Bright field diffraction

AFM Atomic force microscopy BFDC Bright-field diffraction contrast DFDC Dark-field diffraction contrast ED Electron diffraction PTFE Poly(tetrafluoroethylene)... 

Fig. 14 (a) Shadowed sample of dispersed resin G. The insets are dark-field images. Low-intensity bright-field diffraction contrast images of (b) TE-30 (bottom) and (c) TE-3698 (top), and TE-3170 (bottom). The upper part of b (d) has Pt/C-shadowed TE-30 particles the insets in c are enlargements of some of the particles. All scale bars in a given figure part represent the same scale unless otherwise identified. 

Fig. 18 (a) Low-intensity image of DuPont TE-5070 nanoemulsion particles. An ED pattern (100 reflections only) and the selected area used are shown in the insets (b) Densely packed particles. The effect of beam damage is shown in the left insets. The right inset is a bright-field diffraction contrast image. 

A number of the spots (crystals) in bright field diffraction contrast micrographs of the same samples could be related to surface nodules numerous others were apparently due to crystals in the... 

In bright-field microscopy, a small objective aperture is used to block all diffracted beams and to pass only the transmitted (undiffracted) electron beam. In the... 

Fig. 3 (left) TEM bright-field and (middle) dark-field images, and (right) selected area diffraction pattern from a 20 vol% Si3N4/5052 Al composite at 548 °C. (from Ref. [8,9])... 

Figure 4. Electron micrographs of mineral aurichalcite calcined at 400 C for 4 hours, (a) Bright field image, (b) Selected area diffraction pattern showing ZnO orientations with zone axes of [1010], [3031] and [5051]. See text for other ZnO orientations.

Figure 6. Digital x-ray imaging of zeolite ZSM-5 (Si/Al 49,5) thin section a) bright-field STEM image, b) A1 x-ray image smoothed by averaging each pixel with its 8 nearest neighbors. The darker shading within the particle indicates higher A1 content. The circular field is due to the image of the selected area diffraction aperture.

Figure 12. Cross-sectional TEM images of a silica sample implanted with Ag and S (a) high-resolution image showing the lattice planes of the Ag2S shell (b) bright-field showing the contrast between the Ag core and the Ag2S shell (c) and (d) are the diffraction pattern of the sample sequentially implanted with S followed by Ag and with Ag followed by S, respectively. (Reprinted from Ref [1], 2005, with permission from Italian Physical Society.)...

Fig. 5.16 (A) Bright-field TEM image and (B) element mapping carbon (brighter contrast corresponds to higher concentration of carbon) of ZnO synthesized in aqueous solution at 37 °C in pH 8 buffer for 4 h in the presence of 1.2 mgmL-1 of gelatin. The inset shows the electron diffraction pattern taken parallel to the platelet normal. (Reprinted with permission from [77], Copyright (2006) American Chemical Society).

Fig. 29. Icosahedral phase in electrodeposited Mn-Al alloys (a) bright field image (b) electron diffraction pattern showing 5-fold symmetry. Reproduced from Grushko et al. [126] by permission of Elsevier.

Bright field electron micrographs and electron diffraction (ED) patterns were taken with a Hitachi H-500 electron microscope, which was operated at an acceleration voltage of 75 kV and... 

In this method, four symmetries should be observed from three different diffraction patterns the Whole-Pattern (WP) symmetry, the Bright-Field (BF) symmetry, the Dark-Field (DF) symmetry and the + -g symmetries. 

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