Micrograph Bright field

Figures. XTEM micrograph (bright field) of an as-grown sample containing 0.7 nm Ge layer.

Figure 4. XTEM micrograph (bright field) of a sample containing a 0.7 nm Ge layer, oxidized at 800 C for 14 min in O2. The light black dots in the SiOa layer represent the partially reduced GeOj clusters.

Fig. 9 Optical micrograph (bright field) of a 95.5Sn-3.9Ag-0.6Cu sample tested at 160 °C (320 °F) and a strain rate of 8.3 X 10- s. The material was in the as-cast condition. The arrows indicate areas of grain boundary development in the larger Sn-rich phase dendrites.

Figure 6.4. Bright-field micrograph and SADP of deformation twins in Al-4.8 wt.% Mg shock loaded to 13 GPa at 100 K.

Figure 2. Electron micrographs of synthetic aurlchalclte, (Cuo.3Zno.7)5(C03)2(OH)6. (a) Bright field Image, (b) Selected...

Figure 4. Electron micrographs of mineral aurichalcite calcined at 400 C for 4 hours, (a) Bright field image, (b) Selected area diffraction pattern showing ZnO orientations with zone axes of [1010], [3031] and [5051]. See text for other ZnO orientations.

Figure 6a and b. Electron micrographs of mineral aurichalcite calcined at 350°C for 4 hours and reduced in a 1% H2/N2 gas mixture, (a) and (b) bright field images. 

Bright field electron micrographs and electron diffraction (ED) patterns were taken with a Hitachi H-500 electron microscope, which was operated at an acceleration voltage of 75 kV and... 

Fig. 4. The Tsp dependences of tog Ks(inax), bright field electron micrographs and ED patterns...

The contrast observed on the micrographs results essentially from the variations in intensity of the electron beam diffracted by the 002 interferences as a function of the direction of the C-axis, both in bright field where the diffracted rays are stopped by the contrast diaphragm and in dark field where the image is formed by these rays alone. This result has been demonstrated theoretically, at least, in the case of elastic diffusion. It is found that the energy scattered in a given direction by a pregraphitic structure depends on the orientation of the lattice in relation to the incident beam (17). 

This process (using one of the modes previously described) was applied to a set of 3 to 12 different selected areas on the transverse section of one fiber. The photographic series is a completed record of the whole fiber cross-section at an adequate magnification. On the latter micrograph the irradiated areas can be seen because of their lesser electron density in bright field conditions. In some cases, these irradiated areas could also be seen under dark field conditions. 

Figures 11 to 13 are dark field micrographs of 66 polyamide monofilaments. Figure 11 show an Ag-S stained filament. Silver sulfide precipitates, which appear as black areas (as they did in bright field images) as well as polyamide crystallites (bright spots) are visible. Figure 12 corresponds to a type 4 fiber (with skin-core morphology) where there is a lower density of crystallites in the skin region. Figure 13 corresponds to the case of type 5 fiber which has smaller crystallites.

Figure 2. Bright field electron micrograph of a fibrillar fragment of a PBT fiber and corresponding electron diffraction pattern...

Bright field TEM micrograph showing the metal particle morphology in a Cu-Al203 glass-doped nanocomposite. 

Fig. 10. Bright field TEM micrograph of I2S miktoarm with 53 vol.% PS (reproduced with permission from [83])...

Fig. 27. Transmission electron micrograph of a fine duplex amorphous-fcc alloy containing 8 a/o Mn (a) bright-field image, (b) electron diffraction pattern as well as course duplex amorphous-fcc alloy containing 12 a/o Mn (c) bright-field image, (d) electron diffraction pattern [128, 129],...

FIGURE 2 Bright-field transmission electron micrograph of a GalnN/GaN multiple quantum well structure exhibiting V-defects [12],... 

Fig. 8. (a) Transmission electron micrograph of a Cu/ZnO = 30/70 binary catalyst (40) 60 A copper spheres are placed on crystalline zinc oxide network, (b) Dark field image of the copper crystallites in the area shown in the bright field image (a) obtained using the [111] reflection of copper. [Adapted with permission from J. Catal. 57, 339 (1979). Copyright (1979) Academic Press, New York.]... 

Figure 8. Sketch of the different LMO types (above) and micrographs showing their morphology in bright-field (below).

Figure 8. Bright field, defocus micrographs of solution cast films of (a) sample 1/5/4 and (b) sample 1/6/5 (underfocus for both micrographs = 2 pm)...

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