Sample transmission electron

Because the electron beam passes through the sample, transmission electron microscopy reveals the interior of the specimen. It is sensitive toward the internal structure of the material (size, shape, and distribution of phases within the material), its composition (distribution of elements, including segregation if present), and the crystalline structure of the phases and the character of crystal defects. 

Transmission electron microscopy (TEM) can resolve features down to about 1 nm and allows the use of electron diffraction to characterize the structure. Since electrons must pass through the sample however, the technique is limited to thin films. One cryoelectron microscopic study of fatty-acid Langmuir films on vitrified water [13] showed faceted crystals. The application of TEM to Langmuir-Blodgett films is discussed in Chapter XV. 

The history of EM (for an overview see table Bl.17,1) can be interpreted as the development of two concepts the electron beam either illuminates a large area of tire sample ( flood-beam illumination , as in the typical transmission electron microscope (TEM) imaging using a spread-out beam) or just one point, i.e. focused to the smallest spot possible, which is then scaimed across the sample (scaiming transmission electron microscopy (STEM) or scaiming electron microscopy (SEM)). In both situations the electron beam is considered as a matter wave interacting with the sample and microscopy simply studies the interaction of the scattered electrons. 

One fiirther method for obtaining surface sensitivity in diffraction relies on the presence of two-dimensional superlattices on the surface. As we shall see fiirtlrer below, these correspond to periodicities that are different from those present in the bulk material. As a result, additional diffracted beams occur (often called fractional-order beams), which are uniquely created by and therefore sensitive to this kind of surface structure. XRD, in particular, makes frequent use of this property [4]. Transmission electron diffraction (TED) also has used this property, in conjunction with ultrathin samples to minimize bulk contributions [9]. 

In many ways the nanocrystal characterization problem is an ideal one for transmission electron microscopy (TEM). Here, an electron beam is used to image a thin sample in transmission mode [119]. The resolution is a sensitive fimction of the beam voltage and electron optics a low-resolution microscope operating at 100 kV might... 

Transmission electron microscopy (tern) is used to analyze the stmcture of crystals, such as distinguishing between amorphous siUcon dioxide and crystalline quartz. The technique is based on the phenomenon that crystalline materials are ordered arrays that scatter waves coherently. A crystalline material diffracts a beam in such a way that discrete spots can be detected on a photographic plate, whereas an amorphous substrate produces diffuse rings. Tern is also used in an imaging mode to produce images of substrate grain stmctures. Tern requires samples that are very thin (10—50 nm) sections, and is a destmctive as well as time-consuming method of analysis. 

The properties and performance of cemented carbide tools depend not only on the type and amount of carbide but also on carbide grain size and the amount of biader metal. Information on porosity, grain size and distribution of WC, soHd solution cubic carbides, and the metallic biader phase is obtained from metaHographicaHy poHshed samples. Optical microscopy and scanning and transmission electron microscopy are employed for microstmctural evaluation. Typical microstmctures of cemented carbides are shown ia Figure 3. 

To illustrate the effect of radial release interactions on the structure/ property relationships in shock-loaded materials, experiments were conducted on copper shock loaded using several shock-recovery designs that yielded differences in es but all having been subjected to a 10 GPa, 1 fis pulse duration, shock process [13]. Compression specimens were sectioned from these soft recovery samples to measure the reload yield behavior, and examined in the transmission electron microscope (TEM) to study the substructure evolution. The substructure and yield strength of the bulk shock-loaded copper samples were found to depend on the amount of e, in the shock-recovered sample at a constant peak pressure and pulse duration. In Fig. 6.8 the quasi-static reload yield strength of the 10 GPa shock-loaded copper is observed to increase with increasing residual sample strain. 

Figure 2 The transmission electron micrographs of samples cast from solution containing 1 wt% of polymer, (a) the block copolymer BCl, and (b) the microsphere, MCI [24].

Also a good interface resolution is obtained with transmission electron microscopy (TEM), where, however, a dedicated sample preparation and treatment are necessary to achieve nanometer resolution and suitable contrast [64]. Thus the... 

FIGURE 3.14 Transmission electron microscopic (TEM) pictures of (a) acrylic rubber (ACM)-silica hybrid prepared from 1 1 tetraethoxysilane (TEOS)/water (H2O) and (b) 1 2 TEOS/H2O mole ratios and (c) scanning electron microscopic (SEM) picture of ACM-silica hybrid composite synthesized from 1 6 TEOS/H2O mole ratio. The concentration of TEOS has been kept constant at 45 wt% and the samples have been gelled at room temperature. (From Bandyopadhyay, A., De Sarkar, M., and Bhowmick, A.K., J. Appl. Polym. Sci., 95, 1418, 2005. Courtesy of Wiley InterScience.)... 

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