Scanning thermal microscopy SThM

Scanning thermal microscopy (SThM) measures two-dimensional temperature distributions across a sample surface. This is a special thermal technique. 

Scanning thermal microscopy (SThM) or Scanning near-field thermal microscopy (SNThM) - Constant current - Constant temperature Scanning thermal profiler (SThP) Tunneling thermometer (TT)... 

Scanning Thermal Microscopy (SThM) Scanning Ion Conductance Microscopy (SICM) ... 

The introduction and development of Micro-Thermal Analysis are described and discussed by Duncan Price in Chapter 3. The atomic force microscope (AFM) forms the basis of both scanning thermal microscopy (SThM) and instruments for performing localised thermal analysis. The principles and operation of these techniques, which exploit the abilities of a thermal probe to act both as a very small heater and as a thermometer, in the surface characterisation of materials are described in detail. The... 

Scanning thermal microscopy (SThM) was used to estimate the surface distribution of the microthermal properties (for details see Ref 21). As can be seen from the images obtained in this mode (Figure 8, substantial thermal contrast for PB and PS phases can be detected at the probe temperature above 50 C. A geometrical contribution is also clearly visible However, taking into account that the effective thermal contact area for polymeric materials is about 1 pm [21], we can refer the major contribution in different thermal re onse for the polymer film to different thermal conductivities of glassy and rubber phases. 

The potential of scanning thermal microscopy (SThM) to provide new property information regarding polymer surfaces has been investigated over the past year with the Pollock group in the UK. In the SThM experiment a small Wollaston wire... 

Scanning thermal microscopy (SThM) is a new near-surface technology that combines in a single... 

Scanning thermal microscopy (SThM) is a contact AFM technique that allows spatial mapping of temperature or thermal conductivity across a sample surface in addition to topography. Most thermal probes utilize a temperature-sensitive resistor placed on the end of the tip. These resistor probes can be fabricated from a V-shaped Wollaston wire made of a platinum inner core and outer sheath of silver, in which the silver sheath is etched away at the V-shaped tip. Eigure 19 shows a Wollaston wire probe. In passive mode, the tip is scanned across a heated sample under constant-force feedback (contact mode) and a small current is passed through the probe to sense the tip resistance. The resistance value at any point is a measure of the local temperature, and thus a temperature map and topographic image may be produced simultaneously. 

The thermal properties of a surface can be determined with a lateral resolution of 2000 A using scanning thermal microscopy (SThM). The scanning tip is in the form of a thermocouple which is heated by a laser. The thermal loss to the surface of a bulk or thin film is then measured. 

It is possible to image the thermal pattern over a surface by having a thermocouple junction on the probe tip of an AFM the technique is called scanning thermal microscopy (SThM). Thermocouple junctions 100-500 nm in diameter have been produced that have a lOnm resolution (low to high temperature). By sending a thermal pulse through the substrate, differences in surface temperature may indicate poor thermal contact (i.e. poor adhesion). 

Scanning thermal microscopy (SThM) (characterization) An AFM that uses a thermocouple junction as the probe tip, which can detect variation in temperature over a surface to a lateral resolution of about 10 nm. 

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