Photon analysis

The objective of nanoscale optofluidic charac-terizatimi is to combine different nanophotonics technologies with microfluidic devices and thereby explore and develop photonic analysis techniques based oti the microscopic flows of liquids and on nanophotcHiic properties. The optofluidic character-izatimi techniques will be powerful new tools for a wide range of applications in optical information processing and the miniaturizatimi of chemical and biological processes for synthesis, analysis, and recognidOTi [1]. 

Chung, H.S., Celbner, T., Louis, J.M., Eaton, W.A. Measuring ultrafast protein folding rates from photon-by-photon analysis of single molecule fluorescence trajectories. Chem. Phys. 422, 229-237 (2013)... 

Obviously, for photon analysis, the less material in front of the calorimeter the better. 

Esposito, A. Robello, M. Pellistri, F. Marchetti, C. Two-photon analysis of lead accumulation in rat cerebellar granule neurons. Neurochem. Res. 2005, 30, 949-954. 

With the exception of the scanning probe microscopies, most surface analysis teclmiques involve scattering of one type or another, as illustrated in figure A1.7.11. A particle is incident onto a surface, and its interaction with the surface either causes a change to the particles energy and/or trajectory, or the interaction induces the emission of a secondary particle(s). The particles that interact with the surface can be electrons, ions, photons or even heat. An analysis of the mass, energy and/or trajectory of the emitted particles, or the dependence of the emitted particle yield on a property of the incident particles, is used to infer infomiation about the surface. Although these probes are indirect, they do provide reliable infomiation about the surface composition and structure. 

Beyond sueh eleetronie symmetry analysis, it is also possible to derive vibrational and rotational seleetion rules for eleetronie transitions that are El allowed. As was done in the vibrational speetroseopy ease, it is eonventional to expand if (R) in a power series about the equilibrium geometry of the initial eleetronie state (sinee this geometry is more eharaeteristie of the moleeular strueture prior to photon absorption) ... 

Colorimetry, in which a sample absorbs visible light, is one example of a spectroscopic method of analysis. At the end of the nineteenth century, spectroscopy was limited to the absorption, emission, and scattering of visible, ultraviolet, and infrared electromagnetic radiation. During the twentieth century, spectroscopy has been extended to include other forms of electromagnetic radiation (photon spectroscopy), such as X-rays, microwaves, and radio waves, as well as energetic particles (particle spectroscopy), such as electrons and ions. ... 

The chemical, stmctural, and electronic characteristics of surfaces and interfaces are usually different from those of the bulkphase(s). Thus, methods to be used for the analysis of surfaces must be selective in response to the surface or interfacial region relative to the bulk. Surfaces and interfaces are most commonly explored using techniques based on the interaction of photons, electrons, or ions with the surface or using a force such as electric field or van der Waals attraction. These excitations generate a response involving the production of photons, electrons, ions or the alteration of a force that is then sensed in the analysis. 

Other techniques in which incident photons excite the surface to produce detected electrons are also Hsted in Table 1. X-ray photoelectron Spectroscopy (xps), which is also known as electron spectroscopy for chemical analysis (esca), is based on the use of x-rays which stimulate atomic core level electron ejection for elemental composition information. Ultraviolet photoelectron spectroscopy (ups) is similar but uses ultraviolet photons instead of x-rays to probe atomic valence level electrons. Photons are used to stimulate desorption of ions in photon stimulated ion angular distribution (psd). Inverse photoemission (ip) occurs when electrons incident on a surface result in photon emission which is then detected. 

Depth sensitivity is an equally important consideration in the analysis of surfaces. Techniques based on the detection of electrons or ions derive their surface sensitivity from the fact that these species cannot travel long distances in soflds without undergoing interactions which cause energy loss. If electrons are used as the basis of an analysis, the depth resolution will be relatively shallow and depend on both the energy of the incident and detected electrons and on characteristics of the material. In contrast, techniques based on high energy photons such as x-rays will sample a much greater depth due... 

The physical techniques used in IC analysis all employ some type of primary analytical beam to irradiate a substrate and interact with the substrate s physical or chemical properties, producing a secondary effect that is measured and interpreted. The three most commonly used analytical beams are electron, ion, and photon x-ray beams. Each combination of primary irradiation and secondary effect defines a specific analytical technique. The IC substrate properties that are most frequendy analyzed include size, elemental and compositional identification, topology, morphology, lateral and depth resolution of surface features or implantation profiles, and film thickness and conformance. A summary of commonly used analytical techniques for VLSI technology can be found in Table 3. 

Analytical Applications. Chemiluminescence and bioluminescence are useful in analysis for several reasons. (/) Modem low noise phototubes when properly instmmented can detect light fluxes as weak as 100 photons/s (1.7 x 10 eins/s). Thus luminescent reactions in which intensity depends on the concentration of a reactant of analytical interest can be used to determine attomole—2eptomole amounts (10 to 10 mol). This is especially useful for biochemical, trace metal, and pollution control analyses (93,260—266) (see Trace and residue analysis). (2) Light measurement is easily automated for routine measurements as, for example, in clinical analysis. 

In the x-ray portion of the spectmm, scientific CCDs have been utilized as imaging spectrometers for astronomical mapping of the sun (45), galactic diffuse x-ray background (46), and other x-ray sources. Additionally, scientific CCDs designed for x-ray detection are also used in the fields of x-ray diffraction, materials analysis, medicine, and dentistry. CCD focal planes designed for infrared photon detection have also been demonstrated in InSb (47) and HgCdTe (48) but are not available commercially. 

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