surf ScL Spectra, 8,163-185. 

Aubriet and coworkers [30] performed an extensive study of MaOb oxides of the first transition metal series (M = Sc, Y, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn) by LA-FT-ICR-MS and secondary ion mass spectrometry (SIMS) (static SIMS). In addition to comparing the two mass spectrometric techniques, these researchers detected... 

The most widely used method of static SIMS is ToF-SIMS. This uses ToF mass spectrometry which provides optimum sensitivity and mass resolution for secondary ions. 

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