Mattauch-Herzog mass spectrometer

A high vacuum laser ion source is combined with a dynamic (ToF-MS) or static mass spectrometer (Mattauch-Herzog instrument) for the separation of the ion beams formed and used in LIMS for multi-element major, minor and trace analysis of compact solid samples (bulk analysis).74... 

SSMS - spark source mass spectrometer Mattauch-Herzog geometry ( / 10000). 

Mattauch-Herzog geometry. An arrangement for a double-focusing mass spectrometer in which a deflection of n/A radians in a radial electrostatic field is followed by a magnetic deflection of nil radians. 

Figure 1 Schematic diagram of a Mattauch-Herzog geometry spark source mass spectrometer using an ion-sensitive plate detector.

Reduction of the measurement time for element distributions is possible by simultaneous detection of several masses. This can be achieved only by use of a magnetic sector field spectrometer with Mattauch-Herzog geometry [3.49] (Fig. 3.20) and parallel detection of up to five masses by mechanically adjusted electron multipliers. 

Mattauch-Herzog type mass spectrometer has double-focusing properties for ions of all masses... 

Double-focusing mass spectrometers with Mattauch-Herzog geometry and high mass resolution have been used for a long time, especially in nuclear physics, for the precise determination of exact... 

A mass spectrometer with Mattauch-Herzog geometry was also selected by Nier for space research due to its ability to meet the strict requirements imposed by rockets and satellites without seriously compromising performance and versatility.14... 

Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)...

Figure 16.5—Magnetic analyser mass spectrometer, a) Nier Johnson system, b) directional focusing properties of the magnetic field, c) principle of a double focusing mass spectrometer d) Mattauch-Herzog system.

Instrumentation. The instrument used in this investigation was a commercial Mattauch-Herzog mass spectrometer equipped with photographic and electrical detection systems and an RF spark source. The resolution of the instrument was 1 part in 5,000. All trace elements were determined from mass spectra recorded on Ilford Q-2 photographic... 

In parallel with the development of the EOID for focal plane mass spectrometers of the Mattauch-Herzog type, similar devices were developed for use with conventional sector-type mass spectrometers (15, 16, 17, 18). A schematic representative of this type detector, versus that implemented on a CEC type 21-490 single focusing mass spectrometer, is shown in Fig. 8. The main differences between these two applications of the EOID are a result of the differences in the ion optics of the two types of mass analyzers, as shown in Fig. 1. First, the detector of a sector type instrument resides outside the magnetic fringe field, thus eliminating the need for angling the primary ion sensors. 

At present, EOID s have been implemented on several experimental mass spectrometers beyond the ones described above (1) a miniaturized (4.5" focal plane) Mattauch-Herzog type mass spectrometer with a mass range of 25-500 and resolution 1/500, which has been built (Perkin-Elmer Corp., Pomona, California) for JPL as a prototype for future space and/or clinical applications and (2) an ultra-miniature (2" focal plane) Mattauch-Herzog type mass spectrometer for outer-space use. Additional uses of the EOID are presently in the planning and/or design stages. 

In 1967 Liebl reported the development of the first imaging SIMS instrument based on the principle of focused ion beam scanning [24]. This instrument, the ion microprobe mass analyzer, was produced by Applied Research Laboratories (Fig. 4.5). It used an improved hollow cathode duoplasmatron [25] ion source that eliminated filaments used in earlier sources and allowed stable operation with reactive gases. The primary ion beam was mass analyzed for beam purity and focused in a two-lens column to a spot as small as 2 pm. The secondary ions were accelerated from the sample surface into a double focusing mass spectrometer of Mattauch-Herzog geometry. Both positive and negative secondary ions were de-... 

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