Bright field imaging characteristics

Fig. 5 Bright-field and dark-field imaging (A) BF image of lamellar y/ 2 titanium aluminide (B) corresponding SAD pattern (see Fig. 4) (C) and (D) DF images of the reflections marked in (B). Each of these reflections is characteristic for one twin variant of tetragonal y-TiAl appearing with high intensity in the corresponding DF image. (View this art in color at www.dekker.com.)...

Fig. 8.86 Representative microstructure of stage II is the characteristic of the cell-and-wall structure of the composite model proposed for the plastic deformation of metals (BF image-TEM). (BF is bright field) [57]. With kind permission of John Wiley and Sons...

With this imaging system it is possible to study virtually all metals and alloys, many semiconductors and some ceramic materials. The image contrast from alloys and two-phase materials is difficult to predict quantitatively, as the effects of variations in chemistry on local field ion emission characteristics are not fully understood. However, in general, more refractory phases image more brightly in the FIM. Information regarding the structure of solid solutions, ordered alloys, and precipitates in alloys has been obtained by FIM. 

Evanescent wave microscopy has already yielded a number of contributions to the fields of micro-and nanoscale fluid and mass transport, including investigation of the no-slip boundary condition, applications to electrokinetic flows, and verification of hindered Brownian motion. With more experimental data and improvements to TIRE techniques, the accuracy and resolution of these techniques are certain to improve. Areas of potential improvements include development of rmiform-sized and bright tracer particles, creation of high-NA imaging optics and high-sensitivity camera systems, and further development of variable index materials for better control of the penetration-depth characteristics. 

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