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Backscattered electron imaging

Fig. 11. AI2O2—Al TiO typical microstructure showiag grain bridging, B (SEM backscattered electron image). Fig. 11. AI2O2—Al TiO typical microstructure showiag grain bridging, B (SEM backscattered electron image).
Stump, R.F., Pfeiffer, J.R., Schneebeck, M.C., Seagrave, J.C., and Oliver, J.M. (1989) Mapping gold-labeled receptors on cell surfaces by backscattered electron imaging and digital image analysis Studies of the IgE receptor on mast cells. Am. J. Anat. 185, 128-141. [Pg.1119]

Backscattered electron images, 24 76-77 Backscattered primary ions, 24 106 Back-scatter electron detectors, in fine art examination/conservation, 11 406 Backstaining, 10 303 Backus process, 4 810 Backward approach, to qualitative reliability analysis, 26 984 Backwash, 11 323... [Pg.83]

Goode, D. and Mangel, T. K. (1987) Backscattered electron imaging of immuno-gold labeled and silver-enhanced microtubules in cultured mammalian cells. [Pg.247]

Fig. 2. Backscatter electron images of a laurite grain included within a chromite from Stillwater chromitite H. b) enlargement of transient LA-ICPMS signal shown in a). Fig. 2. Backscatter electron images of a laurite grain included within a chromite from Stillwater chromitite H. b) enlargement of transient LA-ICPMS signal shown in a).
Fig. 2. SEM backscattered electron image of a Type II vein containing euhedral to cataclastically brecciated arsenopyrite (asp), pyrite (py), quartz, and calcite. A thin Type 1 quartz vein showed a SEM-EDAX analysis of a very fine-grained mineral mass rich in Hg-Au-As vein (arrow). Fig. 2. SEM backscattered electron image of a Type II vein containing euhedral to cataclastically brecciated arsenopyrite (asp), pyrite (py), quartz, and calcite. A thin Type 1 quartz vein showed a SEM-EDAX analysis of a very fine-grained mineral mass rich in Hg-Au-As vein (arrow).
Figure 3 (a) Backscattered electron image of a kaolin-quartz mix (b) Si 2p photoelectron peak image (c) Al 2p photoelectron peak image... [Pg.76]

Fig. 3. Backscattered electron image of a zoned murataite-5C crystal in a Synroc-type ceramic containing 20 wt% HLW surrogate produced by ICCM at SIA Radon (Sobolev et al. 1997c). Scale ban 5 pm. Numbers mark locations of analyses listed in Table 3. ACT concentrations in the core are approximately 10-20 times higher than at the edge. Fig. 3. Backscattered electron image of a zoned murataite-5C crystal in a Synroc-type ceramic containing 20 wt% HLW surrogate produced by ICCM at SIA Radon (Sobolev et al. 1997c). Scale ban 5 pm. Numbers mark locations of analyses listed in Table 3. ACT concentrations in the core are approximately 10-20 times higher than at the edge.
Fig. 1. SEM backscattered electron image, Si X-ray map, Ca X-ray map, and Na X-ray map of alteration in pyrochlore from Vishnevogorskii, Russia. Note the loss of Na and Ca and incorporation of Si along cracks and the dark area near the middle of the backseaUered image. Fig. 1. SEM backscattered electron image, Si X-ray map, Ca X-ray map, and Na X-ray map of alteration in pyrochlore from Vishnevogorskii, Russia. Note the loss of Na and Ca and incorporation of Si along cracks and the dark area near the middle of the backseaUered image.
Fig. 3. SEM backscattered electron image of alteration in zirconolite from the Afrikanda alkaline complex, Kola Peninsula, Russia. This crystal exhibits complex magmatic zoning, late-stage replacement by an unknown Ba-Zr-Ti-silicate phase, and preferential alteration along cracks and Th-U-rich zones. Fig. 3. SEM backscattered electron image of alteration in zirconolite from the Afrikanda alkaline complex, Kola Peninsula, Russia. This crystal exhibits complex magmatic zoning, late-stage replacement by an unknown Ba-Zr-Ti-silicate phase, and preferential alteration along cracks and Th-U-rich zones.
Fig. 4. SEM backscattered electron images of alteration in natural brannerite (a) Part of a large brannerite specimen showing minor alteration around the rim of the crystal and along fractures extending into the interior (b) Brannerite crystals showing extensive alteration along their rims, together with the presence of U-rich phases along cracks in the host rock. Fig. 4. SEM backscattered electron images of alteration in natural brannerite (a) Part of a large brannerite specimen showing minor alteration around the rim of the crystal and along fractures extending into the interior (b) Brannerite crystals showing extensive alteration along their rims, together with the presence of U-rich phases along cracks in the host rock.
Backscattered electron image of a Type CAI in the Allende CV3 chondrite. This object crystallized from a melt and has an outer mantle of melilite (Mel) surrounding an inner zone of pyroxene (Px) and anorthite (An). Tiny grains of spinel (Sp) are abundant in the inner portion of the inclusion. Image courtesy of A. Krot. [Pg.202]

Backscattered electron image of a portion of a fine-grained Type A CAI in the Efremovka CV3 chondrite. This inclusion consists of nodules of spinel (sp) surrounded by anorthite (an) and thin rims of pyroxene (px). This CAI may be an aggregate of condensates. [Pg.203]

The final sintered specimen was mounted and polished in epoxy (ME14730 epoxy resin and epoxy hardener) for electron microprobe analysis (EMPA, JEOL JXA-8600). The backscattered electron image shown in Fig. 2a confirmed a homogeneous single phase of LSFTO. Elemental compositions were determined with the probe placed at several different spots on the sample. The composition ratios were determined from the average data to be La Sr... [Pg.2]

Figure 2. (a) Backscattered electron image and (b) SEM micrograph of Lao 2Sr0 8Fe0 55Ti045O3 8 sintered at 1400°C/10 h. [Pg.2]

Fig. 3.8. Backscattered electron image of the transition zone between cobalt and silicon after annealing at 800°C for 230400 s (64 h) in vacuum.264 The microstructure reveals all the phases available on the equilibrium phase diagram of the Co-Si binary system. A continuous crack is seen between Co and C02SL Photograph kindly provided by Dr. A.A. Kodentsov. Reprinted with permission from Elsevier Science. Fig. 3.8. Backscattered electron image of the transition zone between cobalt and silicon after annealing at 800°C for 230400 s (64 h) in vacuum.264 The microstructure reveals all the phases available on the equilibrium phase diagram of the Co-Si binary system. A continuous crack is seen between Co and C02SL Photograph kindly provided by Dr. A.A. Kodentsov. Reprinted with permission from Elsevier Science.
Figure 3.13 displays a backscattered electron image of the Ni-Zn transition zone after a 2 h anneal at 400°C. Upon superficial metallographical examination, four intermetallic layers appear to be distinguishable in the microstructure of the Ni-Zn transition zone, giving an impression of the formation of all the compounds possible according to the equilibrium phase diagram by M. Hansen and K. Anderko.142 The same applies to Co-Zn reaction couples (Fig. 3.14a). However, upon more close examination this first impression tumes out to be quite erroneous, with only two of the four intermetallic compounds actually occurring. Figure 3.13 displays a backscattered electron image of the Ni-Zn transition zone after a 2 h anneal at 400°C. Upon superficial metallographical examination, four intermetallic layers appear to be distinguishable in the microstructure of the Ni-Zn transition zone, giving an impression of the formation of all the compounds possible according to the equilibrium phase diagram by M. Hansen and K. Anderko.142 The same applies to Co-Zn reaction couples (Fig. 3.14a). However, upon more close examination this first impression tumes out to be quite erroneous, with only two of the four intermetallic compounds actually occurring.
Particle analysis is the most informative method to date for the identification of FDR particles. It does, however, suffer from several major disadvantages including high cost of instrumentation and lengthy and tedious procedures requiring specialized staff Since its introduction serious attempts have been made to solve the time problem. These include the use of backscattered electron images, automation of the search procedure, and sample manipulation to pre-concentrate the sample prior to SEM examination.145151... [Pg.114]

Figure 4. Micrographs of the cross section of a vanadyl phosphate porous microsphere with 10% amorphous silica obtained by electron probe microanalysis (EPMA). Left backscattered electron image showing average atomic number across the specimen. Right X-ray image showing silicon distribution. Figure 4. Micrographs of the cross section of a vanadyl phosphate porous microsphere with 10% amorphous silica obtained by electron probe microanalysis (EPMA). Left backscattered electron image showing average atomic number across the specimen. Right X-ray image showing silicon distribution.
FIGURE 8.2 Backscattered electron image of surface soil and corresponding x-ray elemental dot maps. White colors indicate highest concentration of target elements, and dark spots indicate low concentration. [Pg.208]


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Backscatter

Backscattered

Backscattered electron image

Backscattered electron image

Backscattered electron imaging (BEI

Backscattered electron imaging characteristics

Backscattered electron imaging studied

Backscattered electron imaging, fibers

Backscattered electrons

Electron backscattering

Electron image

Electronic imaging

Imaging electron

Zircon backscattered electron image

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