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MOSFET enhancement

EXERCISE 7-Z Change the model parameters of Ml in the circuit above to define an enhancement MOSFET with the parameters K = 20 pA/V2 and VT = 3 V. MOSFET operation in the saturation region is governed by the equation ... [Pg.437]

New Materials Technology. The unique chemical compatibihty of Si02 with sihcon and aluminum has been a significant factor in the dominance of siUcon-based semiconductor technology for MOSFETs in particular and integrated circuits in general. Two enhancements of conventional bipolar or MOS processes have been studied siUcon on insulator (SOI) and SiGe. An alternative material of importance is SiC. [Pg.355]

The development of this hybrid combination in a bipolar transistor has greatly enhanced the application of power transistors in the field of power conversion and variable-speed drives. It possesses the qualities of both the power bipolar transistor (BJT) and the power MOSFET. Like a power MOSFET, it is a voltagc-eontrollcd switching device... [Pg.113]

The MOSFET heater is directly driven with this bit stream or optionally, the bit stream can be routed through a low pass filter. Early experiments revealed that driving the heater transistor with the raw bit stream might cause some electromigration due to the large peak currents that occur. The low-pass filter was therefore included to avoid such current peaks in order to enhance the device stability and life time. [Pg.102]

We are calling the new model My. Note that the symbols for enhancement- and depletion-mode MOSFETs are the same. PSpice knows that a MOSFET is either an enhancement- or a depletion-mode MOSFET by the value of the threshold voltage parameter, VtO. [Pg.224]

MOS metal oxide sensor, MOSFET metal oxide semiconductor field-effect transistor, IR infrared, CP conducting polymer, QMS quartz crystal microbalance, IMS ion mobility spectrometry, BAW bulk acoustic wave, MS mass spectrometry, SAW siuface acoustic wave, REMPI-TOFMS resonance-enhanced multiphoton ionisation time-of-flight mass spectrometry... [Pg.335]

Figure 21. Example of two MOSFET channel B implants performed through a poly gate I oxide structure and annealed at 600 °C for 30 min and at 700 °C for 30 min. The substantial enhanced diffusion is shown modeled with calculations from the Predict program. Data are from Mele et al. (61). Abbreviation and symbols S/MS, secondary ion mass spectrometry I, measured after implant A, measured after anneals. (Reproduced with permission from reference 59. Copyright 1988 Institute of Electrical and Electronics Engineers,... Figure 21. Example of two MOSFET channel B implants performed through a poly gate I oxide structure and annealed at 600 °C for 30 min and at 700 °C for 30 min. The substantial enhanced diffusion is shown modeled with calculations from the Predict program. Data are from Mele et al. (61). Abbreviation and symbols S/MS, secondary ion mass spectrometry I, measured after implant A, measured after anneals. (Reproduced with permission from reference 59. Copyright 1988 Institute of Electrical and Electronics Engineers,...
Although the two choices each of type (JFET, MOSFET) of channel (n-channel, p-channel) and doping (enhancement, depletion) could yield eight choices, in practice only five main FET types exist ... [Pg.545]

Figure 4.17. SEM image of a nonplanar tri-gate transistors. Also shown is the enhanced electron flow (shown in red) of (a) tri-gate, relative to (b) standard planar MOSFETs. Reproduced with permission from Intel Corporation (http //www.intel.com). Figure 4.17. SEM image of a nonplanar tri-gate transistors. Also shown is the enhanced electron flow (shown in red) of (a) tri-gate, relative to (b) standard planar MOSFETs. Reproduced with permission from Intel Corporation (http //www.intel.com).
The essential difference from a conventional buck regulator is that the low-side mosfet in a synchronous regulator is designed to present a typical forward drop of only around 0.1 V or less to the freewheeling current, as compared to a Schottky catch diode which has a typical drop of around 0.5 V. This therefore reduces the conduction loss (in the freewheeling path) and enhances efficiency. [Pg.196]

The most important CMOS circuit is the CMOS inverter. It consists of only two transistors - a pair of one n-type and one p-type transistor. Both devices are enhancement-mode MOSFETs, with the threshold voltage of the PMOSFET less than zero and the threshold voltage of the NMOSFET greater than zero. Figure 9.6a-c shows the circuit diagram, the top view and the cross section of the CMOS inverter, respectively. [Pg.112]

The first SiC MOSFETs were fabricated by Suzuki et al [1] in 3C-SiC. At the present time, SiC MOSFET research is carried out by several groups, including Cree Research [2-4] and Westinghouse [5]. Enhancement mode and depletion mode (3-SiC MOSFETs have been fabricated by Palmour et al [3]. Enhancement mode devices with 5 pm gate lengths had a maximum transconductance (gm) of 0.46 mS mm 1 at room temperature (see FIGURES 1 and 2). The devices were operational up to 823 K. [Pg.247]

FIGURE 1 Fabrication steps for an enhancement mode P-SiC MOSFET [3]. [Pg.248]

FIGURE 2 Current-voltage characteristics of enhancement mode P-SiC MOSFETs at room temperature and... [Pg.249]

FIGURE 3 Cross-section of n-channel enhancement mode a-SiC MOSFET [6]. [Pg.250]

Current-voltage characteristics of n-channel enhancement a-SiC MOSFETs [6],... [Pg.251]

FIGURE 9 Current-voltage characteristics of enhancement mode 6H-SiC p-channel MOSFET at room... [Pg.255]

The use of intricate structures and submicron-sized components increases the influence of the composition, structure, and morphology of poly-Si films on the performance of MOSFET gates, loading resistors and capacitors in memory elements, contacts, and interconnects [1-3], A critical issue in this context is to reduce the surface roughness of poly-Si films and enhance the stability of their properties to high-temperature processing. [Pg.499]


See other pages where MOSFET enhancement is mentioned: [Pg.2892]    [Pg.353]    [Pg.355]    [Pg.491]    [Pg.367]    [Pg.426]    [Pg.436]    [Pg.162]    [Pg.170]    [Pg.835]    [Pg.835]    [Pg.221]    [Pg.353]    [Pg.355]    [Pg.542]    [Pg.542]    [Pg.545]    [Pg.545]    [Pg.608]    [Pg.609]    [Pg.10]    [Pg.111]    [Pg.247]    [Pg.257]    [Pg.257]    [Pg.257]    [Pg.2892]    [Pg.111]   
See also in sourсe #XX -- [ Pg.437 ]




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