JAPAN ELECTRONIC

HC1 hydrogen chloride JEOL Japan Electron Optics... 

Various ways of making full-color displays have been proposed. These are summarized in Figure 7.14. Perhaps the most obvious method is simply to fabricate red, green, and blue subpixels side by side on the same substrate (Figure 7.14a). Many companies have adopted this approach, e.g., Pioneer demonstrated a full-color QVGA (320 x 240 pixels) display at the Japan Electronics Show in 1998. Figure 7.15 is an example of a full-color display patterned using a side-by-side approach. 

II III were not published at the time of writing this Section 25) Anon, "Computers Analytical Role Extended , C EN, March 18, 1968, pp 44, 48, 52 54 [At the exhibit of the "1968 Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy , held in Cleveland, Ohio (See C EN, March 11, 1968, plO) were shown the computers of DEC (Digital Equipment Corp) and of IBM (International Business Machine Corporation). The DEC exhibited "Gas Chrom-8 Computer system for gas chromatography and IBM-Model 1800 and 1130. There were also exhibited other systems, among them smaller inexpensive computers. There were also shown slides on results of work with computers done by S. Sasaki H. Abe of Japan s Tohoku University and by T. Kato of Japan Electron Optics Laboratory Co, Ltd 26) Jack Alster, Picatinny Arsenal private communication,... 

We are grateful to our various co-workers cited in the references for their effective collaboration. We are also indebted to Dr. L.-S. Luh for critical reading of the manuscript. We thank the Ministry of Education, Science, Sports and Culture of Japan, Shin-Etsu Chemical Co., Ltd., Dow Corning Toray Silicone Co., Ltd., Japan Electronic Metals Co., and Asai Germanium Research Institute for support. 

Scanning electron micrographs (SEM) were obtained using a JSM 5500 LV (Jeol, Japan) electron microscope. The observations were performed in a secondary electron (SE) and in a backscattering electron (BSE) mode at a low vacuum pressure of 12 kPa. 

Japan Electronics Almanac, Dempa Publications, Inc., Tokyo, 1986, p. 412. 

Eiji Osawa, Department of Knowledge-Based Information Engineering, Toyohashi University of Technology, Aichi 441, Japan (Electronic mail osawa cochem.tutkie.tut.ac.jp)... 

EM micrographs were obtained on a JEM 100 CX (Japan) electron microscope in the transmission mode for probe samples. 

The measurements of ESR spectra were made by use of Electron Spin Resonance Spectrometer Model JES-ME-3X made by Japan Electron Optics Laboratory Co. Ltd. with X band and magnetic field... 

JEOL Japan Electron Optics Laboratory Kz cashmere wool... 

This work was supported at Princeton University by the National Science Foundation, at Erlangen by the Fonds der Chemischen Industrie, and at both Princeton and Santa Cruz by the National Institutes of Health Research Resources. E.O. expresses gratitude to the Japan Electron Optics Co. for making the JAL-30XA program available. Computer time and computational facilities were made available by Princeton University, Hokkaido University, and the Kao Soap Co. 

Akioka, K., 1996, in Proc. Magnet-Seminar of Japan Electronic Materials Industry Association, February 21, Tokyo, pp. 3-14. In Japanese. 

Shiro Koseki, Department of Material Sciences, College of Integrated Arts and Sciences, Osaka Prefecture University, 1-1, Gakuen-cho, Sakai 599-8531, Japan. (Electronic Mail shiro ms.cias.osakafu-u.ac.jp)... 

Morphology of the membrane was investigated using scanning electron microscopy (SEM) of a model JSM-6400 lEOL (Japan Electron Optics Ltd., Japan). Samples were coated under vacuum with a thin layer (60% gold and 40% palladium) in a Hummer VII sputtering system (Anatech, Springfiled, VA). 

GC-MS. JEOl DX303 apparatus (Japan Electron Optic Laboratory) was used, the carrier gas being helium. The other GC conditions were the same as those just described, and an MS analysis of electron impact (El) at 70eV was conducted. 

Among the various lead-free solder alloys, the National Electronics Manufacturing Initiative (NEMI) recommends Sn-3.9Ag-0.6Cu ( 0.2%) for reflow soldering (Ref 1), while JEITA (Japan Electronics and Information Technology Industries Association) recommends Sn-3.0Ag-0.5Cu. Under most typical use conditions, Sn-Ag-Cu (SAC) alloy in general exhibits a greater resistance to creep as compared to Pb-Sn alloy and hence creeps 10 to 100 times slower (Ref 2). The microstructure, the plastic and creep behavior, and the failure mechanism in Sn-Ag-Cu solder are vastly different compared to Pb-Sn solder, and therefore, it is important to develop appropriate thermomechanical predictive models for Sn-Ag-Cu solder. 

JEITA Japan Electronics and Information Technology Industries Association XRF x-ray fluorescence... 

Japan Electron Optics Ltd, Jeolco House, Grove Park, Edgeware Rd., Colindale, London NW9.uk... 

EDN Asia EDN China EDN Europe EDN Japan Electronic Business Electronic News... 

Examples Japan Eco-Mark European Union Eco-Flower Sweden TCO Label Germany Blue Angel Japan Electronics Information Technology Assoc. (JEITA) has an eco-label for PCs Not gained much acceptance to date... 

While an increasing number of environmentally friendly products continue to be introduced in Japan and Europe, some North American companies have taken a wait and see approach while others are pacing themselves based on market demands and supply line availability to the lead-free issue. Many Japanese companies have adopted the use of lead-free solder and lead-free components. The use of green labels helps to promote lead-free product introduction using guidelines established by the Japan Electronics and Information Technology Industries Association (JEITA). 

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