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Elemental images

Figure 8 X-ray elemental imaging in a field-emission STEM (a) EDS data of Pd /Ce /alumina catalyst particle poisoned with SO2 and (b) 128 X 128 digital STEM images formed using X-ray counts collected at each image pixel for aluminum, palladium, cerium, and sulfur. (Courtesy of North-Holland Publishers) ... Figure 8 X-ray elemental imaging in a field-emission STEM (a) EDS data of Pd /Ce /alumina catalyst particle poisoned with SO2 and (b) 128 X 128 digital STEM images formed using X-ray counts collected at each image pixel for aluminum, palladium, cerium, and sulfur. (Courtesy of North-Holland Publishers) ...
Rather high concentrations are needed to afford in situ TLC-XRF elemental images. TLC-XRF is mainly used for element qualification rather than quantification. The major difficulty in using XRF for detection in TLC is the strong emission background of the (cellulose and silica gel) support, which seriously interferes with particular spectral regions. In practice, TLC plates with moderately low background, i.e. 0.5-mm-thick cellulose plates and 0.25-mm-thick silica gel plates, are used [735],... [Pg.532]

Elemental images, z = f(lx, ly), with z being a component-specific signal see Fig. 3.12c... [Pg.301]

Ryan, C.G. 2000. Quantitative trace element imaging using PIXE and the nuclear microprobe. International Journal of Imaging Systems and Technology, 11, 219-230. [Pg.73]

Fig. 5.24 SIM elemental images of a test circuit 40 gm full scale, (a) is an image of 27A1+ ions and (b) is an image of 48Ti+ ions. (Courtesy of R. Levi-Setti.)... Fig. 5.24 SIM elemental images of a test circuit 40 gm full scale, (a) is an image of 27A1+ ions and (b) is an image of 48Ti+ ions. (Courtesy of R. Levi-Setti.)...
D element images of thin sections revealed the zonation of Cu in sheep liver with low Cu concentration. [Pg.364]

Gholap D, Izmer A, Samber B, van Elteren J, Selih V, Evens R, Schamphelaere K, Janssen C, Balcaen L, Lindemann I, Vincze L, Vanhaecke F (2010) Comparison of laser ablation-induc-tively coupled plasma-mass spectrometry and micro-X-ray fluorescence spectrometry for elemental imaging. Anal Chim Acta 664 19-26. doi 10.1016/j.aca.2010.01.052... [Pg.419]

In the following, those ion beam analysis techniques that allow for fluorine detection will be presented. By far, the most important technique in this respect is nuclear reaction analysis (NRA). Although it can be rather complex to perform, it is the most often applied technique for fluorine trace element studies, due to a number of convenient and prolific resonant nuclear reactions which make it very sensitive to fluorine in most host matrices. NRA is often combined with particle-induced X-ray emission (PIXE) which allows for simultaneous determination of the sample bulk composition and concentrations of heavier trace elements. By focusing and deflecting the ion beam in a microprobe, the mentioned techniques can be used for two- or even three-dimensional multi-elemental imaging. [Pg.217]

G. Chen and R.C. Lanza, Fast neutron resonance radiography for elemental imaging theory and applications, IEEE Trans. Nucl. Sci., 49(4) (2002) 1919-1924. [Pg.154]

The pattern recognition techniques used for in-depth characterization of screen-printed electrodes (viz. PCA and CA) have also been employed for multi-elemental imaging in laser-induced breakdown spectrometry (MCl-LlBS) [157]. [Pg.485]

In this review the various modes of SIMS and examples of their applications are discussed. SIMS depth profiles are widely used to study dopant profiles and Intermetallic diffusion. The extreme surface sensitivity and low concentration detection limits of SIMS make It useful for Investigation of substrate and metallization cleaning processes. SIMS elemental Imaging Is also used In contamination studies. The ability of SIMS to provide Isotopic Information has allowed elegant mechanistic studies. The Identification and determination of the relative abundance of various molecular or elemental species by SIMS Is applicable to the development characterization and understanding of microelectronic processing. The capability of SIMS In the area of quantitative analyses Is also discussed. [Pg.96]


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See also in sourсe #XX -- [ Pg.277 ]

See also in sourсe #XX -- [ Pg.277 ]




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Element map images

Elemental spectroscopic imaging

Imaging elements

Imaging elements

Imaging of Element Distribution

Near-field LA-ICP-MS A Novel Elemental Analytical Technique for Nano-imaging

Synchrotron Radiation as a Source for Infrared Microspectroscopic Imaging with 2D Multi-Element Detection

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