Soft X-rays

XES, Soft x-ray emission An x-ray or electron beam Energy levels and chemical... 

AEAPS, SXAPS Auger electron APS, Soft x-ray APS Same as APS Same as APS... 

XPS is also often perfonned employing syncln-otron radiation as the excitation source [59]. This technique is sometimes called soft x-ray photoelectron spectroscopy (SXPS) to distinguish it from laboratory XPS. The use of syncluotron radiation has two major advantages (1) a much higher spectral resolution can be achieved and (2) the photon energy of the excitation can be adjusted which, in turn, allows for a particular electron kinetic energy to be selected. 

Flahner G, Wdll C, Buok M and Grunze M 1993 Investigation of intermediate steps in the self-assembly of n-alkanethiols on gold surfaoes by soft-x-ray speotrosoopy Langmuirs 1955-8... 

McFeely and co-workers used soft x-ray photoelectron spectroscopy (SXPS) to measure the changes in binding energies of Si(2p) levels after slight exposure to fluorine atoms via dissociative chemisoriDtion of XeF2 [39]. Using synclirotron radiation at 130 eV as the source enabled extreme surface sensitivity. Since this level is split into a... 

McFeely F R, Morar J F and Himpsel F J 1986 Soft x-ray photoemission study of the silicon-fluorine etching reaction Surf. Sc/. 165 277-87... 

The development of mote intense sources (eg, plasma sources, soft x-ray lasers, and synchrotron sources) has made possible highly effective instmments both for x-ray microscopy and x-ray diffraction on a few cubic nanometer sample. The optical problem of focusing x-rays is accompHshed by the use of zone plates or by improved grazing incidence or multilayer reflectors. 

Soft x-rays with wavelengths of 1—10 nm ate used for scanning x-ray microscopy. A zone plate is used to focus the x-ray beam to a diameter of a few tens of nanometers. This parameter fixes and limits the resolution. Holographic x-ray microscopy also utilizes soft x-rays with photoresist as detector. With a strong source of x-rays, eg, synchrotron, resolution is in the 5—20-nm range. Shadow projection x-ray microscopy is a commercially estabflshed method. The sample, a thin film or thin section, is placed very close to a point source of x-rays. The "shadow" is projected onto a detector, usually photographic film. The spot size is usually about 1 ]lni in diameter, hence the resolution cannot be better than that. 

Serious attempts to use LB films in commercial appHcations include the use of lead stearate as a diffraction grating for soft x-rays (64). Detailed discussion on appHcations of LB films are available (4,65). From the materials point of view, the abiHty to build noncentro symmetric films having a precise control on film thickness, suggests that one of the first appHcations of LB films may be in the area of second-order nonlinear optics. Whereas a waveguide based on LB films of fatty acid salts was reported in 1977, a waveguide based on polymeric LB films has not yet been commercialized. 

The surface to be analyzed is irradiated with soft X-ray photons. When a photon of energy hv interacts with an electron in a level X with the binding energy Eg (Eg is the energy E of the K-shell in Pig. 2.1), the entire photon energy is transferred to the electron, with the result that a photoelectron is ejected with the kinetic energy... 

The original motivation for the preparation of regular metallic multilayers of carefully controlled periodicity was the need for X-ray reflectors, both to calibrate unknown X-ray wavelengths and to function as large and efficient monochromators, especially for soft X-rays of wavelengths of several A. This was first done by... 

In X-ray photoelectron spectroscopy (XPS), a beam of soft X-rays with energy hv s. focused onto the surface of a solid that is held under an ultra-high vacuum, resulting in the ejection of photoelectrons from core levels of the atoms in the solid [20]. Fig. 15 shows an energy level diagram for an atom and illustrates the processes involved in X-ray-induced photoelectron emission from a solid. 

Sodium tungstate solutions, estimation of absorption effects in, 168-170 Soft x-rays, 11... 

To produce a very thick n-channel device, the resistivity of the silicon must be made relatively high, about 5,000 to 10,000 H-cm, as opposed to the 20-100 H-cm material used in standard n-channel CCDs. Higher resistivity is required for greater penetration depth of the fields produced by the frontside polysilicon wires (penetration depth is proportional to the square root of the resistivity). These thick high resistivity CCDs have been developed for detection of soft x-rays with space satellites and can be procured from E2V and MIT/LL. 

An image is formed on the surface using hard-UV or soft x-rays. If the polymer is a photoresist, it cross-links in those areas exposed to radiation. If the polymer is a negative photoresist, it degrades in those areas exposed to radiation. 

Despite the first prediction [34] of a measurable PECD effect being a few decades old, it is only in the last few years that experimental investigations have commenced. Practical experiments have needed to await advances in experimental technology, and improvements in suitable sources of circularly polarized radiation in the vacuum ultraviolet (VUV) and soft X-ray (SXR) regions needed for single-photon ionization have been been key here. In the meantime, developments in other areas, principally detectors, also contribute to what can now be accomplished. 

G. Schonhense and J. Honnes, Photoionization of oriented systems and circular dichroism. In U. Becker and D. A. Shirley (eds.), VUVand Soft X-Ray Photoionization, Chapt. 17, Plenum, New York, 1996, pp. 607-652. 

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