Electron spin resonance polycrystalline samples

Recently, both polycrystalline and microcrystalline ( 200 A crystallite size) Si films have been investigated by ESR (Hasegawa ft a/., 1981b, 1983b). A dangling bond resonance in microcrystalline silicon films is observed at g = 2.0049. The spin density of this resonance is typically between 10 and 10 spins cm. In P-doped samples a conduction-electron spin-resonance signal is observed at = 1.997. [Pg.139]

Simulation of the Electron Spin Resonance Spectra of Polycrystalline Samples Calculated Isotropic and Anisotropic Hyperfine Coupling Constants of Transition Metal Ions Rotational Properties of Electron Spin Resonance Spectra Vibrational Structure of EPR Spectra... [Pg.757]