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Field emission gun-scanning electron

Transmission electron microscopy (TEM) has traditionally been the mainstay of morphological investigations of polyolefins [8], but recent developments in low voltage high-resolution field emission gun scanning electron microscopy (FEG-SEM) [9] and the advent of atomic force microscopy (AFM) and related near-field techniques [10] have challenged its dominance at the length scales of the order of 10 nm, characteristic of both microdeformation (cavitation, fibrils) and structural components of semicrystalline... [Pg.81]

Figure 12.9 Cross-sectional field emission gun-scanning electron microscopy image of a used membrane electrode assembly. The anode is on the left-hand side, the cathode on the right-hand side. (Adapted from ref. 266, with permission from the Electrochemical Society.)... Figure 12.9 Cross-sectional field emission gun-scanning electron microscopy image of a used membrane electrode assembly. The anode is on the left-hand side, the cathode on the right-hand side. (Adapted from ref. 266, with permission from the Electrochemical Society.)...
The degree of clay dispersion in a PS matrix was characterized by x-ray diffraction analysis (XRD), and electron microscopy that is, scanning [with field emission gun scanning electron microscopy (FEGSEM)] and transmission (TEM) the results are listed in Table 14.1. The XRD scans were obtained at a scan rate 0.3°/min. The specimens were prepared by compression molding at T= 200°C and a compressive... [Pg.566]

FEGSEM field emission gun scanning electron microscopy... [Pg.711]

DDLS depolarized dynamic light scattering FEG-SEM field emission gun scanning electron microscopy SANS small angle neutron scattering... [Pg.31]

CL spectra were collected in a field-emission gun scanning electron microscope (FEG-SEM, Hitachi SE-4300) equipped with a CL device. The CL device consisted of an ellipsoidal mirror and a bundle of optical fibers to collect and to transmit the CL emission into a spectrally resolved monochromator (Jobin-Yvon/Horiba Triax 320,). A 150 gr/mm grating was used throughout the... [Pg.94]

Figure 10.13. Field emission gun scanning electron microscopy (SEM-FEG) of sample presented at Figure 10.12 (microscopy conducted by F. Chariot at CMTC INPG, Grenoble, France). [Pg.199]

An FEZ Sirion field emission gun scanning electron microscope (5 Kv) operating in the secondary electron imaging mode was used to examine the surface of the cry-ofractured membranes. Cryofractured surfaces of the dried and swollen samples were examined. [Pg.129]

Left SKPFM image of AZ91D alloy. Right field emission gun scanning electron microscopy (FEG-SEM) image of the same area. The compositions and Volta potentials of points 1-4 are given in Table 7.5. [Pg.283]

To characterise surface modifications to the samples, two microscopie methods were used Field Emission Gun Scanning Electron Microscopy (FEG-SEM) and AFM. The structure of the irradiated zone was analysed by Low Incidence X-Ray Diffraction (LI-XRD) technique. [Pg.201]

Employing the field emission gun scanning electron microscopy (FEG-SEM) and TEM to study the morphology of the epoxy reinforced with polystyrene-p-polybutadiene-p-poly(methyl methacrylate) block copolymer (SBM), the nanostructured epoxy matrix with disperse micro-scale phase was revealed. Enhanced flexural properties, which were dependent on the composition of blend was obtained. [Pg.381]

Campos et al. [21] studied sisal flber-reinforced TPS and polycaprolactone, both biodegradable pol5miers. Sisal fibers (5% and 10%) were extruded in a twin-screw extruder with TPS/ polycaprolactone (80 20 wt). Films were produced with a single extruder and analyzed by field emission gun scanning electron microscopy, mechanical tests, thermogravimetric analysis, and differential scanning calorimetry. The morphology of the composites with 10% sisal fiber content presented an interface... [Pg.352]

Samples with grooves obtained from multiple scratch testings were coated with gold. The sample surfaces were then studied using field emission gun scanning electronic microscope (FEG-SEM). [Pg.2322]


See other pages where Field emission gun-scanning electron is mentioned: [Pg.76]    [Pg.57]    [Pg.468]    [Pg.211]    [Pg.93]    [Pg.910]    [Pg.25]    [Pg.55]    [Pg.191]    [Pg.75]    [Pg.269]    [Pg.412]    [Pg.1440]    [Pg.94]    [Pg.102]    [Pg.155]    [Pg.236]    [Pg.135]   


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