Energy resolution :

The essential functions of an amphfier were discussed in Chapter 4, Section 4.4. I suggested there that pulse processor would be a more appropriate name for this item than the historic amplifier . This is particnlarly true when considering high count rate systems. The data in Table 14.1 showed us that the pulse processor is the critical restraint on pulse throughput, mainly dne to pulse pUe-up (random summing) within it. The high cost of 

---

PES of neutral molecules to give positive ions is a much older field [ ]. The infomiation is valuable to chemists because it tells one about unoccupied orbitals m the neutral that may become occupied in chemical reactions. Since UV light is needed to ionize neutrals, UV lamps and syncln-otron radiation have been used as well as UV laser light. With suitable electron-energy resolution, vibrational states of the positive ions can be... 

In eollisional exeitation, translational energy of the projeetile ion is eonverted into mtemal energy. Sinee the exeited states of the ions are quantized, so will the translational energy loss be. Under eonditions of high energy resolution, it is... 

The ability to identify different mass species depends on the energy resolution of the detector which is typically 15 keV fiill width at half maximum (FWFIM). For example, silver has a mass M2 = 108 and tin has a mass A , = 119. The difference between . = 0.862 and = 0.874 is 0.012. For 2 MeV helium ions the... 

Figure Bl.25.2 shows the XPS spectra of two organoplatinum complexes which contain different amounts of chlorine. The spectrum shows the peaks of all elements expected from the compounds, the Pt 4f and 4d doublets (the 4f doublet is iimesolved due to the low energy resolution employed for broad energy range scans). Cl 2p and Cl 2s, N Is and C Is. Flowever, the C Is caimot be taken as characteristic for the complex only. All surfaces that have not been cleaned by sputtermg or oxidation in the XPS spectrometer contain carbon. The reason is that adsorbed hydrocarbons from the atmosphere give the optimum lowering of the surface free energy and hence, all surfaces are covered by hydrocarbon fragments [9].

In this approach one uses narrow-band continuous wave (cw) lasers for continuous spectroscopic detection of reactant and product species with high time and frequency resolution. Figure B2.5.11 shows an experimental scheme using detection lasers with a 1 MFIz bandwidth. Thus, one can measure the energy spectrum of reaction products with very high energy resolution. In practice, today one can achieve an uncertainty-limited resolution given by... 

Neuhauser D 1990 Bound state eigenfunctions from wave packets—time -> energy resolution J. Chem. Phys. 932611... 

Foi shts placed at from the center of curvature, the electrons passed by this analyzer foUow the equipotential surface described by R. With an acceptance angle 8a shown in Figure 22 and a sht width w, the energy resolution of the CFIA is given by... 

Although energy resolution is rarely employed in positron camera systems, scatter is not normally a problem. This is because of the very short time window within which two photons must arrive in order to be counted. At low decay rates, the incidence of accidental events is very low, rising only slightly for those that occur as the result of scatter. Some systems employ time-of-flight measurements of the time difference between the arrival of the two photons to obtain additional information about the location of an annihilation along the line. This has been used to improve resolution and statistical accuracy. Resolution is in the range of 3—4 mm and is less dependent on position than is SPECT (16). 

Figure 5 Comparison of spectral profiles measured from a specimen of NiO using EDS and EELS. Shown are the oxygen K- and nickel L-shell signals. Note the difference in the spectral shape and peak positions, as well as the energy resolution of the two spectroscopies.

The energy analyzer is always operated at its best energy resolution. 

Sc yrodcT. Ninth Conference on Electron Microscopy. 1978, vol. l,p.534. (Microscopial Society of Canada, Toronto, Canada) Unique combination of Eg = 30 keV used in HREELS study of -Si (H) films with meV energy resolution. 

---