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Mattauch-Herzog geometry, mass spectrometer

Mattauch-Herzog geometry. An arrangement for a double-focusing mass spectrometer in which a deflection of n/A radians in a radial electrostatic field is followed by a magnetic deflection of nil radians. [Pg.430]

Figure 1 Schematic diagram of a Mattauch-Herzog geometry spark source mass spectrometer using an ion-sensitive plate detector. Figure 1 Schematic diagram of a Mattauch-Herzog geometry spark source mass spectrometer using an ion-sensitive plate detector.
Reduction of the measurement time for element distributions is possible by simultaneous detection of several masses. This can be achieved only by use of a magnetic sector field spectrometer with Mattauch-Herzog geometry [3.49] (Fig. 3.20) and parallel detection of up to five masses by mechanically adjusted electron multipliers. [Pg.117]

Double-focusing mass spectrometers with Mattauch-Herzog geometry and high mass resolution have been used for a long time, especially in nuclear physics, for the precise determination of exact... [Pg.86]

A mass spectrometer with Mattauch-Herzog geometry was also selected by Nier for space research due to its ability to meet the strict requirements imposed by rockets and satellites without seriously compromising performance and versatility.14... [Pg.87]

Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)... Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)...
SSMS - spark source mass spectrometer Mattauch-Herzog geometry ( / 10000). [Pg.266]

In 1967 Liebl reported the development of the first imaging SIMS instrument based on the principle of focused ion beam scanning [24]. This instrument, the ion microprobe mass analyzer, was produced by Applied Research Laboratories (Fig. 4.5). It used an improved hollow cathode duoplasmatron [25] ion source that eliminated filaments used in earlier sources and allowed stable operation with reactive gases. The primary ion beam was mass analyzed for beam purity and focused in a two-lens column to a spot as small as 2 pm. The secondary ions were accelerated from the sample surface into a double focusing mass spectrometer of Mattauch-Herzog geometry. Both positive and negative secondary ions were de-... [Pg.161]

In a double-focusing mass spectrometer with an in house built Mattauch - Herzog geometry with ICP or glow discharge ion source, Hieftje et applied an interesting ion detection system... [Pg.113]

To acquire a mass spectrum, a common practice is to scan the magnetic field while keeping V constant. Alternatively, all ions can be collected simultaneously in the same plane by keeping B fixed, as is the usual practice in Mattauch-Herzog geometry double-focusing mass spectrometers. The third, not so common option is to keep B constant and vary the value of V. [Pg.72]


See other pages where Mattauch-Herzog geometry, mass spectrometer is mentioned: [Pg.103]    [Pg.16]    [Pg.19]    [Pg.45]    [Pg.48]    [Pg.84]    [Pg.108]    [Pg.113]    [Pg.138]    [Pg.153]    [Pg.154]    [Pg.261]    [Pg.265]    [Pg.269]    [Pg.275]    [Pg.294]    [Pg.16]    [Pg.19]    [Pg.45]    [Pg.48]    [Pg.84]    [Pg.108]    [Pg.153]    [Pg.154]    [Pg.261]    [Pg.265]    [Pg.269]    [Pg.275]    [Pg.168]    [Pg.378]    [Pg.8]    [Pg.74]    [Pg.199]   
See also in sourсe #XX -- [ Pg.291 ]




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