Imaging scanning electron microscopy

Otlier fonns of microscopy have been used to evaluate nanocrystals. Scanning electron microscopy (SEM), while having lower resolution tlian TEM, is able to image nanoparticles on bulk surfaces, for direct visualization of... 

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

In contrast to many other surface analytical techniques, like e. g. scanning electron microscopy, AFM does not require vacuum. Therefore, it can be operated under ambient conditions which enables direct observation of processes at solid-gas and solid-liquid interfaces. The latter can be accomplished by means of a liquid cell which is schematically shown in Fig. 5.6. The cell is formed by the sample at the bottom, a glass cover - holding the cantilever - at the top, and a silicone o-ring seal between. Studies with such a liquid cell can also be performed under potential control which opens up valuable opportunities for electrochemistry [5.11, 5.12]. Moreover, imaging under liquids opens up the possibility to protect sensitive surfaces by in-situ preparation and imaging under an inert fluid [5.13]. 

Fig. 2. (a) (b) Transmission electron microscopy (TEM) images of as-grown VGCFs (broken portion) with the PCNT core exposed field emission-type scanning electron microscopy (FE-SEM) image of (c) as-grown and (d) heat-treated VGCFs (broken portion) at 2800°C with PCNT (white line) exposed [20],... 

Figure 2.4 A scanning electron microscopy image of an AFM cantilever tip covered with a thin silver film.

Figure 3. Scanning electron microscopy images of gold electrodes coated by the nanostructured TMPP/C12 monolayer after the electrochemical platinum deposition. The deposition charge was 41 and 160Cm for the left and right images, respectively. (Reprinted from Ref [18], 2005, with permission from Wiley-VCH.)...

Figure 5.18 Scanning electron microscopy image of a microcantilever, electromachined into a stainless steel sheet by ultrashort voltage pulses (100 ns, 2 V, 1 MHz repetition rate) in 3 M HCI + 6 M HF. The tool electrode was a tiny loop of a 10 pm thick Pt wire. (Reproduced with permission from Ref. [80].)...

The experimental tools for this research were chronopotetiometry (galvanostatic cycling),25 atomic force microscopy (AFM),26,27 scanning electron microscopy (SEM), and X-ray diffraction (XRD).21,25 It should be mentioned that the AFM imaging was conducted in-situ under potential control and in a special homemade glove box filled with highly pure argon atmosphere. This system has been already described in detail in the literature.28... 

Scanning Electron Microscopy images of powders used in this paper were taken using JEOL s JSM-6320F instrument at the Illinois Institute of Technology and at Drexel University, Philadelphia, PA, USA. 

Figure 3. Images of a cross-section of carbon fibers after propylene pyrolysis. 3a Scanning Electron Microscopy of a piece of the carbon cloth. 3b optical microscopy (crossed polarizers with a wave retarding plate).

Fig. 14.14 Transmission electron microscopy images of ultra-microtomed halloysite G nanotubes before, longitudinal and, in the inset, perpendicular cross-section (A), and image afterCaC03 formation (B). Scanning electron microscopy images of halloysite G nanotubes before (C) and after (D) CaC03 formation.

Image Formation in Low-Voltage Scanning Electron Microscopy, L. Reimer (SPIE-Intemational Society for Optical Engineering)... 

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