Backscattered electron imaging characteristics

SEM/EDS Scaiming Electron Microscopy Energy Dispersive X-ray Spectroscopy Imaging and elemental microanalysis Secondary and backscattered electrons and characteristic X-rays 0.1-1 at% 1-5 pm (EDS) 4SA(SEM) 1 pm (EDS)... 

A SEM consists of a focnsed ion beam of electrons directed to interact with the sample specimen, as shown in Figure 2 (5, 6). The Sample in the figure is the stone itself, or specific locations within the stone. Typically, the three signals from the interaction of the electron beam and the sample that are of primary interest are the secondary electrons, backscattered electrons, and the characteristic x-rays (5, 6). The emitted electrons create an image of the stone and energy dispersive x-ray analysis is ntilized to identify the elemental composition of various components within the stone. 

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