Instruments electron microscopy

D. B. Williams andC. B. Carter, TransmissionElectronMicroscopy A Textbook for Materials Science , Plenum Press, 1996. An introductory text to the instrumentation, electron microscopy and techniques, including a volume on electron diffraction. 

A completely new method of determining siufaces arises from the enormous developments in electron microscopy. In contrast to the above-mentioned methods where the surfaces were calculated, molecular surfaces can be determined experimentally through new technologies such as electron cryomicroscopy [188]. Here, the molecular surface is limited by the resolution of the experimental instruments. Current methods can reach resolutions down to about 10 A, which allows the visualization of protein structures and secondary structure elements [189]. The advantage of this method is that it can be apphed to derive molecular structures of maaomolecules in the native state. 

Typically, no with specialized instruments (e.g., low-energy electron microscopy), 150 A... 

The STEM instrument itself can produce highly focused high-intensity beams down to 2 A if a field-emission source is used. Such an instrument provides a higher spatial resolution compositional analysis than any other widely used technique, but to capitalize on this requires very thin samples, as stated above. EELS and EDS are the two composition techniques usually found on a STEM, but CL, and even AES are sometimes incorporated. In addition simultaneous crystallographic information can be provided by diffraction, as in the TEM, but with 100 times better spatial resolution. The combination of diffraction techniques and analysis techniques in a TEM or STEM is termed Analytical Electron Microscopy, AEM. A well-equipped analytical TEM or STEM costs well over 1,000,000. 

Cathodoluminescence (CL), i.e., the emission of light as the result of electron-beam bombardment, was first reported in the middle of the nineteenth century in experiments in evacuated glass tubes. The tubes were found to emit light when an electron beam (cathode ray) struck the glass, and subsequendy this phenomenon led to the discovery of the electron. Currendy, cathodoluminescence is widely used in cathode-ray tube-based (CRT) instruments (e.g., oscilloscopes, television and computer terminals) and in electron microscope fluorescent screens. With the developments of electron microscopy techniques (see the articles on SEM, STEM and TEM) in the last several decades, CL microscopy and spectroscopy have emerged as powerfirl tools for the microcharacterization of the electronic propenies of luminescent materials, attaining spatial resolutions on the order of 1 pm and less. Major applications of CL analysis techniques include ... 

D. B. Williams. Practical Analytical Electron Microscopy in Materials Science. Philips Electronic Instruments, Mahwah, NJ, 1984. Concise textbook on CBED, EDS, and EELS with a pronounced how-to flavor. 

S. J. Pennycook. EMSA Bulletin. 19, 67, 1989. A summary of compositional imaging using a high-angle annular dark-field detector in a field emission STEM instrument published by the Electron Microscopy Society of America, Box EMSA Woods Hole, MA 02543. 

The techniques, instrumentation and underlying theory of optical microscopy for materials scientists have been well surveyed by Telle and Petzow (1992). One of the last published surveys including metallographic techniques of all kinds, optical and electronic microscopy and also techniques such as microhardness testing, was a fine book by Phillips (1971). 

Both heated stages [224] and ambient temperature gas environments [225,226] have been developed for use in electron microscopy and both are combined [227,228] in the controlled atmosphere instrument. Pressures of up to 30 kPa and temperatures up to 1500 K have been used in studies of a wide variety of solid—gas and catalytic reactions [ 229]. 

Analysis of individual catalyst particles less than IMm in size requires an analytical tool that focuses electrons to a small probe on the specimen. Analytical electron microscopy is usually performed with either a dedicated scanning transmission electron microscope (STEM) or a conventional transmission electron microscope (TEM) with a STEM attachment. These instruments produce 1 to 50nm diameter electron probes that can be scanned across a thin specimen to form an image or stopped on an image feature to perform an analysis. In most cases, an electron beam current of about 1 nanoampere is required to produce an analytical signal in a reasonable time. 

Williams, D. B. "Practical Analytical Electron Microscopy in Materials Science," Philips Electronic Instruments Electron Optics Publishing, Mahwah, N.J., 1984. 

Sorption mechanisms of Hg(II) by the nonliving biomass of Potamogeton natans was also elucidated using chemical and instrumental analyses including atomic absorption, electron microscopy, and x-ray energy dispersion analyses. The results showed a high maximum adsorption of Hg(II) (180 mg/g), which took place over the entire biomass surface. Nevertheless, there were spots on the surface where apparent multilayer sorption of Hg(II) occurred. The minimum concentration of Hg(II) in solution that can be removed appears to be about 4-5 mg/L.117... 

Rosen, D. Instruments for Optical Microscope Image Analysis, in ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY, Barer, R. and Cosslett, V.6., Ed., 1984, 9, 323-354, Academic Press, New York. 

Scanning Electron Microscopy images of powders used in this paper were taken using JEOL s JSM-6320F instrument at the Illinois Institute of Technology and at Drexel University, Philadelphia, PA, USA. 

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