Fourier transform infrared microscopy spectrometer

The apparatus used for IR microscopy is a Fourier-transform infrared (FTIR) spectrometer coupled on-line with an optical microscope. The microscope serves to observe the sample in white light at significant magnification for the purpose of determining its morphology, as well as to select the area for analysis. The spectrometer, on the other hand, enables study of the sample by transmission or reflection measurement for the purpose of determining the chemical composition. It also provides information about the microstructure and optical properties (orientation) of the sample. It is possible to apply polarised light both in the observation of the sample and in spectrometric measurements. 

The samples were characterized by means of X-ray diffraction (XRD) analysis, Fourier-transform infrared spectroscopy (FTIR), transmission electron microscopy (TEM), electron diffraction (ED), and Mossbauer spectroscopy. XRD analysis was carried out on a HZG-4A diffractometer by using Ni-filtered Co Ka radiation. IR-spectra were recorded on an AVATAR FTIR-330 spectrometer. TEM/ED examinations were performed with a LEO 906E and a JEOL 4000 EX transmission electron microscopes. The resonance spectra were recorded in air at 298 K and processed by using a commercial SM2201 MSssbauer spectrometer equipped with a 15 mCi Co (Rh) source. 

These categories include many individual high-cost systems such as nuclear magnetic resonance (NMR) spectrometers. X-ray equipment, and electron microscopy and spectroscopy setups. Sales of spectroscopic instruments that are growing include Fourier transform infrared (FTIR), Raman NMR, plasma emission and energy-dispersive X-ray spectrometers. 

A Nicolet Magna 550 Fourier Transform Infrared Spectrometer (FTIR) and a Bruker MW 250 MHz proton NMR were used to verify the chemical structure of all monomers and polymers. Optical activity of the compounds was measured at 25 on a Perkin-Elmer Polarimeter in chloroform. A Waters Gel Permeation Chromatograph with 440 UV absorption detector and R401 differential refructometer was used to determine the molecular weights of the polymers tetrahydrofuran was used as the mobile phase at 1.0 mL/min, and the Waters polystyrene gel columns were calibrated with monodisperse polystyrene standards. Polarizing optical microscopy was used to identify liquid crystalline phases using a Leitz optical microscope with a CCD camera attachment... 

Samples were characterized by using X-n diffiaction (XRD) on a Shimadzu XRD-6000 diffractometer (CuKa radiation), physical adsorption of nitrogen on a Quantachrome NOVA 1000, Fourier transform infrared (FTIR) spectroscopy on a Biorad spectrometer using the KBr method, Raman spectroscopy on a Bniker FRA I06/S FT-Raman spectrometer, and scarming electron microscopy (SEM) on a Joel JSM-S600LV. 

In many studies, particularly those related to materials and forensic science, it is frequently necessary to measure a mid-infrared spectrum from a trace amount of a sample or a sample of small size. In some circumstances, this may be accomplished by using a beam-condenser accessory within the conventional sample compartment of a Fourier-transform infrared (FT-IR) spectrometer. Perhaps today though, it is more convenient to use infrared microspectrometry (often commonly referred to as infrared microspectroscopy or even infrared microscopy). Based on an optical microscope (or infrared microscope) coupled to an FT-IR spectrometer, it is one of the most useful methods for structural analysis of such samples and can often be undertaken in a non-destructive manner [1, 2]. 

Physical and chemical characterization methods are essential to assess aspects such as material and processing quality. Raman microprobe is an analytical tool coupled to an optical microscope. Elemental analysis using the x-rays emitted from the specimens in the electronic microscopy techniques can be used for local composition determination or to obtain a map of the distribution of a certain element in a wider area wavelength and energy-dispersive x-ray spectrometers are used for these purposes. Fourier transform infrared spectrometer is widely used for the qualitative and quantitative analysis of adhesives, the identification of unknown chemical compounds, and the characterization of chemical reactions. Thermal methods such as thermomechanical analysis and differential scanning calorimetry are discussed as valuable tools for obtaining information during postfracture analysis of adhesively bonded joints. 

LSM, SEKZ and LSCF powders were characterized by XRD using a Shimadzu XDR-7000 diffractometer and scanning electron microscopy (SEM-SSX 550, Shimadzu). Infrared spectra were also recorded with FTIR (IR Prestige-21, Shimadzu) in the 400 - 4600 cm"i spectral range. Specific surface area measurements were performed only for the LSM powders. An infrared reflectance spectrum of a LSM pellet prepared from a powder calcined at 900 °C was recorded with a Fourier-transform spectrometer (Bomem DA 8-02) equipped with a fixed-angle specular reflectance accessory (external incidence angle of 11.5°). 

IR spectroscopy became widely used after the development of commercial spectrometers in the 1940s. Double-beam monochromator instruments were developed, better detectors were designed, and better dispersion elements, including gratings, were incorporated. These conventional spectrometer systems have been replaced by Fourier transform IR (FTIR) instrumentation. This chapter will focus on FTIR instrumentation and applications of IR spectroscopy. In addition, the related techniques of near-infrared (NIR) spectroscopy and Raman spectroscopy will be covered, as well as the use of IR and Raman microscopy. 

For Raman microscopy, the most common spectrometer system consists of a visible laser coupled to a polychromator and a CCD detector, although near-infrared Fourier transform spectrometers cffe also used. The CCD detector can be used in a variation of Raman microscopy known as Raman imaging a special optical filter allows only one Stokes fine to reach the two-dimensional detector, which then contains a map of the distribution of the intensity of that line in the illuminated area. 

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