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Measurement SI

However, other data such as the small difference observed in the Si NMR chemical shift (0.9 ppm upheld from TgPhg) and the absence of any measurable Si-F coupling show that the interaction between the huoride ion and the silicon atoms is small. Studies to evaluate the collision cross section of TgPhg using Na show that the cation attaches itself to the outside of the POSS cage and does not significantly distort the structure. [Pg.33]

Fig.4.7. Simulated and measured temperature distribution in the heated area of a microhotplate without Si-island. Ti to Ti denote the temperature sensor measurements. Si to S4 the simulated temperatures at the respective locations... Fig.4.7. Simulated and measured temperature distribution in the heated area of a microhotplate without Si-island. Ti to Ti denote the temperature sensor measurements. Si to S4 the simulated temperatures at the respective locations...
The signal is captured by the observed difference —X2- Earlier, in Section 1.7.2, we had said that the noise would be made up of two components, the sample size and the patient-to-patient variation. In fact it is the standard error of the difference between the two means that provides our measure of noise. For discussion purposes consider the formula for this standard error in the special case of equal group sizes (uj = U2 = n) se = +sl/n, where Si and S2 are the separate standard deviations within each of the treatment groups. Note that the formula contains both the sample size and also the measures, Si and 2, of patient-to-patient variation. An increase in the sample size will reduce the noise as will a reduction in the patient-to-patient variation and vice versa. [Pg.53]

NCRP (1985). National Council on Radiation Protection and Measurements. SI Units in Radiation Protection and Measurements, NCRP Report No. 82 (National ( undl on Radiation Protection and Measurements, Bethesda, Maryland). [Pg.149]

Santoprene extracts contained higher concentrations of inorganic carbon and little, if any, extractable silicon. On the other hand, the amount of silicone in extracts of silicone polymers was very high. From Table 37, it is possible to see that these materials, though all made of silicone, are very different each other. While about lOOpg/g Si was found in the aqueous extract from sample 1, no measurable Si was detected in the same extracts from samples 2 and 6. As could be expected, silicone extract-ables were much higher in ethanolic extracts, being that 739 pg/g Si from sample 6 was the lowest amount leached. [Pg.518]

TABLE 15. Measured Si—H bond dissociation energies for silanes (kJ mol 1) and derived enthalpies of associated radicals (A// /k.l mol 1)... [Pg.167]

Fig. 3. (a) Schematic of the thin film target for the d/xt formation measurements consisting of the emission, the moderation and the reaction layers, which are prepared by rapidly freezing hydrogen isotopes on the gold foils (not shown) held in vacuum at 3.5 K. [13] The layer thickness (3.43 mg-cm-2, 96 pg-cm-2, and 21 pg-cm-2, respectively) were measured off-line via a particle energy loss (see Fig. 5) (b) Measured Si energy spectra with prompt (I t > 0.02 ps) and delayed (II t > 1.5 ps) time cuts. Fusion in DS reaction layer is separated from that in US D2 due to the pf TOF across the vacuum... [Pg.439]

Aliquots of the clear liquid phase above the sediment were used to measure Si and A1 concentrations by atomic absorption spectrometry (Perkin-Elmer atomic absorption spectrometer, model 3030B) and for the determination of the degree of Si polycondensation in the liquid phase by molybdate method (20). [Pg.125]

Making and recording measurements SI units and, their use Scientific method and design of experiments ... [Pg.63]

Mesoporous silicate molecular sieves were characterized by an arsenal of techniques including XRD, SEM, TEM, adsorption measurements, Si NMR, IR, Raman and XANES. XRD patterns of all nanoporous phases are dominated by low angle peaks. Figure 11 shows typical patterns for MCM-41, MCM-48, MCM-50 and SBA-2 phases. HMS, MSU-n and some "MCM-41" exhibit only the 100 peak either because of too small scattering domain sizes [69] or because of poorly ordered pore system [55,72,80]. [Pg.12]

The main result of extensive simulations of A1 placement in the FAU-framework topology is that random insertion of A1 into the structure, subject to Loewenstein s rule and to a weaker second neighbor Al-Al repulsion term, does not reproduce the measured Si-nAl distribution patterns [4]. The details of the aluminum distributions are therefore determined by additional or different factors. This is consistent with Melchior s model of FAU-framework construction from pre-formed 6-iing units [47,48], The simulation results also highlight the likely limitations of quantum mechanical studies of aluminum T-site preferences. If the factors controlling the aluminum distributions in zeolites X and Y are also at work in other systems, purely energetic arguments will likely have limited direct relevance for application to real materials. [Pg.241]

From the ash samples, cross-sections were prepared and analysed by SEM. In the analysis, particle sizes and their chemical con osition were deteimined. In the analysis of chemical composition, the following elements were measured Si, Al, Fe, Ca, Mg, K, Na, Ti, P, S, Cl, (Mn), The summary results of this SEM analysis are shown in Figure 4. The con osition measured for particles was conpared with the chemical composition of ash of the feedstock straw (also indicated in Figure 4). According to the results, the most abundant substance in bottom ash was silicon, the amount of which was locally much higher than that of straw ash. The potassium content was quite equal from particle to particle. [Pg.132]

By international agreement, SI emits are used for scientific measurements. SI Units stands for Systems International d Unites. SI units predominate on the MCAT. [Pg.10]

Figure 6.7 Elcctro tuiic classifier. Devices of this type cun he used io generate nearly inonodisperse aerosols in the ultnitinc range or lo measure si/c distributions by suitably scanning the applied potential. The dotted line near the central n>d is the trajecioty of a particle that is withdrawn as pniduct. (After Pui and Liu. 1988.)... Figure 6.7 Elcctro tuiic classifier. Devices of this type cun he used io generate nearly inonodisperse aerosols in the ultnitinc range or lo measure si/c distributions by suitably scanning the applied potential. The dotted line near the central n>d is the trajecioty of a particle that is withdrawn as pniduct. (After Pui and Liu. 1988.)...

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See also in sourсe #XX -- [ Pg.17 ]




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