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Silane-hydrogen discharge

In a silane-hydrogen discharge the feedstock gases SiHa and H2 take part in all the processes that occur. A large number of reactions have been proposed (see e.g. Kushner [190]). Nienhuis et al. [191] have performed a sensitivity analysis in their self-consistent fluid model, from which a minimum set of reactions have been extracted for a typical low-pressure RF discharge. Tables II and III list these reactions. They will be used in the plasma models described in subsequent sections. The review articles on silane chemistry by Perrin et al. [192] and on hydrogen by Phelps [193] and Tawara et al. [194] have been used. The electron collision data are compiled in Figure 13 [189]. [Pg.35]

The ID fluid discharge model has been applied to the ASTER deposition system (see Section 1.2.4). The deposition reactor has an inner volume of 10 1 and an inner diameter of 20 cm. The upper electrode is grounded (see Fig. 4a), and the powered electrode is located 2.7 cm lower. Other typical silane-hydrogen discharge parameters are summarized in Table IV. [Pg.50]

As a first attempt to modify the code to be able to run simulations on SiH4-H2 discharges, a hybrid PlC/MC-fluid code was developed [264, 265]. It turned out in the simulations of the silane-hydrogen discharge that the PIC/MC method is computationally too expensive to allow for extensive parameter scans. The hybrid code combines the PIC/MC method and the fluid method. The electrons in the discharge were handled by the fluid method, and the ions by the PIC/MC method. In this way a large gain in computational effort is achieved, whereas kinetic information of the ions is still obtained. [Pg.68]

Sheath Properties of an Argon-Silane and Two Silane-Hydrogen Discharges"... [Pg.103]

This section treats the plasma physics and plasma chemistry of the typical silane-hydrogen RF discharge, with occasional examples that employ a somewhat higher excitation frequency. Electrical characterization of the discharge is followed by an analysis of the silane chemistry. An appropriate set of gas phase species is presented, which are then used in the modeling of the plasma. A comparison is made between modeling results and experimental work in ASTER. Extension to 2D modeling is presented as well. [Pg.28]

RF frequency variation. In Figure 18 are shown the effects of RF frequency on the partial pressures of silane, hydrogen, and disilane (Fig. 18a) and on the deposition rate (Fig. 18b). The total pressure is 16 Pa, and the plasma power is 5 W. The discharge is in the a-regime. [Pg.55]

Simulation of RF Discharges in Silane-Hydrogen Mixtures with the Hybrid Model... [Pg.70]

In order to relate material properties with plasma properties, several plasma diagnostic techniques are used. The main techniques for the characterization of silane-hydrogen deposition plasmas are optical spectroscopy, electrostatic probes, mass spectrometry, and ellipsometry [117, 286]. Optical emission spectroscopy (OES) is a noninvasive technique and has been developed for identification of Si, SiH, Si+, and species in the plasma. Active spectroscopy, such as laser induced fluorescence (LIF), also allows for the detection of radicals in the plasma. Mass spectrometry enables the study of ion and radical chemistry in the discharge, either ex situ or in situ. The Langmuir probe technique is simple and very suitable for measuring plasma characteristics in nonreactive plasmas. In case of silane plasma it can be used, but it is difficult. Ellipsometry is used to follow the deposition process in situ. [Pg.79]

The partial pressures of the stable neutral molecules in the discharge (silane, hydrogen, disilane, trisilane) can be measured by a quadrupole mass spectrometer (QMS). The QMS usually is mounted in a differentially pumped chamber, which is connected to the reactor via a small extraction port [286]. In the ASTER system a QMS is mounted on the reactor that is used for intrinsic material deposition. The QMS background pressure (after proper bake-out) is between 10 and 10 mbar. The controllable diameter in the extraction port is adjusted so that during discharge operation the background pressure never exceeds 10"" mbar. [Pg.85]

In most cases, CVD reactions are activated thermally, but in some cases, notably in exothermic chemical transport reactions, the substrate temperature is held below that of the feed material to obtain deposition. Other means of activation are available (7), eg, deposition at lower substrate temperatures is obtained by electric-discharge plasma activation. In some cases, unique materials are produced by plasma-assisted CVD (PACVD), such as amorphous siHcon from silane where 10—35 mol % hydrogen remains bonded in the soHd deposit. Except for the problem of large amounts of energy consumption in its formation, this material is of interest for thin-film solar cells. Passivating films of Si02 or Si02 Si N deposited by PACVD are of interest in the semiconductor industry (see Semiconductors). [Pg.44]

Electrical Discharge, Irradiation, and Photolysis. Early reports of the decomposition of SiH in an electrical discharge indicated that the main products were hydrogen, soHd sHicon subhydrides of composition SiH 2 i smaH quantities of higher silanes (37). However, more recent... [Pg.22]

In the early 1970s, Spear and coworkers (Spear, 1974 Le Comber et al., 1974), although unaware of the presence of hydrogen, demonstrated a substantial reduction in the density of gap states (with a corresponding improvement in the electronic transport properties) in amorphous silicon films that were deposited from the decomposition of silane (SiH4) in an rf glow discharge. [Pg.17]

Figure 16 (Street et al., 1986) shows the typical sample structure, consisting of three layers of a-Si H. Results using this technique have been reported for samples grown by the rf glow discharge of silane and by rf sputtering (Shinar et al., 1989). The first layer is hydrogenated amorphous silicon, deposited under conditions that yield high quality films (i.e., deposition temperature of 230°C, low growth rate) and is typically two microns thick. Next a layer of approximately 1000 A is deposited, whereby... Figure 16 (Street et al., 1986) shows the typical sample structure, consisting of three layers of a-Si H. Results using this technique have been reported for samples grown by the rf glow discharge of silane and by rf sputtering (Shinar et al., 1989). The first layer is hydrogenated amorphous silicon, deposited under conditions that yield high quality films (i.e., deposition temperature of 230°C, low growth rate) and is typically two microns thick. Next a layer of approximately 1000 A is deposited, whereby...

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See also in sourсe #XX -- [ Pg.35 , Pg.99 ]




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Hydrogen silanes

Silane discharges

Silanic hydrogen

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