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Electron spectrometry

Balsenc LR (1980) Sulfur Interaction with Surfaces and Interfaces Studied by Auger Electron Spectrometry. 39 83-114... [Pg.242]

As mentioned already, many surface-analysis techniques are available nowadays. In the opinion of some specialists in this field [36, 37], four of these are greater in importance X-ray photoelectron spectrometry (ESCA), Auger electron spectrometry (AES), secondary-ion mass spectrometry (SIMS), and low-energy ion scattering spectrometry (ISS). [Pg.450]

Auger electron spectrometry (AES), reported by Auger in 1923 [40], is also a valuable technique for analysing surfaces. The technique is somewhat similar to ESCA, measuring electrons emitted from a surface as a result of electron bombardment. In both cases, the sampling depth is ca. 20A. Coupling this technique with scanning electron microscopy (SEM) produced a tandem (AES-SEM) technique which has proved extremely productive. [Pg.453]

Dimerization shown in Scheme 4.31 is reversible at all the steps. Both electron spectrometry and electron spin resonance are applicable to study the equilibrium, but the first method provides more accuracy. [Pg.237]

Examples of conventional instrumentation used for electron-excited X-ray emission spectroscopy and Auger electron spectrometry are shown in Figures 2 and 3 respectively. Details concerning the instrumentation may be found elsewhere (25-29). [Pg.140]

Barrier layers for Cu metallization in surface acoustic wave (SAW) devices, which are increasingly used in the information technique and telecommunications industry, have been investigated by SIMS depth profiling in comparison to AES (Auger Electron Spectrometry).125 Development trends in SAW devices focus on smaller structures, higher input power or higher frequency. Two Cu metallization systems (of 150 nm thickness) on a LiNb03 substrate with different barrier layers ... [Pg.285]

Ion scattering spectrometry (ISS) Secondary ion mass spectrometry (SIMS) Auger electron spectrometry (AES) X-ray photoelectron spectrometry (XPS)... [Pg.63]

R. Schinke Photodissociation Dynamics 2. L. Frommhold Collision-Induced Absorption in Gases 3. T. F. Gallacher Rydberg Atoms 4. M. Auzinsh and R. Ferber Optical Polarization of Molecules 5.1. E. McCarthy and E. Weigold Electron-Atom Collisions 6. V. Schmidt Electron Spectrometry of Atoms using Synchrotron Radiation 7. Z. Rudzikas Theoretical Atomic Spectroscopy... [Pg.428]

Table 4. Ionization energies in eV of the (J = 3/2) component of the 2 p shell of potassium obtained by photo-electron spectrometry, and corrected for the quasi-stationary positive potential of the non-conductors loosing electrons... Table 4. Ionization energies in eV of the (J = 3/2) component of the 2 p shell of potassium obtained by photo-electron spectrometry, and corrected for the quasi-stationary positive potential of the non-conductors loosing electrons...
W. Mehlhorn, Auger-electron spectrometry of core levels of atoms, in B. Crasemann (Ed.), Atomic Inner-Shell Physics, Plenum, New York, 1985. [Pg.338]

The interaction of a photon with an atom changes the structure of the atom, and the photon-energy-dependent change in the observables is called the dynamics in the photon-atom interaction. Therefore, in the present context of the study of photoionization processes using electron spectrometry and synchrotron radiation, the observations that can be made on the emitted electrons are all studies of dynamical properties. In the light of the foregoing discussion on the forces in the atom and the transition operator it can be concluded that photoprocesses in atoms provide a unique opportunity for fundamental investigations which explore the dynamics of many-body effects, because both the forces and the interaction... [Pg.15]

The different emission products which are possible after photoionization with free atoms lead to different experimental methods being used for example, electron spectrometry, fluorescence spectrometry, ion spectrometry and combinations of these methods are used in coincidence measurements. Here only electron spectrometry will be considered. (See Section 6.2 for some reference data relevant to electron spectrometry.) Its importance stems from the rich structure of electron spectra observed for photoprocesses in the outermost shells of atoms which is due to strong electron correlation effects, including the dominance of non-radiative decay paths. (For deep inner-shell ionizations, radiative decay dominates (see Section 2.3).) In addition, the kinetic energy of the emitted electrons allows the selection of a specific photoprocess or subsequent Auger or autoionizing transition for study. [Pg.17]

Another important aspect of electron spectrometry of free atoms using synchrotron radiation concerns the polarization of the monochromatized light. [Pg.33]

Basic aspects of electron spectrometry with synchrotron radiation... [Pg.37]

When performing electron spectrometry with monochromatized synchrotron radiation, one has to consider the dependences of the observables on the parameters relevant to the process. The essential parameters are ... [Pg.37]


See other pages where Electron spectrometry is mentioned: [Pg.235]    [Pg.408]    [Pg.411]    [Pg.333]    [Pg.21]    [Pg.450]    [Pg.453]    [Pg.138]    [Pg.304]    [Pg.478]    [Pg.34]    [Pg.34]    [Pg.62]    [Pg.64]    [Pg.76]    [Pg.50]    [Pg.109]    [Pg.228]    [Pg.457]    [Pg.228]    [Pg.16]    [Pg.17]    [Pg.18]    [Pg.22]    [Pg.29]    [Pg.37]   
See also in sourсe #XX -- [ Pg.17 , Pg.18 , Pg.21 , Pg.37 , Pg.38 , Pg.39 , Pg.40 , Pg.41 , Pg.42 , Pg.43 , Pg.44 ]

See also in sourсe #XX -- [ Pg.17 , Pg.18 , Pg.21 , Pg.37 , Pg.38 , Pg.39 , Pg.40 , Pg.41 , Pg.42 , Pg.43 , Pg.44 ]

See also in sourсe #XX -- [ Pg.46 ]




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Atomic spectrometry electron spectroscopy

Auger electron spectrometry

Auger electron spectrometry, described

Basic aspects of electron spectrometry with synchrotron radiation

Chemical ionization mass spectrometry electron capture

Electron Impact Mass Spectrometry (EIMS)

Electron Paramagnetic Resonance Spectroscopy and Forward Recoil Spectrometry

Electron and ion spectrometry

Electron bombardment mass spectrometry

Electron capture dissociation tandem mass spectrometry

Electron capture dissociation tandem mass spectrometry using

Electron capture negative ion mass spectrometry

Electron energy loss spectrometry

Electron energy loss spectrometry scanning

Electron energy-loss spectrometry (EELS

Electron forward recoil spectrometry

Electron impact ionization mass spectrometry

Electron impact mass spectrometry

Electron impact mass spectrometry characteristics

Electron impact mass spectrometry sugar derivatives

Electron impact/desorption mass spectrometry, structural studies

Electron ionisation mass spectrometry

Electron ionization mass spectrometry EI-MS)

Electron ionization mass spectrometry fragmentation

Electron mass spectrometry

Electron microprobe X-ray emission spectrometry

Electron spectrometry, scope

Electron spin resonance spectrometry

Electron spin resonance spectrometry applications

Electron spray ionization mass spectrometry

Electron spray ionization mass spectrometry ESI-MS)

Electron-capture atmospheric mass spectrometry

Electron-impact (El) Secondary Neutral Mass Spectrometry (SNMS)

Electronic Paramagnetic Resonance Spectrometry

Electronic nose spectrometry

Fine electron energy loss spectrometry

High-resolution electron impact mass spectrometry

Mass Spectrometry Electron multiplier

Mass spectrometry electron impact ionisation

Mass spectrometry electron ionisation mode

Mass spectrometry electron ionization

Mass spectrometry electron-induced dissociations

Mass spectrometry electronic spectrum

Mass spectrometry from electron ionization

Mass spectrometry pulse electron-beam

Mass spectrometry pulsed electron-beam

Pyrolysis-gas chromatography/electron impact mass spectrometry

Scanning Electron Microscopy and Energy Dispersive Spectrometry Analyses

Spectrometry electron impact

Spectrometry electronic absorption

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