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Phase shift plate

A two-element modnlator is more complicated, as the phase-shifting plate (PSP) is rotating and the polarizer is fixed. The transformation matrix of a PSP with phase shift A is... [Pg.480]

If in such a modulator one uses a 180-degree phase-shifting plate, equation (14) reduces to... [Pg.483]

Figure 5. Schematic arrangement for hologram formation with an electron biprism. A plane wave illuminates the specimen placed off-axis. After the object lens a wire is placed between two earthed plates. The wire is the electron optical analog of a Fresnel biprism and causes the unperturbed and perturbed waves forming the electron hologram to interfere. The object phase-shift causes a displacement in the hologram fringes, and is thus observable. Figure 5. Schematic arrangement for hologram formation with an electron biprism. A plane wave illuminates the specimen placed off-axis. After the object lens a wire is placed between two earthed plates. The wire is the electron optical analog of a Fresnel biprism and causes the unperturbed and perturbed waves forming the electron hologram to interfere. The object phase-shift causes a displacement in the hologram fringes, and is thus observable.
With the paraboloid method followed by the maximum-likelihood refinement of the exit-wave function, the inherent effects of the microscope on the exit wave function due to spherical aberration and defocus are eliminated resulting in a complex-valued wave function with the delocalization removed. However, the electron wave function frequently suffers from residual aberrations due to insufficient microscope alignment. In a single image, it is not possible to remove these aberrations, but, with the reconstructed complex wave function, one can use a numerical phase plate to compensate the effect of aberrations by applying appropriate phase shifts (Thustetal. 1996b). [Pg.387]

Figure 9. Numerical phase plates to compensate the phase shift induced by 2-, 3-fold astigmatism and coma - shown in nil steps (200 kV, g ax = 8 nm, A2 = 15 nm, A3 = 1100 nm, b = 488 nm) the white line indicates the nIA boundary. The right phase plate shows the... Figure 9. Numerical phase plates to compensate the phase shift induced by 2-, 3-fold astigmatism and coma - shown in nil steps (200 kV, g ax = 8 nm, A2 = 15 nm, A3 = 1100 nm, b = 488 nm) the white line indicates the nIA boundary. The right phase plate shows the...
Here t is the resulting shear stress, 6 is the phase shift often represented as tan(d), and (O is the frequency. The term 6 is often referred to as the loss angle. The in-phase elastic portion of the stress is To(cosd)sin(wt), and the out-of-phase viscous portion of the stress is To(sind)cos(complex modulus and viscosity, which can be used to extend the range of the data using the cone and plate rheometer [6] ... [Pg.93]

In frequency regions where absorption is small the two indices of refraction , and n2 give rise to the phenomenon of double refraction. One of the most common uses for this property is in making wave retarders such as quarter-wave plates incident light linearly polarized with equal x and y field components is phase shifted upon transmission because of the two different phase velocities c/w, and c/n2. An entire field, usually referred to as crystal optics, arises out of this and further applications of crystal anisotropy. [Pg.248]

Flfl. 7-6 Interferometer photograph showing isotherms on a healed vertical flat plate resulting from a periodic disturbance of the boundary layer. Note phase shifts in maximum points of isotherms. (From Holman, Gartrell, and Soehngen... [Pg.332]

With an angle of incidence of 30° and a beam waist w = 6A, it is possible to achieve d/w 0.02 for a quarter-wave plate, which we will take as a practical specification. The portion of the phase-shifted beam in the fundamental mode of Eq. (96) may be used to calculate the polariza-... [Pg.304]

In order to calculate the bandwidth of the PTR, we need to calculate the phase error introduced in the phase-shifted portion of the output beam as A varies. For a PTR operated as a quarter-wave plate, we write... [Pg.305]

Waters introdnced a stacked-ring RF ion-transmission device (the MassTransit ion tutmel), replacing the RF-only hexapoles [43]. The device consists of a series of constant-apertnre and eqttally-spaced ring electrodes. An RF voltage is applied with 180° phase shift to adjacent plates, generating a field that constrains the ions to the centre region of the device. 60-80% improved ion transmission was observed. [Pg.119]

At last it remains to point out that phase errors are not only unwanted and under certain conditions unavoidable phenomena in Fourier spectroscopy the elimination of which is a necessary but rather involved and elaborate procedure. In contrast, there are special applications of Fourier spectroscopy where phase errors have been introduced deliberately. In this method which is known as "chirping 86,90-92) g. plane parallel plate called chirping plate is placed in one arm of the Michelson interferometer or two different plates are placed one in each arm. These plates introduce a wave niunber dependent phase shift... [Pg.152]

Note that the amplitude and phase shift are recorded and may be related to the dielectric properties of the medium (as long as plate geometries are also included in the assessment). [Pg.290]

The quartz disk is used as the bottom plate of a cell culture vessel and is moimted in a temperature controlled crystal holder (37 °C). The surface electrodes on either side of the quartz are connected to an impedance analyzer (Solatron Instruments, SI-1260) operating in continuous wave mode. The frequency-dependent complex impedance Z(J) returned by the impedance analyzer is expressed as magnitude of impedance Z (f) and phase shift between voltage and current (f). The raw data is analyzed by the well-known Butterworth-Van Dyke (BVD) equivalent circuit with the liunped impedance elements Co, Rq, iq, Cq and Zl. Rq, Lq and Cq represent the piezoelectric properties of the unperturbed resonator itself, whereas Co summarizes its dielectric properties and all parasitic contributions arising from contacts and wiring. The load material in contact with the resonator surface is represented by the complex impedance Zl. As long as the resonator is not loaded too... [Pg.318]

Oscillatory measurements using the cone-and-plate viscometer are sometimes carried out to demonstrate the elastic behavior of a viscoelastic fluid [10]. The fluid in the viscometer is subjected to an oscillatory strain imposed on the bottom surface while the response of the shearing stress is measured on the top surface. If the phase shift between the input strain and the output stress is 90°, the sample is purely viscous if it is 0°, the sample is completely elastic. A measured phase shift between 0° and 90° demonstrates that the fluid is viscoelastic. [Pg.739]

When a quarter-wave rotating phase plate is used in a polarization modulator, it is possible to measure parameters of linear and eireular polarization simultaneously, but the aeeuraey of determining Q and U parameters is half that of parameter V. When a PSP with a phase shift of A = 126.52° is used, the accuracy of measurements of all three Stokes parameters is idenrieal. When 92= 0, the formula for right modulation beeomes... [Pg.481]

In a third sample, two dicing saw cuts were made perpendicular to the track direction and parallel to one another as shown in Figure 4-9, allowing a section of the ceramic top plate and a print of the dielectric seal material to be removed. In this sample, TDR measurements comparing the same sample in cases both with the ceramic lid in place and with the lid removed showed a visible phase-shift in the time-domain signal. [Pg.93]

Two identical zone plates provide the symmetric Fourier cosine compe-nents of the object space. In order to get the sinusoidal components of the spatial frequencies one has to use phase-shifted zone plate pairs. Thus two pairs of coders are required for complete description of the object. [Pg.229]

The shear stress at the upper plate will then vary sinusoidally with the same frequency as the shear rate, but phase shifted as shown in Figure 13.3 so that... [Pg.233]

In a homodyne detection scheme, the return beam is divided and additional phase shifts imposed by appropriate polarization optics (e.g., quarter- and half-wave plates), giving at least three phase shifts between them. Intensities at multiple detectors are combined to give phase (OPD) at nanometer resolution. [Pg.713]


See other pages where Phase shift plate is mentioned: [Pg.481]    [Pg.481]    [Pg.294]    [Pg.199]    [Pg.388]    [Pg.272]    [Pg.239]    [Pg.159]    [Pg.736]    [Pg.339]    [Pg.555]    [Pg.300]    [Pg.621]    [Pg.304]    [Pg.65]    [Pg.89]    [Pg.2972]    [Pg.384]    [Pg.152]    [Pg.478]    [Pg.328]    [Pg.20]    [Pg.242]    [Pg.343]    [Pg.235]    [Pg.263]    [Pg.46]   
See also in sourсe #XX -- [ Pg.125 ]




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