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Silicon dioxide procedures

For some materials, the most notable being silicon, heating alone sufiBces to clean the surface. Commercial Si wafers are produced with a thin layer of silicon dioxide covering the surface. This native oxide is inert to reaction with the atmosphere, and therefore keeps the underlying Si material clean. The native oxide layer is desorbed, i.e. removed into the gas phase, by heating the wafer in UHV to a temperature above approximately 1100 °C. This procedure directly fonus a clean, well ordered Si surface. [Pg.303]

According to Coimbra et solvents play a central role in the majority of chemical and pharmaceutical industrial processes. The most used method to obtain artemisinin (1) from A. annua is through the use of organic solvents such as toluene, hexane, cyclohexane, ethanol, chloroform and petroleum ether. Rodrigues et al described a low-cost and industrial scaled procedure that enables artemisinin (1) enhanced yields by using inexpensive and easy steps. Serial extraction techniques allowed a reduction of 65% in solvent consumption. Moreover, the use of ethanol for compound extraction is safer when compared to other solvents. Flash column pre-purification employing silicon dioxide (Zeosil ) as stationary phase provided an enriched artemisinin (1) fraction that precipitated in hexane/ethyl acetate (85/15, v/v) solution. These results indicate the feasibility of producing artemisinin (1) at final cost lowered by almost threefold when compared to classical procedures. [Pg.316]

Sodium sulfate precipitation is not usually recommended for most murine MAbs because mouse/rat IgG can be degraded by the relatively high temperature (25°C) used during this procedure. If lipid contamination of ascitic fluids is a particular problem, add silicone dioxide powder (15 mg/mL), and centrifuge for 20 min at 2000g. Use the method described in Chapter 10, Section 3.2.1. [Pg.116]

In 1992, R.M. Laine (University of Michigan, Ann Arbor) announced the development of a process that transforms sand and other forms of silica into reactive silicates that can be used to synthesize unusual silicon-based chemicals, polymers, glasses, and ceramics. The Lame procedure produces pentacoordinate silicates directly from low-cost raw materials—silicon dioxide,ethylene glycol, and an alkali base. The mixture is approximately a 60 1 ratio of silica gel, fused silica (or sand) to metal hydroxide and ethylene... [Pg.1475]

Silicon dioxide layers can be formed using any of several techniques, including thermal oxidation of silicon, wet anodization, CVD, or plasma oxidation. Thermal oxidation is the dominant procedure used in IC fabrication. The oxidation process selected depends on the thickness and properties of the desired oxide layer. Thin oxides are formed in dry oxygen, whereas thick (>0.5 fin1) oxide layers are formed in a water vapor atmosphere (13). [Pg.347]

Other metal carbonates behave similarly (i.e., the oxides are formed during the ashing procedure). The stable mineral quartz (silicon dioxide, silica, Si02) is the only major mineral found in coal that is inert during high-temperature ashing. [Pg.97]

Fig. 1 presents the oxidation rate versus time for silicon powders differing in preparation procedure, particle shape, and particle size. The images in Fig. 1 illustrate the morphology of the powder particles. The particle shape may have a significant effect on the oxidation process [4,5,7]. The oxidation of silicon powders to silicon dioxide was found to occur in two steps, with a transition at a certain thickness of the oxidized layer, which depended on the oxidation time, particle shape, and particle size. [Pg.390]

In one modification of this procedure, the starting material is pyrolyzed rice hulls in place of more conventional forms of silicon dioxide (31). Another unique process involves chlorination of a combination of SiC and Si02 with carbon in a fluid-bed reactor (32). The advantages of this process are that it is less energy-intensive and substantially free of lower silicon chlorides. [Pg.19]

Oxidation of silicon to create a silicon dioxide layer on the silicon surface can be done either by the thermal growth methods or the undesired native growth process. The process is an adding procedure which adds oxygen to react with silicon to form silicon dioxide oti the silicon surface. The process consumes silicon during the oxidation procedure. In general, the oxide layer can be grown either by wet or dry oxidatimi processes in a furnace at a temperature of 750-1,100 °C. The reaction can be expressed as... [Pg.2634]

Electrostatic Forces— The AFM Tip. The most frequently used commercial AFM tip consists of microfabricated silicon nitride. Under normal laboratory conditions, this is, in reality, an ill-defined, hydroxylated melange of silicon oxynitride and silicon dioxide, the precise composition of which depends on a combination of manufacturing conditions and tip history. An isoelectric point of around pH=5 has been firequently observed in force-distance measurements under electrolyte in our laboratory (15), suggesting the oxidized oxynitride composition mentioned above. In order to achieve a better reproducibility, however, we have adopted an oxygen plasma-treatment procedure, which leaves the tip coated with hydroxylated silica, as evidenced by an isoelectric point of around pH=3 (16), as measured by force titration (75). [Pg.274]

Silicon dioxide is grown using thermal oxidation procedure. Thermal oxidation can be categorized as both dry oxidation and wet oxidation. Silicon reacts with dry oxygen at high temperature (800-1200 °C) during dry oxidation process with the following reaction ... [Pg.380]

The detailed fabrication procedure of silicon membrane with controlled thickness using the photolithography and etching procedure is discussed here. Figure 10.25 pictorially shows the stepwise procedure of fabrication. The first step is the deposition of silicon dioxide layer (Si02) on the silicon wafer. This is followed by the deposition of photosensitive resist. The photoresist is exposed under a mask during lithography, and the exposed portion of the resist dissolves after... [Pg.403]


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