Modes electron microscopes

As noted earlier, most electron diffraction studies are perfonned in a mode of operation of a transmission electron microscope. The electrons are emitted themiionically from a hot cathode and accelerated by the electric field of a conventional electron gun. Because of the very strong interactions between electrons and matter, significant diffracted intensities can also be observed from the molecules of a gas. Again, the source of electrons is a conventional electron gun. 

A scanning electron microscope can also be equipped with additional instmmentation for electron-excited x-ray analysis (9). In many systems, this is performed in the mode known as energy dispersive x-ray analysis (edx). Other common acronyms for this method are eds for energy dispersive spectroscopy or edax for energy dispersive analysis of x-rays. 

Electron Beam Techniques. One of the most powerful tools in VLSI technology is the scanning electron microscope (sem) (see Microscopy). A sem is typically used in three modes secondary electron detection, back-scattered electron detection, and x-ray fluorescence (xrf). AH three techniques can be used for nondestmctive analysis of a VLSI wafer, where the sample does not have to be destroyed for sample preparation or by analysis, if the sem is equipped to accept large wafer-sized samples and the electron beam is used at low (ca 1 keV) energy to preserve the functional integrity of the circuitry. Samples that do not diffuse the charge produced by the electron beam, such as insulators, require special sample preparation. 

The electron microscope is also used in the darkfield mode, in which it improves contrast between different chemical phases or different orientations of a given soHd phase. 

The major STEM analysis modes are the imaging, diffraction, and microanalysis modes described above. Indeed, this instrument may be considered a miniature analytical chemistry laboratory inside an electron microscope. Specimens of unknown crystal structure and composition usually require a combination of two or more analysis modes for complete identification. 

As an indication of the changes in deformation modes that can be produced in ionomers by increase of ion content, consider poly(styrene-co-sodium methacrylate). In ionomers of low ion content, the only observed deformation mode in strained thin films cast from tetra hydrofuran (THF), a nonpolar solvent, is localized crazing. But for ion contents near to or above the critical value of about 6 mol%, both crazing and shear deformation bands have been observed. This is demonstrated in the transmission electron microscope (TEM) scan of Fig. 3 for an ionomer of 8.2 mol% ion content. Somewhat similar deformation patterns have also been observed in a Na-SPS ionomer having an ion content of 7.5 mol%. Clearly, in both of these ionomers, the presence of a... 

Figure 4.14. Schematic set up of an electron microscope in the transmission (TEM) and the scanning (SEM) mode. The SEM instrument also contains an X-ray detector for composition analysis.

The surface analysis for morphology and average particle size was carried out with JEOL JSM 6301 F scanning electron microscope (SEM). The micrographs of the samples were observed at different magnifications under different detection modes (secondary or back-scattered electrons). 

Figure 7.3 Schematic set-up of an electron microscope in the trans-mission (TEM), scan-ning (SEM), and com-bined (STEM) mode (figure after Sanders f 101).

The scanning transmission electron microscope (STEM) combines the two modes of operation. Here, the scanning coils are used to illuminate a small area of... 

Characterization techniques continue to develop and will impact their application to zeolitic systems. Aberration corrected electron microscopes are now being used to improve our understanding of catalysts and other nano-materials and will do the same for zeolites. For example, individual Pt atoms dispersed on a catalyst support are now able to be imaged in the STEM mode [252]. The application of this technique for imaging the location of rare-earth or other high atomic number cations in a zeolite would be expected to follow. Combining this with tomography... 

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