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Silicon valence

Fig. 1. (a) Silicon (valence = 4) crystal lattice shown in two dimensions with no broken bonds, T = 0 K (b) siUcon crystal lattice with a broken bond (c) sibcon crystal lattice with a siUcon atom displaced by a donor dopant, ie, -doped (valence = 5) and (d) siUcon crystal lattice with a siUcon atom displaced... [Pg.467]

It is probably significant that for these structures only the four stable. v,bit-ale ol the silicon valence shell m jd to be used. The bond-angle strain is considerably less than for pure xp orbital, since d character ",a,n he introduced with iiTie promotion energy Some contribution may be made ai30 by the six sfcrucsun s of type C ... [Pg.312]

The energy in light also can break the bonds of silicon valence electrons. Each photon has energy equal to the product of Planck s constant and the... [Pg.1298]

The silicon valencies which cannot be occupied for steric reasons have a radical character and the Si substituent ratio is less than one. [Pg.109]

The vacant silicon valencies of the silicon layer represent radicals, as was confirmed by the ESR spectra. The methoxy derivatives (with a deficiency of substituents) prepared from CaSi2 plus IC1 in methanolic solution likewise supply an ESR signal of an intensity which has the expected relationship to that of the layered silicon. [Pg.109]

The production of free charge carriers during fracture of single crystal silicon has recently been inferred from transient increases in conductivity during this period ( ). phE in the visible portion of the spectrum is not observed from silicon, presumably due to the small band gap of this material. However, EE has been observed (22). This is remarkable considering that the energy required to promote a silicon valence electron to the vacuum level is on the order of 4 eV, well in excess of the band gap energy. ... [Pg.234]

The hyperfine ESR data are valuable because they are the best measure of the electron wavefunetion at the defeet. The form of the hyperfine spectrum, which contains two broad lines, implies that the defect state is highly localized on a single silicon atom. Further analysis makes use of an approach that is successful in analyzing the hyperfine interaction in crystalline materials and describes the defect wave-function, 4, by a linear combination of atomic orbitals. The wavefunetion of a single silicon valence electron is written in terms of s and p orbitals as... [Pg.109]

Silicones are organo-silicon compounds in which the silicon atoms are linked together via oxygen atoms, so that a basic skeleton of silicon and oxygen units is obtained. The residual silicon valencies are neutralized by organic groups. [Pg.630]

If the added material has fewer valence electrons than the host, it adds positive holes and the result is aj -type semiconductor, shown in Figure 7.16(c). Aluminum is a p-type dopant in a silicon host, with three electrons instead of four in a band very close in energy to that of the silicon valence band. Addition of a small amount of energy boosts electrons from the host valence band into this new level and generates more holes in the valence band of the host, thus increasing the conductance. With careful doping, the conductance... [Pg.232]

For example, the basis set 6-3IG for the silicon valence orbitals would have the following split functions ... [Pg.387]

Electroless deposition (ELD) of noble metals on the silicon surface is widely employed in MACE. By ELD metal ions from a precursor salt in a solution of HF inject holes in the silicon valence band and as a result get reduced and nucleate on the silicon surface. This process is by no means different than MACE, and in fact during ELD, the substrate gets also etched. ELD is a very simple and versatile strategy that yields a wide array of metal morphologies, albeit with more limited control with respect to the alternatives. ELD of noble metals generates all morphologies ranging from isolated nanopartieles to continuous metal films, but with limited control on nanoparticle size,... [Pg.264]

As discussed in Sec. 3.1.3 the presence of defects and impurities can promote loss in piezoelectric crystals. Defects are divided into two main groups, point and extended defects. The point defects include the aluminum-related centers as well as oxygen-vacancy centers. Aluminum ions can easily substitute for silicon in quartz however, charge compensation is required. Aluminum has a - -3 charge whereas the silicon valence is +4. An additional positive charge is required that can be supplied by H-I-, Li- -, Na- -, or holes at interstitial sites in the crystal lattice. Iron-related defects are also possible since iron is also a trivalent (-1-3) ion. [Pg.249]


See other pages where Silicon valence is mentioned: [Pg.467]    [Pg.62]    [Pg.47]    [Pg.244]    [Pg.190]    [Pg.195]    [Pg.45]    [Pg.40]    [Pg.140]    [Pg.8]    [Pg.65]    [Pg.382]    [Pg.386]    [Pg.225]    [Pg.110]    [Pg.319]    [Pg.7]    [Pg.562]   
See also in sourсe #XX -- [ Pg.3 ]




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