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Instrument production

Fig. Vni-11. ESCA spectrum of A1 surface showing peaks for the metal, A1(0), and for surface oxidized aluminum, Al(III) (a) freshly abraided sample (b) sample after five days of ambient temperature air exposure showing increased A1(III)/A1(0) ratio due to surface oxidation. (From Instrument Products Division, E. I. du Pont de Nemours, Co., Inc.)... Fig. Vni-11. ESCA spectrum of A1 surface showing peaks for the metal, A1(0), and for surface oxidized aluminum, Al(III) (a) freshly abraided sample (b) sample after five days of ambient temperature air exposure showing increased A1(III)/A1(0) ratio due to surface oxidation. (From Instrument Products Division, E. I. du Pont de Nemours, Co., Inc.)...
Instrument Productivity. The number of samples that can be processed by one instrument in a given period of time is determined by the length of time each sample has to be read by the photodetector or other read-out device, or by the number of cuvets per unit time which pass the detector. For example. [Pg.179]

FIGURE 9.2 Monitor for spot curing. (Photo courtesy of EIT Instrument Products.)... [Pg.185]

E.L DuPont de Nemours Co, Inc, Instrument Products, 1500 South Shamrock Avenue, Monrovia, Calif 91016... [Pg.692]

E. I. Du Pont de Nemours Company, Inc., Instrument Products Division, Wilmington, DE 19898... [Pg.31]

The second activity is characterized by the revitalization of older instrumental methods such as gravitational and centrifugal sedimentation methods. Redesign, modernization with advanced electronics, and user-friendly, computer-aided analysis have extended the instrument product life cycle. A good example is disc centrifuge photosedimentometry (DCP), the subject of three chapters in this volume. [Pg.315]

The compaction properties of pharmaceutical formulations can be studied experimentally using a variety of techniques, ranging from instrumented production presses to compaction simulators, and methods of analysis. The results are usually plotted as porosity-axial stress functions, which is of interest to compare different materials. However, there are some drawbacks on this type of evaluation. As mentioned by Cunningham et al. [20], this approach is deficient once it considers only the average stress along the direction of compaction, ignoring radial stress transmission and friction. [Pg.1139]

Daily use with LIMS will definitely reduce labor time for these items. However, to obtain a workable LIMS system, large amounts of time has to be spent implementing the static data, also called template data, into the LIMS. A LIMS is bought without any static data, and even the smallest measurement imit has to be entered. It is possible to calculate the time spent on implementation, and the chosen vendor can definitely help using his experience. Implementation time depends, of course, on the number of instruments, products, laboratories, etc. that shall be implemented. [Pg.2166]

Commercial instruments are available for a variety of applications in aerosol instrumentation, production of materials from aerosols, contamination control, etc. (ISO/CD 15900 2006, Determination of Particles Size Distribution—Differential Electrical Mobility Analysis for Aerosol Particles). [Pg.2260]

Inductively coupled plasma atomic emission spectrometry (ICP-AES) was used for the determination of most major and trace elements. The samples are fused in a Claisse semi-automatic fusion device in Pt-Au crucibles with lithium metaborate (4). The fusion product is dissolved in diluted HNO and brought to volume. For trace elements determination the sample is decomposed by HF, HNOg and HCIO. Scandium serves as an internal standard and is added to all samples and solutions. The instrument (product of Jobin Yvon, France)is calibrated using multi-element synthetic standards. The aqueous solutions are nebulized and injected into the heart of a plasma fire ball. A computerized multi-channel vacuum spectrometer has been programmed for multi-element analysis. [Pg.94]

Thermal Analysis Instrument Product Brochure, Shimadzu Scientific Instrument, Inc., Columbia, MD, 1997. [Pg.262]

The silica-based supports are supplied by Bio-Rad Labs (Richmond, CA, U.S.A., under the trademark Bio-Glass) by Electro-Nucleonics, Inc. (Fairfield, NJ, U.S.A.) and Pierce Chem. Co. (Rockford, IL, U.S.A. under the name CPG (controlled-Pore Glass)) by Waters Associates (Milford, MA, U.S.A. under the name Porasil) by E. Merck (Darmstadt, G.F.R., under the names Fractosil or LiChrospher) by DuPont Instrument Products Div. (Wilmington, DE, U.S.A., under the name SE Series or Zorbax), or by Rhone Poulenc (France, under the name Spherosil). The modified silica-based supports are supplied by Electro-Nucleonics, Inc. (Fairfield, NJ, U.S.A.) or Pierce Chem. Comp. (Rockford, IL, U.S.A., under the trademark Glycophase-... [Pg.336]

DuPont de Nemours, Instrument Products Division, Quillen Building, Concord Plaza, Wilmington, Del. 19890, U. 3. A. [Pg.39]

R.A. Henry, Liquid Chromatography Technical Bulletin No. 73-1, DuPont, Instrument Product Division. [Pg.40]

The problem of reliable structural materials for use at low temperatures has recently become topical. Progress in space research, storage and transportation of liquefied gases, superconducting electrical machinery, and superconducting instrument production requires new structural materials serviceable at long exposures to extreme conditions of operation without deterioration of their physical and mechanical properties. Only some aspects of the development of cryogenic materials science in the USSR are mentioned in this paper, and these have been carried out at the Physico-Technical Institute of Low Temperatures of the Ukrainian Academy of Sciences in Kharkov. [Pg.38]

Assessments can help reduce the burden of documentation when an end user attempts to justify an instrument for use on safety applications. In the marketplace three basic levels of assessment have been done on instrumentation products with variation between assessment companies. [Pg.92]

Fortunately, several instrumentation manufacturers are providing detailed analysis of their products to determine a more accurate set of numbers useful for safety verification purposes. A Failure Modes Effects and Diagnostic Analysis (FMEDA) will provide specific failure rates for each failure mode of an instrumentation product. The percentage of failures that are safe versus dangerous is clear and relatively precise for each specific product. The diagnostic ability of the instrument is precisely measured. Overall, the numbers from such an analysis are indeed product specific and provide a much higher level of accuracy when compared to industry database numbers and experience based estimates. [Pg.121]

The most common measurement in safety instrumented system applications is pressure. Fortunately, the instrumentation products available for this application are quite mature and highly advanced. There are weU proven products available that are also lEC 61508 assessed available from more than one vendor. [Pg.135]

Until now, the technical progress in many fields of industry, especially in engineering industry, instrument production, was circiunfused namely by the use of constructional plastics. Such exploitation properties of polymers as durability, thermal stability, electroisolation, antifriction properties, optical transparency and others determine their usage instead of ferrous and nonferrous metals, alloys, wood, ceramics and glass [13]. 1 ton of polymers replace 5-6 tons of ferrous and nonferrous metals and 3-3.5... [Pg.115]

Yuangyai C, Nembhard HB. A multi-stage experiment design in a nano-enabled medical instrument production process, Working paper, 2008. [Pg.253]

In ion-trap and FT-ICR instruments, product ion scanning is achieved by the tandem-in-time route. Ions entering the trap at time 1 are subjected to a static field that selects for ions of one particular miz ratio. These ions are collided with a stream of neutral atoms, a surface, or with radiation (see above) at time 2, which activates them and causes fragmentation. The resulting product ions are then scanned with a steadily increasing rf, which (in the case of a QIT instrument) accelerates them toward a sequential mIz hit detector. [Pg.2881]


See other pages where Instrument production is mentioned: [Pg.758]    [Pg.354]    [Pg.304]    [Pg.166]    [Pg.3702]    [Pg.472]    [Pg.153]    [Pg.302]    [Pg.411]    [Pg.1404]    [Pg.643]    [Pg.12]    [Pg.704]    [Pg.94]    [Pg.82]    [Pg.249]    [Pg.525]    [Pg.3858]   
See also in sourсe #XX -- [ Pg.107 ]




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Light-scattering instrumentation product development

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