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Electron mapping

Development of new and existing Risk Assessment Tools (e.g., Natural Hazards Electronic Map and Assessment Tools Information System—NHEMATIS), Risk Management Tools inclusive of all stakeholders in the process (e.g., CAN/CSA Q850-97 for risk management in Canada, CAN/CSA-Z763-96 specifically for environmental concerns) Effective Risk Communication. [Pg.72]

The most basic phosphine considered by Tolman was PBu this produced an A, frequency of 2056.1cm-1 and was made the arbitrary standard for the electronic parameter (Table 12). The electronic parameter, v, and the steric cone angle parameter, d, when plotted together produce a steric and electronic map (Figure 16). [Pg.1028]

When some other reaction parameter, Z, such as the log of a rate constant, is plotted on to this steric and electronic map on an axis normal to the plane of the paper the comparative contributions of 6 and v should become apparent. A purely steric effect will slope north or south (the reader is encouraged to view Figures 26-28 of ref. 187 to appreciate this fully). Weimann and co-workers211 used Tolman s methodology to show the % steric effect in the oligomerization of butadiene catalyzed by nickel phosphine complexes. [Pg.1028]

Lilly s research, which electronically mapped the brain s pain and pleasure pathways, opened the door to decades of neural imaging advances. He invented the isolation tank and explored the effects of sensory depri-... [Pg.267]

Figure 6.9 Descriptors calculated for phosphines in the irons-Rh (PR3)2(CO)CI catalyst a the deformation coordinate S4 is employed as steric measure b stereo-electronic map showingthe distribution of the various PR3 ligands. Figure 6.9 Descriptors calculated for phosphines in the irons-Rh (PR3)2(CO)CI catalyst a the deformation coordinate S4 is employed as steric measure b stereo-electronic map showingthe distribution of the various PR3 ligands.
To study the surface chemistry the EDX analysis was done. The comparison of the scanned areas (512 x 512 p.m) is presented as BSE (back scanning electron) maps of elements in... [Pg.222]

The use of electronic mapping and databases can make one s work quicker and more efficient when handling spatial and spatially distributed information. Using GIS... [Pg.394]

Cytochrome C4 A Prototype for Microscopic Electronic Mapping of Multicenter Redox Metalloproteins... [Pg.116]

R.R., Zinkidieva, T.T., and Bronshtein, M.D. (2009) Submolecular electronic mapping of single cysteine molecules by... [Pg.134]

Taking the limit as N approaches the number of electrons from above and renormalizing yields an HK LUMO and the limit from below yields the HK HOMO, without recourse to the KS one-electron mapping. Without EON it should be possible to use powerful results such as Eq. (58) in non-singular Xtx-like methods. However, we are left with questions concerning the interpretation of asymmetrical /(r), which occur in cases of degeneracy. [Pg.309]

Auger electron maps for Cr and SI Indicated that the smallest Sl/Cr ratio occurred at the pointed end of Area A. These Auger electron maps are shown In Figure 17. AES survey spectra obtained from Area B were equivalent to spectra obtained from unstressed resistors. Sputter depth profiles were obtained from both areas and they Indicated that the resistor film In Area A was only 70% as thick as the film In Area B. Sputter depth profiles obtained from an unstressed resistor were equivalent to those from Area B. The conclusion reached was that Si was diffusing away from a portion of the resistor when high currents were passed through the film. [Pg.132]

Figure 17. Auger electron maps for Si (a) and Cr (b) in a stressed Si-Cr resistor. Figure 17. Auger electron maps for Si (a) and Cr (b) in a stressed Si-Cr resistor.
Figure 18. Secondary electron image (a) and Auger electron maps for Nickel (b), oxygen (c), and gold (d) from Au/Ni/Cu metallization following heating. (Reproduced with permission. Copyright Perkin-Elmer Corporation.)... Figure 18. Secondary electron image (a) and Auger electron maps for Nickel (b), oxygen (c), and gold (d) from Au/Ni/Cu metallization following heating. (Reproduced with permission. Copyright Perkin-Elmer Corporation.)...
The shifts for Al and Si are so large that one can treat the separate chemical states like separate elements and map for the distributions of the chemical states. Auger electron maps for elemental and oxidized SI showing their distributions In a 64 RAM are shown in Figure 23. [Pg.137]

Figure 23. Secondary electron Images (a) from a 64K RAM plus Auger electron maps for elemental Si (b) and oxidized Si (c). Figure 23. Secondary electron Images (a) from a 64K RAM plus Auger electron maps for elemental Si (b) and oxidized Si (c).
For structures not determined by molecular replacement, the chemical sequence of the protein must be fit into the experimental electron density map (Figure 2.7). This is called model building or chain tracing. As one would expect, the success or failure of chain tracing is dependent upon the quality of the electron density map. Thus, map quality evaluation is very important before one attempts to trace the chain. Good (traceable) electron maps should display most of the following features. [Pg.29]

The journey toward the depths of the stmcture of condensed state will eventually proceed through an external non-destructive intervention"", with the aid of the X-radiations on the crystals we should note that X-rays interact with the electrons of the atoms or the groups of atoms from the network and not with their nuclei. Thus, the picture of diffraction (reflection or scattering) of the X-ray will generate an electronic map of the bodies investigated, so characterizing their stmcture. Moreover, this... [Pg.490]

For example, in Figure 5.11-left-down a bias method is graphically illustrated the real stmcture factor is F, the one calculated from the model is (the sub-index C indicates the calculated nature)- which, despite indexed, provides the calculated phase exp(/a ) which by combining with the observed (measured) amplitude F generates the bias model (calculation + experiment) of the bias structure factor F exp(/a ) this should be closer to the real one than the one F provided by applying of theoretical model alone. Thus, properties of the stmcture will be identified, as close to the real ones, namely if inside the calculated model there were not certain atoms, they will appear in the bias electronic map, built on the bias stmcture factor. [Pg.509]

But, in the same time, the bias stmcture factor will always be close also to the calculated stmcture factor F so that both the characteristics of the considered phase model, that are not specific for the real electronic map, will appear on the bias electronic map ... [Pg.509]

The procedure is called hybrid electronic maps (or the over-fit ) method. Figure 5.23, and can be obtained, for example, by non-refining (i.e., non-minimizing) completely the D factor of (5.60), so generating a structure such as Eq. (5.61), yet unrefined, therefore being called as the structure by omission, this is compared (by superimposing) with the density difference (or synthesis of the Fourier maps differences)... [Pg.528]


See other pages where Electron mapping is mentioned: [Pg.332]    [Pg.348]    [Pg.61]    [Pg.375]    [Pg.1028]    [Pg.243]    [Pg.78]    [Pg.1654]    [Pg.20]    [Pg.119]    [Pg.121]    [Pg.135]    [Pg.67]    [Pg.1674]    [Pg.140]    [Pg.409]    [Pg.210]    [Pg.1793]    [Pg.490]    [Pg.491]    [Pg.494]    [Pg.530]   
See also in sourсe #XX -- [ Pg.719 ]




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