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N-channel

These capacitances are specified in each power MOSFET datasheet and are very important. Cg s, or drain-to-source capacitance, is considered in the drain loads, but does not directly enter into the drive design. The Ci s and C ss have direct and calculable effects upon the switching performance of the MOSFET. Figure 3-36 shows the gate and drain waveforms of a typical N-channel MOSFET switching cycle. [Pg.67]

Power switch. The power switeh is going to be a transformer-eoupled N-ehannel power MOSFET. I plan to use a dual N-Channel MOSFET in an SO-8 paekage to help save on PCB spaee. The maximum input voltage is 14 VDC. Therefore, a Edss rating of -I-30VDC or higher will be satisfaetory. The peak eurrent is 2.8 A. [Pg.164]

Schoss, m. lap womb (coat) tails shoot, sprig, -gerinne, n. channel, trough. [Pg.395]

Temporarily let us assume that the source is specified by a set of M equally probable letters, %, , uM. The coder is specified by a correspondence between these M source letters and M sequences, Xi,x2, , xM, of N channel input symbols each. N is a positive integer known as the block length of the code. Whenever the source presents the letter um to the coder, the coder presents... [Pg.220]

To produce a very thick n-channel device, the resistivity of the silicon must be made relatively high, about 5,000 to 10,000 H-cm, as opposed to the 20-100 H-cm material used in standard n-channel CCDs. Higher resistivity is required for greater penetration depth of the fields produced by the frontside polysilicon wires (penetration depth is proportional to the square root of the resistivity). These thick high resistivity CCDs have been developed for detection of soft x-rays with space satellites and can be procured from E2V and MIT/LL. [Pg.141]

An example of the QE that can be obtained with the high resistivity n-channel devices combined with the Lesser backside process is shown in Fig. 11. [Pg.141]

Figure 15. Photovoltaic detector potential well. The example in this figure is the p-n junction of a n-channel CCD. The x-y-z axes match the orientation shown in Fig. 5. The charge generated in the 3-D volume of a pixel is swept toward a 2-D layer, which is the buried channel that is 0.25-0.5 pm from the front surface of the detector. The z-direction potential is created by the p-n junction combined with the voltages on the polysilicon wires deposited on the frontside of the CCD (not shown in this figure). Figure 15. Photovoltaic detector potential well. The example in this figure is the p-n junction of a n-channel CCD. The x-y-z axes match the orientation shown in Fig. 5. The charge generated in the 3-D volume of a pixel is swept toward a 2-D layer, which is the buried channel that is 0.25-0.5 pm from the front surface of the detector. The z-direction potential is created by the p-n junction combined with the voltages on the polysilicon wires deposited on the frontside of the CCD (not shown in this figure).
In many practical problems, interactions between the variables appear so that the absolute global optimum can be found heavily. As an example, wavelength selection in NIR determination of blood glucose (see Sect. 6.2.6) is considered. The aim of the selection is to find such combinations of wavelengths with which calibration models are obtained their prediction quality is as near at the global optimum as possible (Danzer et al. [2001], p 174). The number of combinations C for the selection of k wavelengths from n channels of the spectrometer is given by... [Pg.145]

One of the more important applications of ion implantation is well engineering at relatively high ion energies. For the protection of dynamic random access memories from soft errors, different structures have been proposed and employed. The conventional procedure is to use epitaxial wafers well engineering beneath the active p- and n-channels provides a less expensive alternative. [Pg.385]

Blog Entry 3 A more simple solution to implement is to use the 3478 Low-side N-channel controller in a SEPIC configuration. This application utilizes two inductors (instead of a Flyback transformer) to attain the Buck-Boost function. The 3478 requires an external user-selectable Fet switch, so you can choose the one that suits your load current requirement. The datasheet provides an application rationale for SEPIC configuration on page 19, Figure 13. The output voltage can be set to 12V by changing the value of the feedback resistor. [Pg.281]

Au-gate n-channel depletion FET p-Si-Si02 (63 nm)-Si3N4 (30nm)-Au thiolated 15- or 25-mer ssDNA 1M NaCl pH 7.4 15-mer cDNA 25-mer cDNA AVn AVfb- lOmV 3 mV 1000 s Ag wire [13]... [Pg.214]

Next, we fabricated TFTs whose ULD, channel Si, and gate dielectric were all solution-processed. The fabricated TFTs (TFT-4, 5, and 6) have similar solution-processed 50-nm-thick silicon films,1011 the details of which are described in Section 5.4. In addition, TFT-4 (n-channel) and TFT-5 (p-channel) have the SP-Si02 as both ULD and gate dielectric, which are fabricated using... [Pg.146]

Figure 10.12. Device characteristics of PbSe nanocrystal FETs activated with hydrazine. (a) Plots of 7d and 7 2 versus VG at constant VDS = 40 V for an n-channel FET assembled from 8.1-nm PbSe nanocrystals. L = 8 xm, W = 2300 tm. (b) ID versus VG plot at constant VDS = IV for an ambipolar FET assembled from 8.1-nm PbSe nanocrystals. L = 8 xm, W = 2300 xm. (c) Plots of 7D and 7 2 versus VG at constant Fps = -40V for a p-channel FET assembled from 8.2-nm PbSe nanocrystals. L = 10 tm, W = 3000 xm. (d) Plot of 7D versus FDS, as a function of VG for a p-channel FET assembled from 8.4-nm PbSe nanocrystals. L = 8 xm, W = 2300 xm. The changes in the transistor polarity were induced by controllable adsorption/desorption of hydrazine molecules from the nanocrystal surface. Reproduced from Ref.68, Copyright 2005, with permission from the AAAS. Figure 10.12. Device characteristics of PbSe nanocrystal FETs activated with hydrazine. (a) Plots of 7d and 7 2 versus VG at constant VDS = 40 V for an n-channel FET assembled from 8.1-nm PbSe nanocrystals. L = 8 xm, W = 2300 tm. (b) ID versus VG plot at constant VDS = IV for an ambipolar FET assembled from 8.1-nm PbSe nanocrystals. L = 8 xm, W = 2300 xm. (c) Plots of 7D and 7 2 versus VG at constant Fps = -40V for a p-channel FET assembled from 8.2-nm PbSe nanocrystals. L = 10 tm, W = 3000 xm. (d) Plot of 7D versus FDS, as a function of VG for a p-channel FET assembled from 8.4-nm PbSe nanocrystals. L = 8 xm, W = 2300 xm. The changes in the transistor polarity were induced by controllable adsorption/desorption of hydrazine molecules from the nanocrystal surface. Reproduced from Ref.68, Copyright 2005, with permission from the AAAS.
As an example of the latter technique, Volkman et al. demonstrated the feasibility of using spin-cast zinc oxide nanoparticles encapsulated in 1-dodecanethiol to fabricate a functional transistor.44 The zinc oxide was deposited on a thermally grown silicon dioxide layer on a conventional silicon wafer, with thermally evaporated gold source and drain electrodes. As reported, the process requires very small particles (3nm or less) and a 400 °C forming gas anneal. A similar approach was also reported by Petrat, demonstrating n-channel thin-film transistor operation using a nanoparticle solution of zinc oxide dispersed onto a thermally grown silicon dioxide layer on a conventional... [Pg.383]

The effect of a-Si H TFT threshold voltage variation on pixel electrode stability can be somewhat reduced by introducing an additional n-channel a-Si H TFT into the 2-a-Si H TFT pixel electrode circuit. Several such possible 3-TFTs pixel circuits are discussed below. [Pg.588]

Figure 4. Cross-sectional view of a n-channel MOSFET. Figure 4. Cross-sectional view of a n-channel MOSFET.
Sparteine is an alkaloid that inhibits N+ channels and Na+ ion flux and ach-vating a muscarinergic acetylcholine receptor. In small doses this alkaloid acts as... [Pg.184]

Ling MM, Erk P, Gomez M, Koenemann M, Locklin J, Bao ZN (2007) Air-stable n-channel organic semiconductors based on perylene diimide derivatives without strong electron withdrawing groups. Adv Mater 19 1123... [Pg.235]

Jones BA, Facchetti A, Wasielewski MR, Marks TJ (2008) Effects of arylene diimide thin film growth on n-channel OFET performance. Adv Funct Mater 18 1329-1339... [Pg.235]


See other pages where N-channel is mentioned: [Pg.2892]    [Pg.1070]    [Pg.173]    [Pg.461]    [Pg.249]    [Pg.272]    [Pg.141]    [Pg.141]    [Pg.142]    [Pg.144]    [Pg.145]    [Pg.150]    [Pg.52]    [Pg.491]    [Pg.136]    [Pg.214]    [Pg.214]    [Pg.75]    [Pg.85]    [Pg.88]    [Pg.137]    [Pg.147]    [Pg.326]    [Pg.428]    [Pg.431]    [Pg.435]    [Pg.263]    [Pg.156]    [Pg.169]    [Pg.177]   
See also in sourсe #XX -- [ Pg.166 ]

See also in sourсe #XX -- [ Pg.260 , Pg.262 , Pg.269 ]




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Channel N-type

N and P/Q-type calcium channels

N-Type Calcium Channel Blockers

N-channel FET

N-channel materials

N-channel metal oxide semiconductor

N-channel mosfet

N-channel organic semiconductors

N-type calcium channels

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