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Transmission electron microscopy method

The structure and the formation of films of a zirconia-based solid electrolyte, which were prepared by ion plasma sputtering, were studied using scanning and transmission electron microscopy methods. [Pg.567]

Nanocrystalline metal (silver and copper) and metal sulfide (silver sulfide, cadmium sulfide, and lead sulfide) particles were prepared via RESOLV (Rapid Expansion of a Supercritical Solution into a Liquid SOLVent) with water-in-carbon dioxide microemulsion as solvent for the rapid expansion. The nanoparticles were characterized using UV/vis absorption. X-ray powder diffraction, and transmission electron microscopy methods. The results of the different nanoparticles are compared and discussed in reference to those of the same nanoparticles produced via RESOLV with the use of conventional supercritical solvents. [Pg.309]

International Organization for Standardization (1999) Ambient Air - Determination of Asbestos Fibers - Indirect Transfer Transmission Electron Microscopy Method. ISO 13794 1999(E). [Pg.158]

Although scanning and transmission electron microscopy methods have many similarities, scanning... [Pg.312]

Transmission electron microscopy (tern) is used to analyze the stmcture of crystals, such as distinguishing between amorphous siUcon dioxide and crystalline quartz. The technique is based on the phenomenon that crystalline materials are ordered arrays that scatter waves coherently. A crystalline material diffracts a beam in such a way that discrete spots can be detected on a photographic plate, whereas an amorphous substrate produces diffuse rings. Tern is also used in an imaging mode to produce images of substrate grain stmctures. Tern requires samples that are very thin (10—50 nm) sections, and is a destmctive as well as time-consuming method of analysis. [Pg.356]

Speciman Preparation for Transmission Electron Microscopy of Materials (J. C. Brauman, R. M. Anderson, and M. L. McDonald, eds.) MRS Symp. Proc vol. 115, Materials Research Society, Pittsburg, 1988. This conference proceedings contains many up-to-date methods as well as references to books on various aspects of specimen preparation. [Pg.174]

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. [Pg.354]

Recent demands for polymeric materials request them to be multifunctional and high performance. Therefore, the research and development of composite materials have become more important because single-polymeric materials can never satisfy such requests. Especially, nanocomposite materials where nanoscale fillers are incorporated with polymeric materials draw much more attention, which accelerates the development of evaluation techniques that have nanometer-scale resolution." To date, transmission electron microscopy (TEM) has been widely used for this purpose, while the technique never catches mechanical information of such materials in general. The realization of much-higher-performance materials requires the evaluation technique that enables us to investigate morphological and mechanical properties at the same time. AFM must be an appropriate candidate because it has almost comparable resolution with TEM. Furthermore, mechanical properties can be readily obtained by AFM due to the fact that the sharp probe tip attached to soft cantilever directly touches the surface of materials in question. Therefore, many of polymer researchers have started to use this novel technique." In this section, we introduce the results using the method described in Section 21.3.3 on CB-reinforced NR. [Pg.597]

Ag-core/Au-shell bimetallic nanoparticles were prepared by NaBH4 reduction method [124]. UV-Vis spectra were recorded and compared with various ratios of AuAg alloy nanoparticles. The UV-Vis spectra of bimetallic nanoparticles suggested the formation of core/shell structure. Furthermore, the high-resolution transmission electron microscopy (HRTEM) image of the nanoparticles confirmed the core/shell type configuration directly. [Pg.54]


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See also in sourсe #XX -- [ Pg.264 ]

See also in sourсe #XX -- [ Pg.62 , Pg.64 , Pg.74 , Pg.78 ]




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Cross-sectional transmission electron microscopy methods

Electron Methods

Electron microscopy methods

Measurement methods transmission electron microscopy

Microscopy method

Transmission electron microscopy

Transmission electron microscopy specimen preparation method

Transmission electronic microscopy

Transmission methods

Transmission microscopy

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