Cylindrical mirror analyzers

These modes of operation ate used in conjunction with the two most popular energy analyzers, the cylindrical mirror analyzer (CMA) and the concentric hemispherical analyzer (CHA). The most common form of the CMA used today is the double-pass version diagramed in Eigute 21. This device consists of two perfectly coaxial cylinders of radii r and r. The outer cylinder is held at a potential of (— ) and the inner cylinder is held at ground. The... 

XPS spectra were obtained using a Perkin-Elmer Physical Electronics (PHI) 555 electron spectrometer equipped with a double pass cylindrical mirror analyzer (CMA) and 04-500 dual anode x-ray source. The x-ray source used a combination magnesium-silicon anode, with collimation by a shotgun-type collimator (1.). AES/SAM spectra and photomicrographs were obtained with a Perkin-Elmer PHI 610 Scanning Auger Microprobe, which uses a single pass CMA with coaxial lanthanum hexaboride (LaBe) electron gun. 

The surface reactions were investigated by a combination of AES and TPR studies, with authentic samples of the expected products being used to calibrate the signals from the two techniques. The Auger spectra were obtained with a single pass cylindrical mirror analyzer operated with a modulation amplitude of 4 eV the surface heating rate in the TPR studies was 2 K/s. 

Cylindrical alkaline primary cells, 3 441-449 anode, 3 443-444 cathode, 3 444-446 cell chemistry, 3 443 performance, 3 446-449 zinc oxidation mechanism, 3 444-446 Cylindrical element filters, 11 362—364 Cylindrical guided wave technique, for pipe inspection, 17 433-434 Cylindrical micelle, 24 124 Cylindrical mirror analyzer (CMA), 24 103-104... 

The HREELS, Auger electron spectroscopy (AES) and thermal desorption spectrometry (TDS) experiments were carried out in a UHV chamber described previously.6 Briefly, the chamber was equipped with a HREELS spectrometer for vibrational analysis, a single-pass cylindrical mirror analyzer for AES measurements and a quadrupole mass spectrometer for TDS measurements. The HREELS spectra were collected in the specular direction with an incident energy of 3.5 eV and with a spectroscopic resolution of 50-80 cm-1. The TDS data were obtained by simultaneously monitoring up to 16 masses, with a typical heating rate of about 1.5 K s-1. 

AES setup using a cylindrical mirror analyzer (CMA). An electron beam is focused onto a specimen, and emitted electrons are deflected around the electron gun and pass through an aperture toward the back of the CMA. These electrons are then directed into an electron multiplier for analysis. Varying voltage at the sweep supply allows derivative-mode plotting of the Auger data [85]. 

For time-resolved 2PPE spectroscopy, a combined set-up of an ultrafast laser system and an ultrahigh-vacuum photoemission spectroscopic system is indispensable. Typical electron energy analyzers have been used as the spectrometer, such as a cylindrical mirror analyzer, a hemispherical analyzer and a time-of-flight (TOF) analyzer. The TOF analyzer is mainly used for low repetition rate (<1 kFlz) laser sources, and the others are used for the lasers with multi-kldz or MHz repetition rates [11-14]. 

Figure 3 demonstrates the electron spectrometer part of a depth-resolved conversion electron MOssbauer spectrometer specially designed for such measurements in our laboratory (10, 11). The electron spectrometer is of the cylindrical mirror type back-scattered K conversion electrons from resonantly excited Fe nuclei are resolved by the electrostatic field between the inner and outer cylinders (cylindrical mirror analyzer) and then detected by a ceramic semiconductor detector (ceratron). The electron energy spectra taken with this spectrometer indicate that peaks of 7.3-keV K conversion electrons, 6.3-keV KLM Auger electrons, 5.6-keV KLL Auger electrons, etc., can be resolved well, with energy resolution better than 4%. 

Auger electron spectra (AES) were collected with a conventional single pass cylindrical mirror analyzer system. Samples were briefly exposed to atmospheric conditions while being loaded into the AES system, however, no evidence for surface contamination was observed in any of the measurements. All AES measurements were performed on 1.0 x 1.0 cm Au foils. 

Figure 14.36 Ion scattering spectrometer based on a cylindrical mirror analyzer.

CMA cylindrical mirror analyzer DTA differential thermoanalysis EELS electron energy loss spectroscopy EDTA ethylenediaminetetraacetic acid... 

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