Angle analyzer

A) Rame-Hart Contact Angle Analyzer, Model No. 100-00-115. 

Step 10. The crystaHographer, using his or her knowledge of chemical information, such as bond distances and bond angles, analyzes the peak information and assigns labels and atomic types (eg, C, N, O, Si, Fe, etc) to those peaks which make good chemical sense. 

The contact angle was measured using a contact angle analyzer (CA-W, Kyowa Kaimen Chemical, Japan). 10 pi drop of water was dispensed onto the surface of the film, and then the contact angle was measured from the tangent line of the water drop placed on the surface of the film 10 s after placing the droplet. 

An UBM laser profllometer was used to quantify the surface texture of features in excess of approximately >0.1 pm in terms of an average roughness, The hydrophilic/hydrophobic properties of the surfaces were assessed through measurements of dynamic contact angle (CAHN Dynamic Contact Angle analyzer) (Gun ko et al. 2011b). 

Advancing contact angle were measured either by goniometry or Wilhelmy plate method. The former was carried out with an NRL A-100 Contact Angle Goniometer (commercially available through Rame-Hart, Inc). Sample films were prepared from 10 wt% solution in THF, cast into aluminum pans lined with Teflon, and dried in a hood for one week. The films were kept imder inverted beakers in the hood to reduce contact with contaminants. Only the surface formed at the air-solution interface was examined. The Wilhelmy plate method was performed with a Cahn dynamic contact angle analyzer (DCA 312). 

In ellipsometry monochromatic light such as from a He-Ne laser, is passed through a polarizer, rotated by passing through a compensator before it impinges on the interface to be studied [142]. The reflected beam will be elliptically polarized and is measured by a polarization analyzer. In null ellipsometry, the polarizer, compensator, and analyzer are rotated to produce maximum extinction. The phase shift between the parallel and perpendicular components A and the ratio of the amplitudes of these components, tan are related to the polarizer and analyzer angles p and a, respectively. The changes in A and when a film is present can be related in an implicit form to the complex index of refraction and thickness of the film. 

All of these trends can be accommodated by the orbital hybridization model The bond angles are characteristic for the sp sp and sp hybridization states of carbon and don t require additional comment The bond distances bond strengths and acidities are related to the s character m the orbitals used for bonding s Character is a simple concept being nothing more than the percentage of the hybrid orbital contributed by an s orbital Thus an sp orbital has one quarter s character and three quarters p an sp orbital has one third s and two thirds p and an sp orbital one half s and one half p We then use this information to analyze how various qualities of the hybrid orbital reflect those of its s and p contributors... 

Hybrid time-of-flight (TOF) mass spectrometers make use of a TOF analyzer placed at right angles to a main ion beam. Ions are deflected from this beam by a pulsed electric fleld at right angles to the ion beam direction. The deflected ions travel down the TOF tube for analysis. Hybrid TOF mass spectrometers have many advantages arising from the combination of two techniques, neither of which alone would be as useful. 

If, just before the ion beam reaches the ion detector, a pusher electrode is used alongside it to deflect the beam at right angles (orthogonal) to its original direction into the flight tube of a time-of-flight sector (TOP analyzer), the m/z values can be measured by the TOP section. 

The TOP analyzer is positioned at right angles (orthogonal) to the incoming ion beam. 

The TOF analyzer is placed at right angles (orthogonal) to the main ion beam, and therefore the pusher electrode accelerates a short section of this beam at right angles to its original direction. 

After the pulsed electric field has been applied, a pulse of ions travels along a TOF analyzer placed at a right angle to the original ion beam. When the pulse is off, the ions have only their original velocities and continue into a different ion collector. 

Foi shts placed at from the center of curvature, the electrons passed by this analyzer foUow the equipotential surface described by R. With an acceptance angle 8a shown in Figure 22 and a sht width w, the energy resolution of the CFIA is given by... 

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