Measurement methods transmission electron microscopy

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

One problem with methods that produce polycrystalline or nanocrystalline material is that it is not feasible to characterize electrically dopants in such materials by the traditional four-point-probe contacts needed for Hall measurements. Other characterization methods such as optical absorption, photoluminescence (PL), Raman, X-ray and electron diffraction, X-ray rocking-curve widths to assess crystalline quality, secondary ion mass spectrometry (SIMS), scanning or transmission electron microscopy (SEM and TEM), cathodolumi-nescence (CL), and wet-chemical etching provide valuable information, but do not directly yield carrier concentrations. 

In this section, we describe time-resolved, local in-situ measurements of chemical potentials /, ( , f) with solid galvanic cells. It seems as if the possibilities of this method have not yet been fully exploited. We note that the spatial resolution of the determination of composition is by far better than that of the chemical potential. The high spatial resolution is achieved by electron microbeam analysis, analytical transmission electron microscopy, and tunneling electron microscopy. Little progress, however, has been made in improving the spatial resolution of the determination of chemical potentials. The conventional application of solid galvanic cells in kinetics is completely analogous to the time-dependent (partial) pressure determination as explained in Section 16.2.2. Spatially resolved measurements are not possible in this way. 

Microscopy is often referred to as an absolute method for the determination of size and size distribution of small particles because it allows direct visualization and measurements of individual particles. Three commonly used types are optical microscopy, transmission electron microscopy (TEM), and scanning electron microscopy (SEM). 

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