X-Ray photoemission spectroscopic

Binary silicate-based glasses, x-ray photoemission spectroscopic... 

Waste storage, nuclear x-ray photoemission spectroscopic study of... 

X-Ray Photoemission Spectroscopic Study of the Effect of Ozone on Various Styrene/Butadiene Copolymers... 

Considering the valence levels, the synergistic effect of combining spectroscopic measurements with theoretical calculations is illustrated by two pairs of chapters (1) ultraviolet photoemission and optical absorption data compared to a spectroscopically parameterized CNDO/S3 model, and (2) x-ray photoemission compared to ab initio and intermediate approximation MO calculations. 

To obtain the morphology information, including phase separation and crystalline, we can now use microscopic techniques, atomic force microscopy, transmission electron microscopy, electron tomography, variable-angle spectroscopic ellipsometry. X-ray photoemission spectroscopy, and grazing-incidence X-ray diffraction. The detailed information of this characterization methods can be found from the specific reference (Li et al., 2012 Huang et al., 2014). 

During the last 5 to 10 years there has been much interest in electron spectroscopies (Hiifner and Steiner 1982), since it was realized that these also suggest a very different picture of mixed valence Ce compounds. Valence photoemission spectroscopy (PES) studies showed that the f-spectrum of Ce has weight at (8p ) — 2eV below Ep (Platau and Karlsson 1978, Johansson et al. 1978). It was further found that core level X-ray photoemission spectroscopy (XPS) measurements were hard to understand unless A (Fuggle et al. 1980b) is much larger than previously assumed. This discrepancy between the interpretations of spectroscopic and thermodynamic data showed the need for a theoretical analysis, based on a microscopic model, of what kind of information can be extracted from different experiments. This was further emphasized when PES studies showed f-character in the spectrum both at —2eV and close to 8p = 0 (Martensson et al. 1982). This observation created a lively debate about how to interpret the PES spectra. 

The experimental papers cover the various spectroscopic techniques and a few deal with special materials. The introductory chapter (62) by Baer and Schneider presents an overview of this field and helps tie the various aspects together that are reviewed in detail in the remaining chapters of the volume. Photoemission studies (UPS - ultraviolet photoemission spectroscopy, and XPS - X-ray photoemission spectroscopy) on various materials are discussed by Campagna and Hillebrecht (chapter 63)- intermetallic compounds, by Lynch and Weaver (chapter 66)— cerium and its compounds, and by Hiifner (chapter 67) - chalcogenides. Other experimental techniques covered include BIS (bremsstrahlung isochromat spectroscopy) by Hillebrecht and Campagna (chapter 70), X-ray absorption and X-ray emission by Rohler (chapter 71) and inelastic electron scattering by Netzer and Matthew (chapter 72). 

Photoemission experiments that probe the electronic structure of the nanocrystals are indispensable if one wishes to gain insight into the electronic structure-property relationship. Though very few studies have been carried out on semiconducting nanocrystalline systems to date, techniques such as photoemission and X-ray absorption spectroscopies are of immense value in probing the electronic structure and also in verifying various theories proposed for the nanocrystals. In Section 11.6 we discuss these spectroscopic studies. 

Photoemission spectroscopy (PES) is by far the most widely used and powerful spectroscopic technique for interface research. XPS and UPS are complementary techniques that utilize different light sources, e.g., x-ray and ultraviolet, to excite electrons in solids via photoelectric effect and then collect the escaped photoelectrons with an energy analyzer. In general, photoemission experiments for interface formation studies are performed in the following way. The study begins with the photoemission analysis of a clean surface of the material that will eventually form one side of the... 

With the availability of intense tunable radiation in the range firom ultraviolet to hard X-rays from synchrotrons, powerful new experimental techniques have been developed to probe the structural and electronic properties of solids and surfaces. In particular, angle-resolved photoemission gives information about the electronic properties in the valence bands of solids while core level spectroscopy provides an element-specific spectroscopic tool. 

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