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Phase-shift

In contrast to the emission lifetime determination techniques reported above, the phase shift does not require the collection of the excited states decay curve. Indeed this frequency-domain technique provides emission lifetimes by measuring unusual parameters. [Pg.176]

The peculiarity of an instmmentation based on this technique is the exciting source, that, contrary to what was previously seen for other instrumentation, exhibits continuum light emission although variable in intensity with time (it goes from a maximum to a minimum, being never zero). Thus, the fight source is [Pg.176]

The relationship between the emission lifetime and the two parameters phase shift (5) and intensity reduction percentage or modulation degree (M) are as follows  [Pg.177]

Practically, to measure the excited state lifetime of an emitting sample, one has to measure the phase shift 8 and the modulation degree M at various frequency modulation of the exciting source. The measurement starts at a relatively high modulation frequency, at which, with the emission lifetime being faster than a single excitation wave, the emission profile matches the excitation behavior 8 — 0, M — 100%). Then, the modulation frequency is progressively increased and at a certain frequency the emission becomes shifted ( 0) and the intensity decreases (M 100%). [Pg.177]

the emission lifetime is evaluated by a best-fitting procedure (non-linear least-squares analysis) over the shift angles and the modulation degrees obtained at [Pg.177]


According to some remarks concerning the physical interaction between the incident ultrasonic wavelet and the defects [4-6], we consider that an Ascan signal, may be described as a weighted sum of few delayed and phase-shifted replicas of the ultrasonic incident wavelet j(r). We can express this mathematically as ... [Pg.174]

Theoretical studies of the interaction between an ultrasonic beam and planar defects have been widely carried out and shown that the upper and lower tip diffraction echoes are characterized by phase inversion. In other words, the measurement of 180° phase shift between these two echoes proves the plane nature of the defect that has generated them. [Pg.178]

Another reason for a deviation between measured and calculated data is the phase shift along the extension of the crack in z-direction. We will discuss this problem in more detail in the following parts. [Pg.258]

In order to realise such a high dynamic range, either a local compensation coil at the location of the SQUID [9] or a gradiometric excitation coil like the double-D coil have to be used. In case of the electronic compensation, the excitation field and the response of the conducting sample is compensated by a phase shifted current in an additional coil situated close to the SQUID-sensor. Due to the small size of this compensation coil (in our case, the diameter of the coil is about 1 mm), the test object is not affected by it. [Pg.259]

The magnitude of the phase shift relates to the total depth of the metal penetrated and hence is a sensitive measure of the wall thiekness and loss of thiekness. [Pg.321]

After amplification both signals change their initial phases due to the delay r of the amplifier unblank (r = 0.1 - 0.5 ms), phase shift in it and wave propagation in passive vibrator s elements. All the mentioned phase changes are proportional to the frequency. The most contribution of them has unblank delay z. Thus frequency variations changes the initial phases) f/, and j(/c) of both signals and their difference A - Vi ... [Pg.828]

In ellipsometry monochromatic light such as from a He-Ne laser, is passed through a polarizer, rotated by passing through a compensator before it impinges on the interface to be studied [142]. The reflected beam will be elliptically polarized and is measured by a polarization analyzer. In null ellipsometry, the polarizer, compensator, and analyzer are rotated to produce maximum extinction. The phase shift between the parallel and perpendicular components A and the ratio of the amplitudes of these components, tan are related to the polarizer and analyzer angles p and a, respectively. The changes in A and when a film is present can be related in an implicit form to the complex index of refraction and thickness of the film. [Pg.126]

One interesting experiment is to apply a n/l pulse followed by a ii/2 phase shift of the field. This phase shift will bring parallel to. Sinee now x F = 0, the population is fixed m time in a eoherent superposition between the ground and exeited states. This is ealled photon looking. [Pg.232]

Figure Al.6.8. Wavepacket interferometry. The interference contribution to the exeited-state fluoreseenee of I2 as a fiinotion of the time delay between a pair of ultrashort pulses. The interferenee eontribution is isolated by heterodyne deteetion. Note that the stnieture in the interferogram oeeurs only at multiples of 300 fs, the exeited-state vibrational period of f. it is only at these times that the wavepaeket promoted by the first pulse is baek in the Franek-Condon region. For a phase shift of 0 between the pulses the returning wavepaeket and the newly promoted wavepaeket are in phase, leading to eonstnietive interferenee (upper traee), while for a phase shift of n the two wavepaekets are out of phase, and interfere destnietively (lower traee). Reprinted from Seherer N F et 0/1991 J. Chem. Phys. 95 1487. Figure Al.6.8. Wavepacket interferometry. The interference contribution to the exeited-state fluoreseenee of I2 as a fiinotion of the time delay between a pair of ultrashort pulses. The interferenee eontribution is isolated by heterodyne deteetion. Note that the stnieture in the interferogram oeeurs only at multiples of 300 fs, the exeited-state vibrational period of f. it is only at these times that the wavepaeket promoted by the first pulse is baek in the Franek-Condon region. For a phase shift of 0 between the pulses the returning wavepaeket and the newly promoted wavepaeket are in phase, leading to eonstnietive interferenee (upper traee), while for a phase shift of n the two wavepaekets are out of phase, and interfere destnietively (lower traee). Reprinted from Seherer N F et 0/1991 J. Chem. Phys. 95 1487.
Equations A3.11.114(b) and A3.11.115(b) are in a fonn that is convenient to use for potential scattering problems. One needs only to detemiine the phase shift 5 for each i, then substitute into these equations to detemiine the cross sections. Note that in the limit of large i, finiist vanish so that the infinite sum over partial waves iwill converge. For most potentials of interest to chemical physics, the calculation of finiist be done numerically. [Pg.980]

For fluorescent compounds and for times in die range of a tenth of a nanosecond to a hundred microseconds, two very successftd teclmiques have been used. One is die phase-shift teclmique. In this method the fluorescence is excited by light whose intensity is modulated sinusoidally at a frequency / chosen so its period is not too different from die expected lifetime. The fluorescent light is then also modulated at the same frequency but with a time delay. If the fluorescence decays exponentially, its phase is shifted by an angle A([) which is related to the mean life, i, of the excited state. The relationship is... [Pg.1123]

The phase shift is measured by comparing the phase of the fluorescence with the phase of light scattered by a cloudy but non-fluorescent solution. [Pg.1123]

One advantage of the photon counting teclmique over the phase-shift method is that any non-exponential decay is readily seen and studied. It is possible to detect non-exponential decay in the phase-shift method too by making measurements as a fiinction of tlie modulation frequency, but it is more cumbersome. [Pg.1124]

Spectral lines are fiirther broadened by collisions. To a first approximation, collisions can be drought of as just reducing the lifetime of the excited state. For example, collisions of molecules will connnonly change the rotational state. That will reduce the lifetime of a given state. Even if die state is not changed, the collision will cause a phase shift in the light wave being absorbed or emitted and that will have a similar effect. The line shapes of collisionally broadened lines are similar to the natural line shape of equation (B1.1.20) with a lifetime related to the mean time between collisions. The details will depend on the nature of the intemrolecular forces. We will not pursue the subject fiirther here. [Pg.1144]

The relationship between mean squared phase shift and mean squared displacement can be modelled in a simple way as follows This motion is mediated by small, random jumps in position occurring with a mean interval ij. If the jump size in the gradient direction is e, then after n jumps at time the displacement of a spin is... [Pg.1540]

Thurnauer M C and Norris J R 1980 An electron spin echo phase shift observed in photosynthetic algae. Possible evidence for dynamic radical pair interactions Chem. Phys. Lett. 76 557-61... [Pg.1621]

This equation describes the Fourier transfonn of the scattering potential V r). It should be noted that, in the Bom approximation the scattering amplitude/(0) is a real quantity and the additional phase shift q(9) is zero. For atoms with high atomic number this is no longer tme. For a rigorous discussion on the effects of the different approximations see [2] or [5]. [Pg.1629]

Figure Bl.26.10. Various polarization configurations corresponding to different values of the phase shift, 4)... Figure Bl.26.10. Various polarization configurations corresponding to different values of the phase shift, 4)...

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Acoustical phase shift

Alternating phase shift

Alternating phase-shifting masks

Anisotropic particles phase shifts

Attenuated phase-shifting mask

Bloch-Siegert phase shift

Bloch-Siegert phase shift compensated PIPs

Bode diagram phase shift

Breit-Wigner phase shift

Canonical phase shift

Chemical shift dependent phase correction

Chemical shift dependent phase errors

Continuum scattering phase shifts

Cross section phase shift analysis

Cyanobiphenyls phase shifts

Dimensionless parameters phase shifts

EXAFS phase-shift functions

Emission phase-angle shift

Energy-dependent phase shift

Extended phase shift

Field-Induced Refractive Index Change and Phase Shift

Field-Induced Shifts of the Phase Transition Temperatures

Filter second-order phase shift

Fitting EXAFS data phase shifts

Fluorescence phase-shift method

Focusing phase-shift functions

Formulation with Phase Shift Terms

Fourier transform phase-shift subtracted

Frequency phase shift

Frequency-Domain (Phase-Shift) Measurements

Gouy phase shift

Hydrogen phase shift

Laser Doppler phase shift, particle sizing

Laser phase shift interferometry

Local phase shift

Minimum phase shift network

Modeling, phase shifts

Modulation-phase shift

NanoMapper, from ADE Phase Shift, USA

Optical phase shift

Order parameter phase shift

Oscillator phase shift

Pair-correlation model Phase shifts

Paramagnetic phase shifts

Phase angle shift

Phase equilibrium data shift

Phase shift Photoelectron spectroscopy

Phase shift coefficient

Phase shift coulomb

Phase shift mask

Phase shift method

Phase shift plate

Phase shift radial

Phase shift reduction

Phase shift resonance

Phase shift spin polarized

Phase shift sudden

Phase shift/change

Phase shifting microscopy

Phase shifts microscope

Phase shifts, temperature-corrected

Phase temperature shifts

Phase-Shift Lithography

Phase-shift functions

Phase-shift interferometry

Phase-shift subtracted Fourier

Phase-shift technique

Phase-shift-keying technique

Phase-shifting

Phase-shifting

Phase-shifting masks

Phase-shifting plate

Photoacoustic phase shift

Poly modeling phase shifts

Position-dependent phase shift

Quadrature phase-shift keying

Resonance S matrix, phase shift, and the cross section

Resonant phase shift

Sampling element, phase shift

Scattering phase shift

Scattering theory phase shift

Shift and phase

Shifts phase transitions

Sine waves phase shift

Strain phase angle shift

Stress, phase angle shift

Tunneling phase shift

Universal phase shift

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