Dynamic secondary ion mass

Dynamic Secondary Ion Mass Spectrometry (Dynamic SIMS)... 

Other technique—for example, dynamic secondary ion mass spectrometry or forward recoil spectrometry—that rely on mass differences can use the same type of substitution to provide contrast. However, for hydrocarbon materials these methods attain a depth resolution of approximately 13 nm and 80 nm, respectively. For many problems in complex fluids and in polymers this resolution is too poor to extract critical information. Consequently, neutron reflectivity substantially extends the depth resolution capabilities of these methods and has led, in recent years, to key information not accessible by the other techniques. 

Secondary Ion Mass Spectrometry Dynamic Secondary Ion Mass Spectrometry Static Secondary Ion Mass Spectrometry SIMS using a Quadruple Mass Spectrometer SIMS usii a Magnetic Sector Mass Spectrometer See Magnetic SIMS... 

Sykes DE (1989) Dynamic secondary ion mass spectrometry. In Wells JM (ed) Methods of surface analysis, Cambridge University Press, Cambridge... 

The way in which fluoride is taken up by glass-ionomers has been studied using surface analysis techniques. Dynamic secondary ion mass spectroscopy (SIMS) shows that most of the fluoride becomes concentrated in the surface [248]. Its concentration with depth varies as an error function relationship [248]. X-ray photoelectron spectroscopy (XPS) has suggested that fluoride taken up becomes associated with calcium [249]. However, the form of this association is unclear, because calcium fluoride as such is very insoluble, and when added to a fluoride-free glass-ionomer cement, caused no fluoride to be released [234]. It therefore seems unlikely that the calcium-fluoride association results in formation of Cap2, and further research is necessary to determine the precise nature of the calcium-fluoride association, and thus to resolve this paradox. 

Lorey D II, Morrison G, Chandra S (2001) Dynamic secondary ion mass spectrometry analysis of boron from boron neutron capture therapy drug in co-cultures single-cell imaging of two different cell types within the same ion microscopy field of imaging. Anal Chem 73 3947-3953. doi 10.1021/ac0103266... 

Figure 8 shows the time evolution of interfacial thickness for the PS/dPS bilayer as a function of temperature [40]. The of both PS and dPS was fixed at 29k. The interfacial characterization was made by dynamic secondary ion mass spectroscopy (DSIMS). In the case of aimealing at 400, 393, and 380 K (i.e., above the 7 of 376 K), the interfacial thickness proportionally increased to a half power of the annealing time. This is in good accordance with the context of Fickian diffusion. By contrast, a unique interfacial evolution was observed at 370 K (i.e., between 7 and T ). At first, the bilayer interface monotonically thickened with increasing time,... 

Dynamic Secondary ion Mass (1-20 keV) analysis with mass (or deepen depth profile (all elements) ... 

They demonstrated the surface eiuichment of the star in isotopic blend with a linear polystyrene counterpart by dynamic secondary ion mass spectroscopy. However, in this study the star polymer was the deuterated component and had a lower molar mass than the linear matrix. Therefore, one could question if these two factors aren t themselves driving the surface segregation. 

Material properties often depend on the constituents of inclusions as small as a few micrometers large or surface layers with a thickness of 0.1-100 nm. From the 1970s onward, microanalysis has become a major challenge. Initial methods such as electron probe X-ray microanalysis (EPXMA) or dynamic secondary ion mass spectrometry (SIMS) determine elements at the microscopic scale, but charge buildup and beam-induced sample damage hamper their application to nonconducting organic materials. 

---