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Phase contrast, optical microscop

See, C. W. Iravani, M. V. Wickramasinghe, H. K., Scanning differential phase contrast optical microscope application to surface studies, Appl. Opt. 1985, 24, 2373 2379... [Pg.316]

The mentioned structural cheoracteristics of HIPS at electron-microscope micrograms are defined with greater exactness than at optical because only rubber particles located in one surface can be calculated while at phase contrast optical microscope particles located in all volume of the observed film are taken into account. [Pg.381]

Analogous results were also obtained microscopically. Interactions occurred spontaneously and large aggregates were formed, which were visible with phase contrast optical microscopy. These particles interact further giving rise to even larger aggregates, which in certain cases encapsulate smaller aggregates. [Pg.30]

Using an inverted microscope, equipped with phase contrast optics if possible, examine cell culture vessels individually. Scrutiny should be especially rigorous in cases in which large-scale production is involved. Check each culture first using low power. The suppliers listed provide the specific media required but other suitable vendors exist. Batches of media should be tested for optimal growth promotion before use in cell culture quality control. [Pg.47]

Inverted microscope with phase-contrast optics... [Pg.112]

Mann, S. Meyer, J. Dietzel, I., Integration of a scanning ion conductance microscope into phase contrast optics and its application to the quantification of morphological parameters of selected cells. Journal of Microscopy 2006, 224, 152-157. [Pg.109]

The common contrast modes include polarized light, phase contrast, differential interference contrast, and Hoffman modulation contrast [5]. Depending on the nature of the polymer, such as refraction index, sample thickness, and optical anisotropies in the materials, different modes of transmission optical microscopy can be employed by mounting special accessories in a classic optical microscope to overcome different problems. For example, a polarizer and analyzer can be mounted before and after the sample to construct a polarized light microscope, commonly used for semicrystalline polymers a phase plate and phase ring can be added to construct a phase contrast optical microscopy, which is common for studying a noncrystafline multiphase polymer system. [Pg.3]

Observe the oocytes on the inverted microscope linked to the confocal using either DIG or phase-contrast optics. [Pg.83]

Techniques for differentiating between amorphous and crystalline are (i) sharp melting point, (ii) sharp peaks in the solid state infrared fingerprint region, (iii) optical birefringence observed when solid is viewed in a phase contrast microscope and (iv) sharp peaks in the powder X-ray diffraction pattern. [Pg.272]

TIRF is easy to set up on a conventional upright or inverted microscope with a laser light source or, in a special configuration, with a conventional arc source. TIRF is completely compatible with standard epi-fluorescence, bright-field, dark-field, or phase contrast illumination so that these methods of illumination can be switched back and forth readily. Some practical optical arrangements for observing TIRF through a microscope are described in Section 7.4. [Pg.290]

Powerful methods that have been developed more recently, and are currently used to observe surface micro topographs of crystal faces, include scanning tunnel microscopy (STM), atomic force microscopy (AFM), and phase shifting microscopy (PSM). Both STM and AFM use microscopes that (i) are able to detect and measure the differences in levels of nanometer order (ii) can increase two-dimensional magnification, and (iii) will increase the detection of the horizontal limit beyond that achievable with phase contrast or differential interference contrast microscopy. The presence of two-dimensional nuclei on terraced surfaces between steps, which were not observable under optical microscopes, has been successfully detected by these methods [8], [9]. In situ observation of the movement of steps of nanometer order in height is also made possible by these techniques. However, it is possible to observe step movement in situ, and to measure the surface driving force using optical microscopy. The latter measurement is not possible by STM and AFM. [Pg.93]

The refractive index, n, may be measured using an optical microscope [1,2,23,27,34]. Phase contrast increases the contrast due to differences in n and allows a more accurate determination. Interference contrast in transmission gives the optical path length and the average refractive index through the specimen thickness [1], The Becke line method gives the surface refractive index [1],... [Pg.190]


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See also in sourсe #XX -- [ Pg.267 ]




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