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Electron microscope photomicrograph

Fig. 15. Scanning electron microscope photomicrograph of multilayer TiB2/Al203 with zirconia toughened alumina (Adapted from DeAngelis and Weiss, 1990). Fig. 15. Scanning electron microscope photomicrograph of multilayer TiB2/Al203 with zirconia toughened alumina (Adapted from DeAngelis and Weiss, 1990).
Fig. 2.5 Electron microscope photomicrographs of two paint pigments showing how particles can be aggregates of finer particles [2]. Fig. 2.5 Electron microscope photomicrographs of two paint pigments showing how particles can be aggregates of finer particles [2].
FIGURE 27.6 Scanning electron microscope photomicrographs of representative microstructures of (a) PZT and (b) BT thin films on platinum prepared by a chelate process. [Pg.548]

Fig. 8.3 Scanning electron microscope photomicrograph of floe material from a snowblower - type vent at Axial Volcano, JDFR. The material is dominated by sulphur with little carbon, though it is presumably a microbial product. Scale Bar = 20 pm. Photomicrograph and compositional analysis by C. Levesque. Fig. 8.3 Scanning electron microscope photomicrograph of floe material from a snowblower - type vent at Axial Volcano, JDFR. The material is dominated by sulphur with little carbon, though it is presumably a microbial product. Scale Bar = 20 pm. Photomicrograph and compositional analysis by C. Levesque.
Fig. 8.6 Transmission electron microscope photomicrograph of Fe-rich layer silicate surrounding microbial remains, which appear as holes in this unstained section. Sample from Southern Explorer Ridge. The mineral has a composition similar to nontronite. From D. Fortin etal., Amer. Mineral., 83, 1399—1408. Reproduced with permission. Copyright Mineralogical Society of America (1998). Fig. 8.6 Transmission electron microscope photomicrograph of Fe-rich layer silicate surrounding microbial remains, which appear as holes in this unstained section. Sample from Southern Explorer Ridge. The mineral has a composition similar to nontronite. From D. Fortin etal., Amer. Mineral., 83, 1399—1408. Reproduced with permission. Copyright Mineralogical Society of America (1998).
Fig. 19. Transmission electron microscopic photomicrograph of the crystal corresponding to fig. 18. Each space between striae permits one to define a structure. Fig. 19. Transmission electron microscopic photomicrograph of the crystal corresponding to fig. 18. Each space between striae permits one to define a structure.
Photomicrographs were obtained using an AMR-900 scanning electron microscope. The microscope operates at 20KV and has an... [Pg.333]

Photomicrographs of each material were taken with a Jeol JSM-5800 scanning electron microscope (SEM) (Jeol USA Inc., Peabody, Massachusetts, U.S.A.). The photographs were taken at a working distance of 10 mm, with an accelerating voltage of 5 to 10 kV. [Pg.133]

The Zeiss-Endter analyzer [87,88] allowed a direct comparison between the projected area of the particle and the area of a reference circle that consisted of a spot of light adjustable in size by an iris diaphragm. The instrument was designed to work with a photomicrograph that could be obtained from an electron microscope to extend the lower size down to around 0.01 pm. Exnor et. al. [89] applied the instrument to size and shape determination of lead powder. A modified instrument, that was rugged and simpler but not as versatile, was described by Becher [90]. [Pg.164]

Measurement. Transmission and scanning electron photomicrographs were taken using two types of electron microscopes (model HU-11C manufactured by Hitachi Co. Ltd. and model JSM-U3 by JEOL In Japan). The detailed method for analyzing pore characteristics by applying stereology will be given elsewhere (13). [Pg.209]

Each sample was cemented to a specimen holder and then was coated with approximately 200 X of aluminum in an EFFA Rotary Vacuum Evaporator. The photomicrographs were obtained from a Cambridge Model S180 Scanning Electron Microscope. [Pg.321]

In the mid-1930s when both photographic and printing techniques for photomicrographs were greatly improved, U.S. research was not directed toward microscopy, but rather to development of heavy production equipment and manufacturing facilities. At this same time, a completely new instrument—the transmission electron microscope—was introduced in Europe and went almost unnoticed in the United States. It took many years before this development gap was overcome. [Pg.741]

Protein adsorption was assessed by observing surface characteristics using a scanning electron microscope (SEM) (Super Mini International Scientific Instruments). EDAX along with an EDAX peak identification computer (EPIC) were used to analyze the surface elemental distribution on the exposed copper-2% zinc electrodes. Photomicrographs are secondary electron images. [Pg.414]

The Pittsburgh No. 8 semicoke that was cooled from 400 C contained remnant mesophase spheres, and these can be seen in Figure 4. This photomicrograph was taken in the secondary electron mode in the scanning transmission electron microscope. [Pg.297]

The purified receptor-carrier was then found to be a glycoprotein of molecular weight about 50000. Under the electron microscope, it was seen as rows of rosettes, at a density of about a dozen rosettes to the linear 0.1 fim. This was first illustrated by Changeux (1980) and a more recent photomicrograph will be seen in Fig. 2.1. The sequence of all the amino acids is known. Several residues of carbohydrate are bound to the protein which has a somewhat lipophilic character. More about this ACh receptor is presented in Section 12.6. [Pg.28]

Figure 6 (A) The scanning electron microscope coupled with energy-dispersive spectroscopy pictured here is used to study materials at higher magnifications and determine elemental compositions. (Courtesy C. Palenik.) (B) An SEM photomicrograph of a quartz grain can reveal details about its geologic history and its environment of deposition. (Courtesy S. Palenik.)... Figure 6 (A) The scanning electron microscope coupled with energy-dispersive spectroscopy pictured here is used to study materials at higher magnifications and determine elemental compositions. (Courtesy C. Palenik.) (B) An SEM photomicrograph of a quartz grain can reveal details about its geologic history and its environment of deposition. (Courtesy S. Palenik.)...
Figure 9. Photomicrographs of gelled-foam lamellae in a Berea sandstone core, taken using a low energy scanning electron microscope (SEM). Image (a) shows a view down a pore surrounded hy rock grains. Image (b) is a magnification of the upper centre region. Figure 9. Photomicrographs of gelled-foam lamellae in a Berea sandstone core, taken using a low energy scanning electron microscope (SEM). Image (a) shows a view down a pore surrounded hy rock grains. Image (b) is a magnification of the upper centre region.
Samples were also examined by C.J. Pellegrin with a JEOL JSM-840 scanning electron microscope. This instrument has a resolution of 4nm, and photomicrographs with magnifications up to 50K were obtained on the submitted samples. [Pg.87]

SEM photomicrographs of cured epoxy-acrylobutadienestyrene (ABS) blends (scanning electron microscope XL 30 ESEM-FEG [Philips] on cut surfaces, etched with oxygen plasma, and sputtered with gold). (From Y. Muller, L. Haufiler, and J. Pionteck, Macromol. Symp. 254, 267-273, 2007. With permission.)... [Pg.152]


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