Scanning Auger microscopy

Yes, in combination with ion-beam sputtering 300 A for Auger analysis, even less for imaging Yes, called Scanning Auger Microscopy, SAM Sample requirements Vacuum-compatible materials Main use Elemental composition of inorganic materials... 

Fein, A.P. J. Vac. Sci. Technol. A. in press)(3). Electronic structure measurements of occupied states are typically made with UPS, while unoccupied states are probed by IPS (49). EELS probes both filled and unfilled states simultaneously, and is therefore used in conjunction with either UPS or IPS to complete a band structure determination (44,49). A new electronic spectroscopy technique, Field Emission Scanning Auger Microscopy (50), utilizes STM-like technology to effect highly localized (c.a. 1 /im) Auger electron spectroscopy. The local electronic information afforded by STM is a valuable complement to these other techniques, and STM is the only one of these methods that may be applied to in situ investigations in condensed media. 

Auger spectroscopy can also be used in a scanning mode (scanning Auger microscopy, or SAM) to yield surface topographical and elemental distribution data (30). 

Cazeneuve, C., Castle, J.E. and Watts, J.F. (1990), The structure of the interface in carbon fiber composites by scanning Auger microscopy. J. Mater. Sci, 25, 1902-1908. 

Rutherford backscattering spectroscopy reflected high energy electron diffraction scanning Auger microscopy... 

Basics on scanning auger microscopy. Available at http //www.uksaf.org/tech/ sam.html. 

Finally, the surface and bulk compositions of these fibers can vary dramatically. Figures 5 and 6 show the scanning Auger microscopy (SAM) profiles of SGN and HPZ ceramic fibers, respectively. Because the fiber-matrix interfaces are critical in many applications (2), this type of characterization of fiber surface composition and chemistry must be carried out. 

Scanning Auger Microscopy for Dating of Manuscript Inks... 

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