Simultaneous spectrum analysis

Si(Li) spectroscopy, with the capability of simultaneous quantitative analysis of 72 elements ranging from sodium through to uranium in solid, liquid, thin film and aerosol filter samples. The penetrating power of protons allows sampling of depths of several tens of microns, and the beam itself may be focussed, rastered or varied in energy. The use of a proton beam as an excitation source offers several advantages over other X-ray techniques, for example there is a higher rate of data accumulation across the entire spectrum which allows for faster analysis. 

Unlike a flame, in which only a very limited number of metals emit light because of the low temperature, virtually all metals present in a sample emit their line spectrum from the ICP torch. Not only does this make for a very broad application for ICP, but it also means that a given sample may undergo very rapid and simultaneous multielement analysis. With this in mind, it is interesting to consider the options for the optical path for the ICP instrument. 

Perhaps the greatest attribute that TOF-MS may apply to elemental mass spectrometry is the ability to provide simultaneous multielemental analysis. Of course, a TOF-MS does not record all the masses in the spectrum simultaneously the time difference between adjacent masses is typically in the nanosecond regime. However, all masses are sampled into the mass spectrometer simultaneously and an entire spectrum is generated from each injected ion pulse. Because successively recorded mass spectra are obtainable in short periods in a TOF-MS, especially in instances in which there is a small, well-defined mass range of interest, thousands of mass spectra can be obtained each second. 

A standard linear response spectrum analysis (RSA) is performed at each (i) th incremental pushover step for the unit value of the unknown incremental scale factor = 1) by considering instantaneous mode shapes that are compatible with the current distribution of plastic hinges and the initial elastic spectral displacements taken as seismic input. Such a linear response spectrum analysis (RSA) effectively corresponds to adaptive pushover analyses, which are simultaneously performed in each mode followed by the application of an appropriate modal combination rule. Thus, any response quantity of interest, which is represented by a generic response quantity, r, is obtained for the unit value of the unknown incremental scale factor. Now, the increment of the generic response quantity, Ar, is expressed as... 

In Inductively Coupled Plasma-Optical Emission Spectroscopy (ICP-OES), a gaseous, solid (as fine particles), or liquid (as an aerosol) sample is directed into the center of a gaseous plasma. The sample is vaporized, atomized, and partially ionized in the plasma. Atoms and ions are excited and emit light at characteristic wavelengths in the ultraviolet or visible region of the spectrum. The emission line intensities are proportional to the concentration of each element in the sample. A grating spectrometer is used for either simultaneous or sequential multielement analysis. The concentration of each element is determined from measured intensities via calibration with standards. 

ICP-OES is one of the most successful multielement analysis techniques for materials characterization. While precision and interference effects are generally best when solutions are analyzed, a number of techniques allow the direct analysis of solids. The strengths of ICP-OES include speed, relatively small interference effects, low detection limits, and applicability to a wide variety of materials. Improvements are expected in sample-introduction techniques, spectrometers that detect simultaneously the entire ultraviolet—visible spectrum with high resolution, and in the development of intelligent instruments to further improve analysis reliability. ICPMS vigorously competes with ICP-OES, particularly when low detection limits are required. 

ToF analysers are able to provide simultaneous detection of all masses of the same polarity. In principle, the mass range is not limited. Time-of-flight mass analysis is more than an alternative method of mass dispersion it has several special qualities which makes it particularly well suited for applications in a number of important areas of mass spectrometry. These qualities are fast response time, compatibility with pulsed ionisation events (producing a complete spectrum for each event) ability to produce a snapshot of the contents of the source volume on the millisecond time-scale ability to produce thousands of spectra per second and the high fraction of the mass analysis cycle during which sample ions can be generated or collected. 

Ion trap MS is particularly suited for chemical structure elucidation, as it allows for simultaneous ion storage, ion activation and fragmentation, and product ion analysis. The fragmentation pathway of selected ions and the fragmentation products provide information on the molecular structure. Compared with triple-quadrupole and especially with sector instruments, the ion trap instrument provides more efficient conversion of precursor ion into product ions. However, the CID process via resonance excitation, although quite efficient in terms of conversion yield, generally results in only one (major) product ion in the product-ion mass spectrum. MS/MS with a quadrupole ion trap offers a number of advantages ... 

In an analysis of an electrode process, it is useful to obtain the impedance spectrum —the dependence of the impedance on the frequency in the complex plane, or the dependence of Z" on Z, and to analyse it by using suitable equivalent circuits for the given electrode system and electrode process. Figure 5.21 depicts four basic types of impedance spectra and the corresponding equivalent circuits for the capacity of the electrical double layer alone (A), for the capacity of the electrical double layer when the electrolytic cell has an ohmic resistance RB (B), for an electrode with a double-layer capacity CD and simultaneous electrode reaction with polarization resistance Rp(C) and for the same case as C where the ohmic resistance of the cell RB is also included (D). It is obvious from the diagram that the impedance for case A is... 

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