Spectrochemical analysis

Ingle, J. D. Crouch, S. R. Spectrochemical Analysis. Prentice Hall, Englewood Cliffs, N.J., 1988. 

Chemical Analysis. Plasma oxidation and other reactions often are used to prepare samples for analysis by either wet or dry methods. Plasma excitation is commonly used with atomic emission or absorption spectroscopy for quaUtative and quantitative spectrochemical analysis (86—88). 

Methods of Chemical and Spectrochemical Analysis of Aluminum" in Ught Metals and TheirMlloys, Technical Committee ISO /TC 79, International Organization for Standardization, Geneva, Switzerland, 1979. 

X-rays provide an important suite of methods for nondestmctive quantitative spectrochemical analysis for elements of atomic number Z > 12. Spectroscopy iavolving x-ray absorption and emission (269—273) is discussed hereia. X-ray diffraction and electron spectroscopies such as Auger and electron spectroscopy for chemical analysis (esca) or x-ray photoelectron spectroscopy are discussed elsewhere (see X-raytechnology). 

W. J. Pnce, Spectrochemical Analysis by Atomic Absorption, Heyden Son, Ltd., London, 1979. 

Measurements of the characteristic X-ray line spectra of a number of elements were first reported by H. G. J. Moseley in 1913. He found that the square root of the frequency of the various X-ray lines exhibited a linear relationship with the atomic number of the element emitting the lines. This fundamental Moseley law shows that each element has a characteristic X-ray spectrum and that the wavelengths vary in a regular fiishion form one element to another. The wavelengths decrease as the atomic numbers of the elements increase. In addition to the spectra of pure elements, Moseley obtained the spectrum of brass, which showed strong Cu and weak Zn X-ray lines this was the first XRF analysis. The use of XRF for routine spectrochemical analysis of materials was not carried out, however, until the introduction of modern X-ray equipment in the late 1940s. 

L. S. Birks. X-Ray Spectrochemical Analysis. Second Edition, Wiley, New York, 1969. A brief introduction to XRF, it will be useful to those who are interested in knowing enough about the technique to be able to use it for routine analysis. A separate chapter on EPMA also is included. 

R. I. Botro. In Developments in Atomic Plasma Spectrochemical Analysis. (R. M. Barnes, ed.) Heyden, Philadelphia, 1981. Describes merhod for correction of overlapping spectral lines when using a polychromaror for ICP-OES. 

Elastic Recoil Detection Analysis Glow discharge mass spectrometry Glow discharge optical emission spectroscopy Ion (excited) Auger electron spectroscopy Ion beam spectrochemical analysis... 

Ion beam spectrochemical analysis (IBSCA) is a sputtering-based surface analytical technique similar to SIMS/SNMS. In IBSCA the radiation emitted by excited sputtered secondary neutrals or ions is detected. IBSCA was developed parallel to SIMS in the nineteen-sixties and early nineteen-seventies [4.246, 4.247]. It is also known... 

This fusion of disciplines, though desirable and inevitable, complicates the writing of books in fields where it occurs. Spectrochemical analysis by means of x-rays is definitely such a field. For whom shall a book on this subject be written Our answer is clear. This book was written for the analytical chemist who wants to use these x-ray methods and to understand them. We have striven for correctness in physics, electronics, and statistics but we have tried first of all to help the analytical chemist in his work. 

We planned this book to be useful even if read only in part. The first chapter is a summary of what is known about x-rays that is pertinent to spectrochemical analysis, and it should receive at least cursory attention from all readers. Those interested primarily in absorptiometry may then turn to Chapter 3 or 5 in film thickness, to Chapter 6 and in x-ray- emission spectrography, to Chapters 7 and 8. The remaining five chapters are ancillary and deal with special topics. 

Vol. 107. Multielement Detection Systems for Spectrochemical Analysis. By Kenneth W. Busch and Marianna A. Busch... 

Direct, rapid spectrochemical analysis (relatively simple spectra)... 

L.H.J. Lajunen, Spectrochemical Analysis by Atomic Absorption and Emission, The Royal Society of Chemistry, Cambridge (1992). 

Ion beam spectrochemical analysis Auger emission spectroscopy Scanning electron microscopy (SEM) Electron microprobe (EMPA) Particle-induced X-ray emission spectroscopy (PIXE)... 

Vol. 9 Analytical Chemistry of Titanium Metals and Compounds. By Maurice Codell Vol. 10 The Chemical Analysis of Air Pollutants. By the late Morris B. Jacobs Vol. 11 X-Ray Spectrochemical Analysis. Second Edition. By L. S. Birks Vol. 12 Systematic Analysis of Surface-Active Agents. Second Edition. By Milton J. Rosen and Henry A. Goldsmith... 

Quantitative Spectrochemical Analysis by the Copper Spark Method. Report CK-2254 (8. Febr. 1945). 

R. Bhargava and I.W. Levin, Spectrochemical Analysis using Infrared Multichannel Detectors, Blackwell Publishing, 2005. 

Auger Electron Spectroscopy Plasma Excitation in Spectrochemical Analysis... 

Ingle, J.D. and Crouch, S.R., Spectrochemical Analysis (Prentice-Hall, Upper Saddle River, NJ, 1988). 

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