Scanning auger microscopy substrate

Figure 9. Scanning auger microscopy (SAM) maps and surface profile trace for PTFE wear film on an Iridium substrate. Load, 2 newtons temperature, 24 C sliding speed, 0.1 mm per second.

Pb by ac electrochemical preparation while the alumina layers remained on the Al-substrate. Deposited metal wires were characterized by atomic force, scanning electron microscopy and Auger-spectroscopy. 

After the frictional experiments, the Si substrate with Ag film less than 4 nm thick was transferred to the AES chamber to perform AES analysis on a worn surface. The peak-background ratio of Ag MNN Auger electron intensity on the worn surface compared with the unworn surface on the substrates was obtained by in-situ AES with an acceleration voltage of 5 kV and a probe current of 100 nA. The locations of worn surfaces on Ag films were identified by scanning electron microscopy (SEM) after frictional experiments. 

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