Field emission scanning electron microscopy , imaging

FIGURE 3.30 Field emission scanning electron microscopy image of the submicron porous structure of methane hydrate after 2 weeks of reaction at 60 bar, 265 K. (Reproduced from Staykova, D.K., Kuhs, J. Phys. Chem. B, 107, 10299 (2003). With permission from the American Chemical Society.)... 

Figure 1.6 Representative field emission scanning electron microscopy images of ZnO nanocolumns grown at 400°C on a Si (001) substrate, (a) Crown for 30min (b) Grown for 50 min [132],...

FIGURE 4.8 FE-SEM (field-emission scanning electron microscopy) images of Ar—SiO nanoparticles (a), Rp—(VM—SiOj),—Rp/Ai— Si02 nanocomposites (b), and Rp—(VM—SiOj),—Rp nanoparticles (c) in methanol solutions. 

Figure 4.2a shows a cross-sechonal transmission electron microscopy (XTEM) image of the fabricated mulhlayered Ge/Si02 nanolenses [8]. The Ge QDs had an average diameter and density of 70 5 nm and 4.5 x 10 cm, respectively. A top view field-emission scanning electron microscopy image is shown in Figure 4.2b. 

Figure 12.8 FESEM (field emission scanning electron microscopy) image of helical carbon...

Figure 14.10 (a) and (b) TEM and Cryo-FESEM (cryogenic field-emission scanning electron microscopy) images of PHOS-b-PEO nanoparticles, respectively. The inset in (a) shows a detailed view of the nanoparticle. Stepanek et al. [45]. Reproduced with permission of American Chemical Society. 

Figure 8.27 (a) Schematic side view and (b) field-emission-scanning electron microscopy image of a ZnO nanorod FET device. (Courtesy of G.-C. Yi. [2].)... 

FIGURE 1.2 Field emission scanning electron microscopy image of a membrane produced by laser interference lithography. (Data from S. Kuiper et al., Journal of Membrane Science, 150, 1-8, 1998.)... 

Image analysis has been used to characterize the pore structure of synthetic membrane materials. The Celgard films have also been characterized by scanning tunneling microscopy, atomic force microscopy, and field emission scanning electron microscopy. The pore size of the Celgard membranes can also be calculated from eq 5, once the MacMullin number and gurley values are known. 

Field emission scanning electron microscopy (FESEM) images of (a) patterned polyacrylic acid (PAA), (b) patterned jxrlystyrene (PS) on patterned 11-amino-l-imdecanethiol hydrochloride (MUAM) (-NH3+)/octadecanethiol (ODT) (-CF13) monolayers. (Reprinted with permission from Wiley.)... 

Field emission scanning electron microscopy (FESEM) images of directed assembly of polystyrene (PS)/polyacrylic acid (PAA) blends using alternative MUAM/octadecanethiol (ODT) patterns with various periodicities (a-d) 1333, (e-h) 1000, (i-1) 667, and (m-p) 333 nm. The solution concentrations were changed (a,e,i,m) 1, (b,f,j,n) 0.8, (c,g,k,o) 0.6, and (d,h,l,p) 0.4 wt%. Q stands for the critical solution concentration for each pattern periodicity. (Reprinted with permission from ACS.)... 

Figure 38.3 shows field emission scanning electron microscopy (FE-SEM) images of Ni/NiO nanoparticles prepared at different pressures and carrier gas flow rates. It was found that the particle size generally increased as the residence time increased. With an identical residence time, 40 Torr, there was a total carrier gas flow rate of 1 L/min, while at 80 Torr the total carrier gas flow rate was 2 L/min. However, particles formed in the latter case were bigger. Carrier gas flow rate also played a role in controlling particle size, as shown by the difference in particle size at the same pressure but with a different carrier gas flow rate. The effect of pressure played a more important role than the residence time (Fig. 38.3a, d). 

The apparatus which generated and accelerated the electron beams is named an electron gun. Thermal electron emission type electron guns are used for general SEM, but a SEM equipped field emission type electron gun is called EE-SEM (field-emission scanning electron microscopy), which can obtain the higher resolution images with lower applied voltage. 

Appropriate particle size analysis methods with very low shear stress (free settling with particle image velocity, field emission scanning electron microscopy, fluidized bed or vibrating sieve feeding with laser diffraction) have been tested for their reproducibility and minimal dispersion energy. 

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