Mattauch-Herzog geometry double-focusing mass spectrometers with

Double-focusing mass spectrometers with Mattauch-Herzog geometry and high mass resolution have been used for a long time, especially in nuclear physics, for the precise determination of exact... 

In a double-focusing mass spectrometer with an in house built Mattauch - Herzog geometry with ICP or glow discharge ion source, Hieftje et applied an interesting ion detection system... 

In 1967 Liebl reported the development of the first imaging SIMS instrument based on the principle of focused ion beam scanning [24]. This instrument, the ion microprobe mass analyzer, was produced by Applied Research Laboratories (Fig. 4.5). It used an improved hollow cathode duoplasmatron [25] ion source that eliminated filaments used in earlier sources and allowed stable operation with reactive gases. The primary ion beam was mass analyzed for beam purity and focused in a two-lens column to a spot as small as 2 pm. The secondary ions were accelerated from the sample surface into a double focusing mass spectrometer of Mattauch-Herzog geometry. Both positive and negative secondary ions were de-... 

Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)...

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