Grained scanning electron microscopy images

Figure 14.27 Scanning electron microscopy Images ofthe ground surface of (a) an equiaxed (EQ) and (b) an elongated (EL) grained sialon, and cross-sections of (c) EQ and (d) EL From Ref [33].

Figure 16.15 Scanning electron microscopy images of polished and etched surfaces for (a) sintered reaction-bonded silicon nitride (SRBSN) from a fine silicon powder (b) SRBSN from a coarse Si powder (c) Sintered silicon nitride from a commercial fine-grained a-Si3N4 powder. All of the specimens were doped with...

Figure 3.31 Scanning electron microscopy images of porcelain-like stoneware, (a) Vitreous China ware from Sawankhalok, Thailand (15th century C.E.), showing primary platy mullite (Mu I), secondary needle-shaped mullite (Mu II), and a partially dissolved residual quartz grain (Qz)...

Figure 11.17 Scanning electron microscopy Image of a polished and plasma-etched surface of a textured silicon nitride sample with rodlike 3-Si3N4 grains aligned by a...

Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen).

Figure 4.12 Secondary electron image of a fracture surface along grain boundaries. (Reproduced with kind permission of Springer Science and Business Media from J.I. Goldstein et al, Scanning Electron Microscopy and X-ray Microanalysis, 2nd ed., Plenum Press, New York. 1992 Springer Science.)...

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