Techniques for Materials Characterization

Ultrasonic Tomographic Non-Destructive Techniques for Materials Characterization. 

SIMS is one of the most powerful surface and microanalytical techniques for materials characterization. It is primarily used in the analysis of semiconductors, as well as for metallurgical, and geological materials. The advent of a growing number of standards for SIMS has gready enhanced the quantitative accuracy and reliability of the technique in these areas. Future development is expected in the area of small spot analysis, implementation of post-sputtering ionization to SIMS (see the articles on SALI and SNMS), and newer areas of application, such as ceramics, polymers, and biological and pharmaceutical materials. 

ICP-OES is one of the most successful multielement analysis techniques for materials characterization. While precision and interference effects are generally best when solutions are analyzed, a number of techniques allow the direct analysis of solids. The strengths of ICP-OES include speed, relatively small interference effects, low detection limits, and applicability to a wide variety of materials. Improvements are expected in sample-introduction techniques, spectrometers that detect simultaneously the entire ultraviolet—visible spectrum with high resolution, and in the development of intelligent instruments to further improve analysis reliability. ICPMS vigorously competes with ICP-OES, particularly when low detection limits are required. 

Guided-Wave-Tube Technique for Materials Characterization... 

This table lists some abbreviations, acronyms, and symbols encountered in the physical sciences. Most entries in italic type are symbols for physical quantities for more details on these, see the table Symbols and Terminology for Physical and Chemical Quantities in this section. Additional information on units may be found in the table International System of Units (SI) in Section 1. Many of the terms to which these abbreviations refer are included in the tables Definitions of Scientific Terms in Section 2 and Techniques for Materials Characterization in Section 12. Useful references for further information are given below. 

Appearance potential spectroscopy (APS) - See Techniques for Materials Characterization, page 12-1. 

---